Extract from the Register of European Patents

EP About this file: EP2736171

EP2736171 - Cascoded semiconductor devices [Right-click to bookmark this link]
StatusThe application has been refused
Status updated on  02.05.2018
Database last updated on 28.03.2026
FormerExamination is in progress
Status updated on  23.12.2016
Most recent event   Tooltip17.08.2018Refusal of applicationpublished on 19.09.2018  [2018/38]
Applicant(s)For all designated states
Nexperia B.V.
Jonkerbosplein 52
6534 AB Nijmegen / NL
[2017/18]
Former [2016/43]For all designated states
Nexperia B.V.
High Tech Campus 60
5656 AG Eindhoven / NL
Former [2014/22]For all designated states
NXP B.V.
High Tech Campus 60
5656 AG Eindhoven / NL
Inventor(s)01 / Rose, Matthias
NXP Semiconductors
Intellectual Property and Licensing
60 High Street
Redhill, Surrey RH1 1NY / GB
02 / Sonsky, Jan
NXP Semiconductors
Intellectual Property and Licensing
60 High Street
Redhill, Surrey RH1 1NY / GB
03 / Rutter, Phil
NXP Semiconductors
Intellectual Property and Licensing
60 High Street
Redhill, Surrey RH1 1NY / GB
 [2014/22]
Representative(s)Crawford, Andrew, et al
Nexperia B.V.
Legal & IP
Jonkerbosplein 52
6534 AB Nijmegen / NL
[N/P]
Former [2014/22]Crawford, Andrew
NXP B.V.
Intellectual Property & Licensing
Red Central
60 High Street
Redhill, Surrey RH1 1SH / GB
Application number, filing date12194083.723.11.2012
[2014/22]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP2736171
Date:28.05.2014
Language:EN
[2014/22]
Search report(s)(Supplementary) European search report - dispatched on:EP23.04.2013
ClassificationIPC:H03K17/567, H01L29/778, H03K17/687
[2014/22]
CPC:
H03K17/567 (EP,US); H10D84/83 (US); H03K17/6871 (EP,US);
H03K17/6874 (EP,US); H03K17/74 (EP,US); H10D84/221 (US);
H03K2017/6875 (EP,US) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2014/22]
Extension statesBANot yet paid
MENot yet paid
TitleGerman:Kaskodenhalbleiterbauelemente[2014/22]
English:Cascoded semiconductor devices[2014/22]
French:Dispositifs à semi-conducteurs cascadés[2014/22]
Examination procedure05.06.2013Amendment by applicant (claims and/or description)
31.10.2013Examination requested  [2014/22]
18.08.2016Despatch of a communication from the examining division (Time limit: M04)
22.12.2016Reply to a communication from the examining division
19.04.2018Cancellation of oral proceeding that was planned for 19.04.2018
19.04.2018Date of oral proceedings (cancelled)
03.05.2018Despatch of communication that the application is refused, reason: substantive examination [2018/38]
13.05.2018Application refused, date of legal effect [2018/38]
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  18.08.2016
Fees paidRenewal fee
01.12.2014Renewal fee patent year 03
02.12.2015Renewal fee patent year 04
30.11.2016Renewal fee patent year 05
10.11.2017Renewal fee patent year 06
Penalty fee
Additional fee for renewal fee
30.11.201504   M06   Fee paid on   11.12.2015
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Documents cited:Search[XAI] DE19902520  (SIEMENS AG et al.) [X] 1,2,5,9 * column 1, line 1 - line 31; figures 1,6 * * column 3, line 54 - column 4, line 41 *[A] 3,4,7,8,10-13 [I] 6
 [XAI] WO0044088  (SIEMENS AG et al.) [X] 1,2,5,9 * page 1 - page 3; figure 1 *[A] 3,4,7,8,10-13 [I] 6
 [XYI]   HAEHRE K ET AL: "Switching speed-control of an optimized capacitor-clamped normally-on Silicon Carbide JFET cascode", POWER ELECTRONICS AND MOTION CONTROL CONFERENCE (EPE/PEMC), 2012 15TH INTERNATIONAL, IEEE, 4 September 2012 (2012-09-04), pages DS1a.11 - 1, XP032311806, ISBN: 978-1-4673-1970-6, DOI: 10.1109/EPEPEMC.2012.6397201 [X] 1-4,9 * the whole document * [Y] 7,10-13 [I] 5,6,8

DOI:   http://dx.doi.org/10.1109/EPEPEMC.2012.6397201
 [Y]   WATARU SAITO ET AL: "High Voltage and High Switching Frequency Power-Supplies using a GaN-HEMT", COMPOUND SEMICONDUCTOR INTEGRATED CIRCUIT SYMPOSIUM, 2006. CSIC 2006. IEEE, IEEE, PISCATAWAY, NJ, USA, 1 November 2006 (2006-11-01), pages 253 - 256, XP031051691, ISBN: 978-1-4244-0126-0 [Y] 7,10 * abstract *
 [Y]   KELLEY R L ET AL: "Power factor correction using an enhancement-mode SiC JFET", POWER ELECTRONICS SPECIALISTS CONFERENCE, 2008. PESC 2008. IEEE, IEEE, PISCATAWAY, NJ, USA, 15 June 2008 (2008-06-15), pages 4766 - 4769, XP031300703, ISBN: 978-1-4244-1667-7 [Y] 11 * abstract *
 [Y]   MAZZOLA M S ET AL: "Application of a Normally OFF Silicon Carbide Power JFET in a Photovoltaic Inverter", APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION, 2009. APEC 2009. TWENTY-FOURTH ANNUAL IEEE, IEEE, PISCATAWAY, NJ, USA, 15 February 2009 (2009-02-15), pages 649 - 652, XP031442749, ISBN: 978-1-4244-2811-3 [Y] 12 * abstract *
 [Y]   KELLEY R L ET AL: "SiC JFET Gate Driver Design for Use in DC/DC Converters", APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION, 2006. APEC '06. T WENTY-FIRST ANNUAL IEEE MARCH 19, 2006, PISCATAWAY, NJ, USA,IEEE, PISCATAWAY, NJ, USA, 19 March 2006 (2006-03-19), pages 179 - 182, XP010909942, ISBN: 978-0-7803-9547-3, DOI: 10.1109/APEC.2006.1620536 [Y] 13 * abstract *

DOI:   http://dx.doi.org/10.1109/APEC.2006.1620536
ExaminationEP1063757
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