EP2442288 - DEVICE ABNORMALITY MONITORING METHOD AND SYSTEM [Right-click to bookmark this link] | Status | The application has been withdrawn Status updated on 07.10.2016 Database last updated on 16.07.2024 | Most recent event Tooltip | 07.10.2016 | Withdrawal of application | published on 09.11.2016 [2016/45] | Applicant(s) | For all designated states Hitachi, Ltd. 6-6, Marunouchi 1-chome Chiyoda-ku Tokyo 100-8280 / JP | [N/P] |
Former [2012/16] | For all designated states Hitachi, Ltd. 6-6, Marunouchi 1-chome Chiyoda-ku Tokyo 100-8280 / JP | Inventor(s) | 01 /
TAMAKI, Kenji c/o Production Engineering Research Laboratory HITACHI LTD. 292 Yoshida-cho, Totsuka-ku Yokohama-shi Kanagawa 244-0817 / JP | 02 /
MIWA, Toshiharu c/o Production Engineering Research Laboratory HITACHI LTD. 292 Yoshida-cho, Totsuka-ku Yokohama-shi Kanagawa 244-0817 / JP | [2012/16] | Representative(s) | Addiss, John William, et al Mewburn Ellis LLP City Tower 40 Basinghall Street London EC2V 5DE / GB | [N/P] |
Former [2012/16] | Calderbank, Thomas Roger, et al Mewburn Ellis LLP 33 Gutter Lane London EC2V 8AS / GB | Application number, filing date | 10786023.1 | 13.05.2010 | WO2010JP58104 | Priority number, date | JP20090139873 | 11.06.2009 Original published format: JP 2009139873 | [2012/16] | Filing language | JA | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2010143492 | Date: | 16.12.2010 | Language: | JA | [2010/50] | Type: | A1 Application with search report | No.: | EP2442288 | Date: | 18.04.2012 | Language: | EN | [2012/16] | Search report(s) | International search report - published on: | JP | 16.12.2010 | (Supplementary) European search report - dispatched on: | EP | 22.10.2012 | Classification | IPC: | G08B31/00, G08B29/02, G05B23/02 | [2012/47] | CPC: |
G05B23/0254 (EP,US)
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Former IPC [2012/16] | G08B31/00, G08B29/02 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, SE, SI, SK, SM, TR [2012/16] | Title | German: | VERFAHREN UND SYSTEM ZUR ÜBERWACHUNG VON GERÄTEANOMALIEN | [2012/16] | English: | DEVICE ABNORMALITY MONITORING METHOD AND SYSTEM | [2012/16] | French: | PROCÉDÉ ET SYSTÈME DE SURVEILLANCE D'ANOMALIE DE DISPOSITIF | [2012/16] | Entry into regional phase | 07.12.2011 | Translation filed | 21.12.2011 | National basic fee paid | 21.12.2011 | Search fee paid | 21.12.2011 | Designation fee(s) paid | 21.12.2011 | Examination fee paid | Examination procedure | deleted | Communication of intention to grant the patent | 21.12.2011 | Examination requested [2012/16] | 21.01.2013 | Amendment by applicant (claims and/or description) | 04.10.2016 | Application withdrawn by applicant [2016/45] | Fees paid | Renewal fee | 21.05.2012 | Renewal fee patent year 03 | 21.05.2013 | Renewal fee patent year 04 | 27.05.2014 | Renewal fee patent year 05 | 26.05.2015 | Renewal fee patent year 06 | 20.04.2016 | Renewal fee patent year 07 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [ ] - No further relevant documents disclosed | International search | [A]WO2006049084 (IKEGAMI TAKANORI [JP]); | [A]JP2007242809 (TOSHIBA CORP); | [A]JP2000252180 (MATSUSHITA ELECTRIC IND CO LTD); | [A]JP2002110493 (MATSUSHITA ELECTRIC IND CO LTD) | by applicant | JP2002110493 | JP2000252180 | US7209846 |