EP2742594 - DRIVE CIRCUIT AND METHOD FOR A GATED SEMICONDUCTOR SWITCHING DEVICE [Right-click to bookmark this link] | Status | The application has been refused Status updated on 10.07.2020 Database last updated on 31.08.2024 | |
Former | Examination is in progress Status updated on 23.03.2018 | Most recent event Tooltip | 10.07.2020 | Refusal of application | published on 12.08.2020 [2020/33] | Applicant(s) | For all designated states Teledyne UK Limited 106 Waterhouse Lane Chelmsford Essex CM1 2QU / GB | [2020/15] |
Former [2019/11] | For all designated states Teledyne e2v (UK) Limited 106 Waterhouse Lane Chelmsford Essex CM1 2QU / GB | ||
Former [2014/25] | For all designated states E2V Technologies (UK) Limited 106 Waterhouse Lane Chelmsford Essex CM1 2QU / GB | Inventor(s) | 01 /
RICHARDSON, Robert 42 King Edwards Road South Woodham Ferrers Chelmsford Essex CM3 5PQ / GB | [2014/25] | Representative(s) | HGF HGF Limited 1 City Walk Leeds LS11 9DX / GB | [N/P] |
Former [2014/25] | McCrann, Sarah Ann HGF Limited 140 London Wall London EC2Y 5DN / GB | Application number, filing date | 12751104.6 | 10.08.2012 | WO2012GB51948 | Priority number, date | GB20110013908 | 12.08.2011 Original published format: GB 201113908 | [2014/25] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2013024270 | Date: | 21.02.2013 | Language: | EN | [2013/08] | Type: | A1 Application with search report | No.: | EP2742594 | Date: | 18.06.2014 | Language: | EN | The application published by WIPO in one of the EPO official languages on 21.02.2013 takes the place of the publication of the European patent application. | [2014/25] | Search report(s) | International search report - published on: | EP | 21.02.2013 | Classification | IPC: | H03K17/0424, H03K17/16 | [2014/25] | CPC: |
H03K17/0424 (EP,GB,US);
H03K3/012 (US);
H03K17/04206 (GB);
H03K17/0822 (GB);
H03K17/166 (EP,GB,US)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2014/25] | Title | German: | ANTRIEBSSCHALTUNG UND VERFAHREN FÜR EINE TORGESTEUERTE HALBLEITERSCHALTERSCHALTVORRICHTUNG | [2014/25] | English: | DRIVE CIRCUIT AND METHOD FOR A GATED SEMICONDUCTOR SWITCHING DEVICE | [2014/25] | French: | CIRCUIT D'ATTAQUE ET PROCÉDÉ POUR UN DISPOSITIF DE COMMUTATION À SEMI-CONDUCTEUR À COMMANDE PAR GRILLE | [2014/25] | Entry into regional phase | 12.03.2014 | National basic fee paid | 12.03.2014 | Designation fee(s) paid | 12.03.2014 | Examination fee paid | Examination procedure | 12.03.2014 | Examination requested [2014/25] | 30.09.2014 | Amendment by applicant (claims and/or description) | 27.03.2018 | Despatch of a communication from the examining division (Time limit: M06) | 05.10.2018 | Reply to a communication from the examining division | 20.03.2020 | Cancellation of oral proceeding that was planned for 26.03.2020 | 26.03.2020 | Despatch of communication that the application is refused, reason: substantive examination [2020/33] | 26.03.2020 | Date of oral proceedings (cancelled) | 05.04.2020 | Application refused, date of legal effect [2020/33] | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 27.03.2018 | Request for further processing for: | 18.11.2014 | Request for further processing filed | 18.11.2014 | Full payment received (date of receipt of payment) Request procedure closed | 24.11.2014 | Decision despatched | Fees paid | Renewal fee | 11.07.2014 | Renewal fee patent year 03 | 13.07.2015 | Renewal fee patent year 04 | 22.07.2016 | Renewal fee patent year 05 | 14.07.2017 | Renewal fee patent year 06 | 23.07.2018 | Renewal fee patent year 07 | 22.07.2019 | Renewal fee patent year 08 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [I]US2774888 (TROUSDALE ROBERT B) [I] 1-18 * the whole document *; | [I]US3983418 (WALLACE KENNETH A) [I] 1-18 * the whole document *; | [XI]DE2824957 (KIENSCHERF ECKHARD DIPL ING) [X] 1,10 * page 9, line 4 - page 12, line 4; figure 1 * [I] 2-9,11-18; | [I]GB2132436 (LANSING BAGNALL LTD) [I] 1-18 * page 3, line 14 - line 75; figure 2 *; | [I]JPS6086912 (FUJITSU LTD) [I] 1-18 * abstract *; | [I]US4914558 (FLICKINGER JON [US]) [I] 1-18 * column 6, line 60 - column 7, line 41; figure 1 ** column 5, line 23 - column 12, line 53 *; | [I]EP0687056 (TOSHIBA KK [JP]) [I] 1-18 * the whole document *; | [I]US2005194919 (XAVIER GOUMAIN [FR], et al) [I] 1-18 * the whole document *; | [I]US2007268649 (WANG TOM [TW]) [I] 1-18 * paragraph [0031]; figure 2 * | Examination | JPS6086912 | JP2008235997 | by applicant | US5332938 | WO2005025065 | WO2007137268 | - PROC. IEEE INTERNATIONAL POWER MODULATORS AND HIGH VOLTAGE CONFERENCE, (20080527), pages 128 - 130 | - IEEE TRANS. ON DIELECTRICS AND ELECTRICAL INSULATION, (200908), vol. 16, no. 4, pages 967 - 970 |