-
EP2662791
European procedure
- EP About this file
- EP Legal status
- EP Federated register
- EP Event history
- EP Citations
- EP Patent family
- EP All documents
Extract from the Register of European Patents
EP About this file: EP2662791
| EP2662791 - A method and apparatus for monitoring timing of cricital paths [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 24.10.2014 Database last updated on 03.09.2024 | Most recent event Tooltip | 24.10.2014 | Application deemed to be withdrawn | published on 26.11.2014 [2014/48] | Applicant(s) | For all designated states Stichting IMEC Nederland High Tech Campus 31 5656 AE Eindhoven / NL | [2013/46] | Inventor(s) | 01 /
Gemmeke, Tobias High Tech Campus 31 5656 AE Eindhoven / NL | 02 /
Konijnenburg, Mario High Tech Campus 31 5656 AE Eindhoven / NL | [2013/46] | Representative(s) | Wheatley, Alison Clare Haseltine Lake LLP Redcliff Quay 120 Redcliff Street Bristol BS1 6HU / GB | [2013/46] | Application number, filing date | 12167647.2 | 11.05.2012 | [2013/46] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP2662791 | Date: | 13.11.2013 | Language: | EN | [2013/46] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 07.11.2012 | Classification | IPC: | G06F17/50 | [2013/46] | CPC: |
G06F30/398 (EP);
G06F30/3315 (US);
G06F1/324 (US);
G06F1/3296 (US);
G06F30/327 (EP,US);
G06F30/3312 (US);
G06F2119/12 (EP,US)
(-)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2013/46] | Extension states | BA | Not yet paid | ME | Not yet paid | Title | German: | Verfahren und Vorrichtung zur Überwachung des Timings kritischer Pfade | [2013/46] | English: | A method and apparatus for monitoring timing of cricital paths | [2013/46] | French: | Procédé et appareil de contrôle de synchronisation de chemins critiques | [2013/46] | Examination procedure | 14.05.2014 | Application deemed to be withdrawn, date of legal effect [2014/48] | 24.06.2014 | Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time [2014/48] | Fees paid | Renewal fee | 17.03.2014 | Renewal fee patent year 03 |
| Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US2008104561 (CARPENTER GARY D [US], et al) [A] 1-15* paragraph [0018] - paragraph [0026] *; | [A]EP2006784 (IMEC INTER UNI MICRO ELECTR [BE]) [A] 1-15 * paragraph [0149] - paragraph [0150]; figure 36 *; | [Y] - HIROSHI FUKETA ET AL, "Trade-off analysis between timing error rate and power dissipation for adaptive speed control with timing error prediction", DESIGN AUTOMATION CONFERENCE, 2009. ASP-DAC 2009. ASIA AND SOUTH PACIFIC, IEEE, PISCATAWAY, NJ, USA, (20090119), ISBN 978-1-4244-2748-2, pages 266 - 271, XP031434257 [Y] 1-15 * page 266 - page 270 * | [Y] - MARTIN WIRNSHOFER ET AL, "A variation-aware adaptive voltage scaling technique based on in-situ delay monitoring", DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS&SYSTEMS (DDECS), 2011 IEEE 14TH INTERNATIONAL SYMPOSIUM ON, IEEE, (20110413), doi:10.1109/DDECS.2011.5783090, ISBN 978-1-4244-9755-3, pages 261 - 266, XP031877338 [Y] 1-15 * page 262 - page 265 * DOI: http://dx.doi.org/10.1109/DDECS.2011.5783090 | by applicant | US2009031268 | - M. NAKAI ET AL., "Dynamic Voltage and Frequency Management for a Low-Power Embedded Microprocessor", IEEE J. SOLID-STATE CIRCUITS, (200501), vol. 40, no. 1 | - D. ERNST ET AL., "Razor: A Low-Power Pipeline Based on Circuit-Level Timing Speculation", MICRO-36, (200312), doi:doi:10.1109/MICRO.2003.1253179, pages 7 - 18, XP010674227 DOI: http://dx.doi.org/10.1109/MICRO.2003.1253179 | - D. BLAAUW ET AL., "Razor II: In Situ Error Detection and Correction for PVT and SER Tolerance", ISSCC DIG. TECH. PAPERS, (200802), pages 400 - 1 |