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Extract from the Register of European Patents

EP About this file: EP2383925

EP2383925 - Method and apparatus for measuring symbol and bit error rates independent of disparity errors [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  06.07.2018
Database last updated on 11.09.2024
FormerRequest for examination was made
Status updated on  13.10.2017
Most recent event   Tooltip06.07.2018Withdrawal of applicationpublished on 08.08.2018  [2018/32]
Applicant(s)For all designated states
Tektronix, Inc.
14150 SW Karl Braun Drive P.O. Box 500, M/S 50-LAW
Beaverton, Oregon 97077-0001 / US
[2011/44]
Inventor(s)01 / Tran, Que T
17122 SW Soren Court
Beaverton Oregon 97007 / US
 [2011/44]
Representative(s)HGF
Fountain Precinct
Balm Green
Sheffield S1 2JA / GB
[N/P]
Former [2014/03]Clarke, Jeffrey, et al
Harrison Goddard Foote LLP
Fountain Precinct
Balm Green
Sheffield, Yorkshire S1 2JA / GB
Former [2011/44]Brinck, David John Borchardt, et al
R.G.C. Jenkins & Co 26 Caxton Street
London SW1H 0RJ / GB
Application number, filing date11250497.227.04.2011
[2011/44]
Priority number, dateUS20111308441211.04.2011         Original published format: US201113084412
US20100328876P28.04.2010         Original published format: US 328876 P
[2013/13]
Former [2011/44]US2011008441211.04.2011
US20100328876P28.04.2010
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP2383925
Date:02.11.2011
Language:EN
[2011/44]
Type: A3 Search report 
No.:EP2383925
Date:05.04.2017
Language:EN
[2017/14]
Search report(s)(Supplementary) European search report - dispatched on:EP08.03.2017
ClassificationIPC:H04L1/24
[2011/44]
CPC:
H04L1/244 (EP,US)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2017/46]
Former [2011/44]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
Extension statesBANot yet paid
MENot yet paid
TitleGerman:Verfahren und Vorrichtung zum Messen von Symbol- und Bitfehlerraten in Unabhängigkeit von Disparitätsfehlern[2011/44]
English:Method and apparatus for measuring symbol and bit error rates independent of disparity errors[2011/44]
French:Procédé et appareil pour mesurer des taux d'erreur de symboles et de bits indépendamment des erreurs de disparité[2011/44]
Examination procedure27.04.2011Date on which the examining division has become responsible
05.10.2017Amendment by applicant (claims and/or description)
05.10.2017Examination requested  [2017/46]
28.06.2018Application withdrawn by applicant  [2018/32]
Fees paidRenewal fee
12.06.2013Renewal fee patent year 03
28.04.2014Renewal fee patent year 04
27.04.2015Renewal fee patent year 05
27.04.2016Renewal fee patent year 06
27.04.2017Renewal fee patent year 07
Penalty fee
Additional fee for renewal fee
30.04.201303   M06   Fee paid on   12.06.2013
30.04.201808   M06   Not yet paid
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[YA]US7519874  (SALANT LAWRENCE [US], et al) [Y] 1-3,9,10 * figure 5 * * column 5, lines 37-60 * [A] 4-8;
 [Y]US6892336  (GIORGETTA TIMOTHY E [US], et al) [Y] 1-3,9,10 * figure 9 * * column 15, line 34 - column 16, line 38 *;
 [A]  - HERZOG W, "Ein Bitfehlerstruktur-Messgerät für den Betrieb", TELEKOM PRAXIS, SCHIELE UND SCHOEN, BERLIN, DE, (19971101), vol. 74, no. 11, ISSN 0015-0118, pages 22 - 28, XP000884873 [A] 1-10 * page 3, column 2 - column 3 * * figure 2 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.