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Extract from the Register of European Patents

EP About this file: EP2720026

EP2720026 - RAMAN MICROSCOPE AND RAMAN SPECTROMETRIC METHOD [Right-click to bookmark this link]
Former [2014/16]RAMAN MICROSCOPE AND RAMAN SPECTROMETRY METHOD
[2023/23]
StatusThe patent has been granted
Status updated on  18.08.2023
Database last updated on 06.07.2024
FormerGrant of patent is intended
Status updated on  23.05.2023
FormerExamination is in progress
Status updated on  15.06.2018
Most recent event   Tooltip24.05.2024Lapse of the patent in a contracting state
New state(s): IT		published on 26.06.2024  [2024/26]
Applicant(s)For all designated states
Nanophoton Corporation
1-3-267 Umeda 1-chome Kita-ku Osaka-shi
Osaka 530-0001 / JP
[2014/16]
Inventor(s)01 / KAWANO, Shogo
Haitsu OKANO
301
1-1-36, Yamadahigashi
Suita-shi, Osaka 565-0821 / JP
02 / OTA, Taisuke
c/o Nanophoton Corporation
1-3-267, Umeda 1-chome
Kita-ku
Osaka-shi, Osaka 530-0001 / JP
03 / KOBAYASHI, Minoru
c/o Nanophoton Corporation
1-3-267, Umeda 1-chome
Kita-ku
Osaka-shi, Osaka 530-0001 / JP
 [2014/16]
Representative(s)Müller-Boré & Partner Patentanwälte PartG mbB
Friedenheimer Brücke 21
80639 München / DE
[2023/38]
Former [2014/16]Müller-Boré & Partner Patentanwälte PartG mbB
Friedenheimer Brücke 21
80639 München / DE
Application number, filing date12796263.706.06.2012
[2023/38]
WO2012JP64577
Priority number, dateJP2011012721707.06.2011         Original published format: JP 2011127217
[2014/16]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2012169539
Date:13.12.2012
Language:JA
[2012/50]
Type: A1 Application with search report 
No.:EP2720026
Date:16.04.2014
Language:EN
[2014/16]
Type: B1 Patent specification 
No.:EP2720026
Date:20.09.2023
Language:EN
[2023/38]
Search report(s)International search report - published on:JP13.12.2012
(Supplementary) European search report - dispatched on:EP26.01.2015
ClassificationIPC:G01N21/65, G01J3/44, G01J3/02
[2015/09]
CPC:
G01N21/65 (EP,US); G01J3/0218 (EP,US); G01J3/0224 (EP,US);
G01J3/44 (EP,US); G01J2003/4424 (EP,US)
Former IPC [2014/16]G01N21/65
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2014/16]
Extension statesBANot yet paid
MENot yet paid
TitleGerman:RAMANMIKROSKOP UND RAMANSPEKTROMETRIEVERFAHREN[2014/16]
English:RAMAN MICROSCOPE AND RAMAN SPECTROMETRIC METHOD[2023/23]
French:MICROSCOPE RAMAN ET PROCÉDÉ DE SPECTROMÉTRIE RAMAN[2014/16]
Former [2014/16]RAMAN MICROSCOPE AND RAMAN SPECTROMETRY METHOD
Entry into regional phase18.12.2013Translation filed 
03.01.2014National basic fee paid 
03.01.2014Search fee paid 
03.01.2014Designation fee(s) paid 
03.01.2014Examination fee paid 
Examination procedure03.01.2014Examination requested  [2014/16]
10.08.2015Amendment by applicant (claims and/or description)
18.06.2018Despatch of a communication from the examining division (Time limit: M04)
17.10.2018Reply to a communication from the examining division
07.09.2021Despatch of a communication from the examining division (Time limit: M04)
14.01.2022Reply to a communication from the examining division
24.05.2023Communication of intention to grant the patent
08.08.2023Receipt of the translation of the claim(s)
10.08.2023Fee for grant paid
10.08.2023Fee for publishing/printing paid
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  18.06.2018
Fees paidRenewal fee
26.06.2014Renewal fee patent year 03
29.06.2015Renewal fee patent year 04
