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Extract from the Register of European Patents

EP About this file: EP2442288

EP2442288 - DEVICE ABNORMALITY MONITORING METHOD AND SYSTEM [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  07.10.2016
Database last updated on 16.07.2024
Most recent event   Tooltip07.10.2016Withdrawal of applicationpublished on 09.11.2016  [2016/45]
Applicant(s)For all designated states
Hitachi, Ltd.
6-6, Marunouchi 1-chome
Chiyoda-ku
Tokyo 100-8280 / JP
[N/P]
Former [2012/16]For all designated states
Hitachi, Ltd.
6-6, Marunouchi 1-chome Chiyoda-ku
Tokyo 100-8280 / JP
Inventor(s)01 / TAMAKI, Kenji
c/o Production Engineering Research
Laboratory
HITACHI LTD.
292 Yoshida-cho, Totsuka-ku
Yokohama-shi Kanagawa 244-0817 / JP
02 / MIWA, Toshiharu
c/o Production Engineering Research
Laboratory
HITACHI LTD.
292 Yoshida-cho, Totsuka-ku
Yokohama-shi Kanagawa 244-0817 / JP
 [2012/16]
Representative(s)Addiss, John William, et al
Mewburn Ellis LLP
City Tower
40 Basinghall Street
London EC2V 5DE / GB
[N/P]
Former [2012/16]Calderbank, Thomas Roger, et al
Mewburn Ellis LLP 33 Gutter Lane London
EC2V 8AS / GB
Application number, filing date10786023.113.05.2010
WO2010JP58104
Priority number, dateJP2009013987311.06.2009         Original published format: JP 2009139873
[2012/16]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2010143492
Date:16.12.2010
Language:JA
[2010/50]
Type: A1 Application with search report 
No.:EP2442288
Date:18.04.2012
Language:EN
[2012/16]
Search report(s)International search report - published on:JP16.12.2010
(Supplementary) European search report - dispatched on:EP22.10.2012
ClassificationIPC:G08B31/00, G08B29/02, G05B23/02
[2012/47]
CPC:
G05B23/0254 (EP,US)
Former IPC [2012/16]G08B31/00, G08B29/02
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   SE,   SI,   SK,   SM,   TR [2012/16]
TitleGerman:VERFAHREN UND SYSTEM ZUR ÜBERWACHUNG VON GERÄTEANOMALIEN[2012/16]
English:DEVICE ABNORMALITY MONITORING METHOD AND SYSTEM[2012/16]
French:PROCÉDÉ ET SYSTÈME DE SURVEILLANCE D'ANOMALIE DE DISPOSITIF[2012/16]
Entry into regional phase07.12.2011Translation filed 
21.12.2011National basic fee paid 
21.12.2011Search fee paid 
21.12.2011Designation fee(s) paid 
21.12.2011Examination fee paid 
Examination proceduredeletedCommunication of intention to grant the patent
21.12.2011Examination requested  [2012/16]
21.01.2013Amendment by applicant (claims and/or description)
04.10.2016Application withdrawn by applicant  [2016/45]
Fees paidRenewal fee
21.05.2012Renewal fee patent year 03
21.05.2013Renewal fee patent year 04
27.05.2014Renewal fee patent year 05
26.05.2015Renewal fee patent year 06
20.04.2016Renewal fee patent year 07
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search   [ ] - No further relevant documents disclosed
International search[A]WO2006049084  (IKEGAMI TAKANORI [JP]);
 [A]JP2007242809  (TOSHIBA CORP);
 [A]JP2000252180  (MATSUSHITA ELECTRIC IND CO LTD);
 [A]JP2002110493  (MATSUSHITA ELECTRIC IND CO LTD)
by applicantJP2002110493
 JP2000252180
 US7209846
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.