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Extract from the Register of European Patents

EP About this file: EP2546667

EP2546667 - Method for characterizing large area thin film photovoltaic devices [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  13.12.2013
Database last updated on 05.10.2024
Most recent event   Tooltip13.12.2013Application deemed to be withdrawnpublished on 15.01.2014  [2014/03]
Applicant(s)For all designated states
Randhahn, Jean
Grofstrasse 7
8892 Berschis / CH
[2013/03]
Inventor(s)01 / see applicant
...
 [2013/03]
Application number, filing date11005718.913.07.2011
[2013/03]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP2546667
Date:16.01.2013
Language:EN
[2013/03]
Search report(s)(Supplementary) European search report - dispatched on:EP14.12.2011
ClassificationIPC:G01R31/26, G01R31/40
[2013/03]
CPC:
H02S50/10 (EP); Y02E10/50 (EP)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2013/03]
Extension statesBANot yet paid
MENot yet paid
TitleGerman:Methode zur Charakterisierung von grossflächigen photovoltaischen Dünnschichtzellen[2013/03]
English:Method for characterizing large area thin film photovoltaic devices[2013/03]
French:Procédé de caractérisation de dispositifs photovoltaïques à couche mince de grande surface[2013/03]
Examination procedure17.07.2013Application deemed to be withdrawn, date of legal effect  [2014/03]
27.08.2013Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time  [2014/03]
Fees paidPenalty fee
Additional fee for renewal fee
31.07.201303   M06   Not yet paid
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[X]WO2011066439  (TRUSTEES BOSTON COLLEGE [US], et al) [X] 1-11 * figures 2,4,5A,5B,7-9 * * page 2, line 24 - page 3, line 17 * * page 6, line 24 - line 28 * * page 13, line 4 - line 22 * * page 18, line 23 - page 23, line 12 *;
 [X]US6154034  (LOVELADY JAMES N [US], et al) [X] 1-11 * figure 1 * * column 1, line 18 - line 30 * * column 2, line 31 - column 4, line 3 *;
 [X]EP0304145  (ENERGY CONVERSION DEVICES INC [US]) [X] 1-11 * figures 1,2B,3B,4B,5B,6B,7B,8B,9B * * page 7, line 40 - page 8, line 10 * * page 10, line 33 - page 12, line 4 *;
 [X]US7733111  (ZHAO GUOHENG [US], et al) [X] 1-11 * figures 2-18 * * column 1, line 10 - line 26 * * column 4, line 30 - column 7, line 2 * * claims 1,5 *;
 [A]WO2010034434  (STRAMA MPS MASCHB GMBH & CO KG [DE], et al) [A] 1-11 * figures 1,2 * * page 2, line 29 - page 3, line 37 * * page 6, line 9 - line 24 * * page 11, line 19 - line 34 *;
 [A]JP2004247325  (NAT INST OF ADV IND & TECHNOL) [A] 1-11 * figures 1-8 * * abstract * * paragraph [0009] *;
 [A]EP1686386  (NISSHIN SPINNING [JP]) [A] 1 * figures 1,2 * * paragraph [0008] - paragraph [0009] *
 [X]  - ZHAO H ET AL, "Vapor chloride treatment studies of CdTe/CdS solar cells", CONFERENCE RECORD OF THE IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE 2002 INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS INC. US; [IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE],, (20020519), vol. CONF. 29, doi:10.1109/PVSC.2002.1190653, ISBN 978-0-7803-7471-3, pages 668 - 671, XP010666336 [X] 1-11 * the whole document *

DOI:   http://dx.doi.org/10.1109/PVSC.2002.1190653
 [X]  - INGUANTA R ET AL, "An electrochemical route towards the fabrication of nanostructured semiconductor solar cells", POWER ELECTRONICS ELECTRICAL DRIVES AUTOMATION AND MOTION (SPEEDAM), 2010 INTERNATIONAL SYMPOSIUM ON, IEEE, PISCATAWAY, NJ, USA, (20100614), ISBN 978-1-4244-4986-6, pages 1166 - 1171, XP031727752 [X] 1-11 * the whole document *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.