EP2700979 - Transverse profile imager for ionizing radiation [Right-click to bookmark this link] | |||
Former [2014/09] | Transverse Profile Imager for Ionizing Radiation | ||
[2015/14] | Status | The application is deemed to be withdrawn Status updated on 30.01.2015 Database last updated on 24.07.2024 | Most recent event Tooltip | 27.02.2015 | Change - English title | published on 01.04.2015 [2015/14] | Applicant(s) | For all designated states Paul Scherrer Institut PSI 5232 Villigen / CH | [2014/09] | Inventor(s) | 01 /
Ischebeck, Rasmus Belpstrasse 49 3007 Bern / CH | 02 /
Thominet, Vincent Rosengässli 2 5330 Bad Zurzach/AG / CH | [2014/09] | Representative(s) | Fischer, Michael Siemens AG Postfach 22 16 34 80506 München / DE | [2014/09] | Application number, filing date | 12181210.1 | 21.08.2012 | [2014/09] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP2700979 | Date: | 26.02.2014 | Language: | EN | [2014/09] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 25.01.2013 | Classification | IPC: | G01T1/29 | [2014/09] | CPC: |
G01T1/29 (EP)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2014/09] | Extension states | BA | Not yet paid | ME | Not yet paid | Title | German: | Querprofil-Imager für Ionisierungsstrahlung | [2014/09] | English: | Transverse profile imager for ionizing radiation | [2015/14] | French: | Imageur à profil transversal pour rayonnement ionisant | [2014/09] |
Former [2014/09] | Transverse Profile Imager for Ionizing Radiation | Examination procedure | 27.08.2014 | Application deemed to be withdrawn, date of legal effect [2015/10] | 02.10.2014 | Despatch of communication that the application is deemed to be withdrawn, reason: examination fee not paid in time [2015/10] | Fees paid | Penalty fee | Additional fee for renewal fee | 31.08.2014 | 03   M06   Not yet paid |
Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US2004125369 (WANG DAVID Y [US]) [A] 1-5 * paragraph [0023]; figure 4A *; | [AD]US4916319 (TELFAIR WILLIAM B [US], et al) [AD] 1-5 * the whole document *; | [A]US6522717 (MURAKAMI KATSUHIKO [JP], et al) [A] 1-5 * column 7, lines 1-29; figure 1 * | [A] - Rasmus Ischebeck, "PROFILE MONITORS FOR THE SwissFEL INJECTOR TEST FACILITY", Proceedings of Linear Accelerator Conference LINAC2010, (20100101), pages 656 - 658, URL: http://silver.j-parc.jp/linac10/TUP103.PDF, (20130118), XP055050263 [A] 1-5 * page 656, column rhc - page 657, column lhc * | by applicant | US4916319 | EP1365260 | GB190401196 | US4020590 | US7190460 | US5841590 | - KUDO ET AL., REV SCI INSTR, (2006), vol. 77, no. 12, page 1231051231054 |