31.03.2016Renewal fee patent year 05
27.06.2017Renewal fee patent year 06
25.06.2018Renewal fee patent year 07
26.06.2019Renewal fee patent year 08
29.06.2020Renewal fee patent year 09
16.06.2021Renewal fee patent year 10
31.03.2022Renewal fee patent year 11
20.06.2023Renewal fee patent year 12
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT20.09.2023
CZ20.09.2023
EE20.09.2023
ES20.09.2023
FI20.09.2023
HR20.09.2023
IT20.09.2023
LT20.09.2023
LV20.09.2023
NL20.09.2023
PL20.09.2023
RO20.09.2023
RS20.09.2023
SE20.09.2023
SK20.09.2023
SM20.09.2023
NO20.12.2023
GR21.12.2023
IS20.01.2024
PT22.01.2024
[2024/26]
Former [2024/25]AT20.09.2023
CZ20.09.2023
EE20.09.2023
ES20.09.2023
FI20.09.2023
HR20.09.2023
LT20.09.2023
LV20.09.2023
NL20.09.2023
PL20.09.2023
RO20.09.2023
RS20.09.2023
SE20.09.2023
SK20.09.2023
SM20.09.2023
NO20.12.2023
GR21.12.2023
IS20.01.2024
PT22.01.2024
Former [2024/23]AT20.09.2023
CZ20.09.2023
EE20.09.2023
ES20.09.2023
FI20.09.2023
HR20.09.2023
LT20.09.2023
LV20.09.2023
NL20.09.2023
RO20.09.2023
RS20.09.2023
SE20.09.2023
SK20.09.2023
SM20.09.2023
NO20.12.2023
GR21.12.2023
IS20.01.2024
PT22.01.2024
Former [2024/20]FI20.09.2023
HR20.09.2023
LT20.09.2023
LV20.09.2023
NL20.09.2023
RS20.09.2023
SE20.09.2023
SM20.09.2023
NO20.12.2023
GR21.12.2023
IS20.01.2024
Former [2024/14]FI20.09.2023
HR20.09.2023
LT20.09.2023
LV20.09.2023
NL20.09.2023
RS20.09.2023
SE20.09.2023
NO20.12.2023
GR21.12.2023
Former [2024/10]FI20.09.2023
HR20.09.2023
LT20.09.2023
LV20.09.2023
RS20.09.2023
SE20.09.2023
NO20.12.2023
GR21.12.2023
Former [2024/09]FI20.09.2023
LT20.09.2023
SE20.09.2023
NO20.12.2023
GR21.12.2023
Former [2024/08]LT20.09.2023
NO20.12.2023
GR21.12.2023
Documents cited:Search[Y]US2001045529  (IKETAKI YOSHINORI [JP], et al) [Y] 1,3,10,13-15* paragraph [0637]; figure 26; claim 55 *;
 [XYI]JP2006058477  (OLYMPUS CORP, et al) [X] 1,4-7,9,10,12 * paragraphs [0018] , [0044] , [0047] , [0056]; figures 1,8,22; claim 4 * [Y] 1,3,10,13-15 [I] 2,8,11;
 [Y]US2010067102  (YOKOI EIJI [JP], et al) [Y] 1,10 * paragraphs [0101] , [0102] , [0121]; figures 3,4 *
International search[Y]JPH11295148  (RIKAGAKU KENKYUSHO);
 [Y]JP2003241101  (OLYMPUS OPTICAL CO, et al);
 [Y]JP2006058477  (OLYMPUS CORP, et al);
 [Y]JP2010015026  (OLYMPUS CORP);
 [Y]JP2010092002  (OLYMPUS CORP);
 [Y]JP2010258272  (SUMITOMO ELECTRIC INDUSTRIES)
ExaminationUS2010252750
    - Adelbert Owyoung, "High-resolution cw stimulated Raman spectroscopy in molecular hydrogen", Optics Letters, US, (19780401), vol. 2, no. 4, doi:10.1364/OL.2.000091, ISSN 0146-9592, page 91, XP055483650

DOI:   http://dx.doi.org/10.1364/OL.2.000091
    - Min Wei ET AL, "Imaging chromophores with undetectable fluorescence by stimulated emission microscopy", Nature, London, vol. 461, no. 7267, doi:10.1038/nature08438, ISSN 0028-0836, (20091001), pages 1105 - 1109, URL: https://www.nature.com/articles/nature08438.pdf, XP055836421

DOI:   http://dx.doi.org/10.1038/nature08438
    - Stefan W. Hell ET AL, "Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy", Optics Letters, (19940601), vol. 19, no. 11, doi:10.1364/OL.19.000780, ISSN 0146-9592, page 780, XP055149725

DOI:   http://dx.doi.org/10.1364/OL.19.000780
by applicantJP2007071606
 JP2009258030
 JP2010092002
    - HELL, S.W.; J. WICHMANN, "Breaking the diffraction resolution limit by stimulated emission", OPT. LETT., (1994), vol. 19, no. 11, pages 780 - 782, XP000449464
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.