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Extract from the Register of European Patents

EP About this file: EP2751593

EP2751593 - X-RAY DETECTOR [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  21.08.2020
Database last updated on 03.09.2024
FormerThe patent has been granted
Status updated on  13.09.2019
FormerGrant of patent is intended
Status updated on  09.05.2019
FormerExamination is in progress
Status updated on  16.12.2016
Most recent event   Tooltip01.07.2022Lapse of the patent in a contracting state
New state(s): MK		published on 03.08.2022  [2022/31]
Applicant(s)For:AL  AT  BE  BG  CH  CY  CZ  DK  EE  ES  FI  FR  GB  GR  HR  HU  IE  IS  IT  LI  LT  LU  LV  MC  MK  MT  NL  NO  PL  PT  RO  RS  SE  SI  SK  SM  TR 
Koninklijke Philips N.V.
High Tech Campus 52
5656 AG Eindhoven / NL
For:DE 
Philips GmbH
Röntgenstraße 22
22335 Hamburg / DE
[2020/12]
Former [2019/14]For:AL  AT  BE  BG  CH  CY  CZ  DK  EE  ES  FI  FR  GB  GR  HR  HU  IE  IS  IT  LI  LT  LU  LV  MC  MK  MT  NL  NO  PL  PT  RO  RS  SE  SI  SK  SM  TR 
Koninklijke Philips N.V.
High Tech Campus 5
5656 AE Eindhoven / NL
For:DE 
Philips GmbH
Röntgenstraße 22
22335 Hamburg / DE
Former [2014/33]For:AL  AT  BE  BG  CH  CY  CZ  DK  EE  ES  FI  FR  GB  GR  HR  HU  IE  IS  IT  LI  LT  LU  LV  MC  MK  MT  NL  NO  PL  PT  RO  RS  SE  SI  SK  SM  TR 
Koninklijke Philips N.V.
High Tech Campus 5
5656 AE Eindhoven / NL
For:DE 
Philips Deutschland GmbH
Lübeckertordamm 5
20099 Hamburg / DE
Former [2014/28]For:AL  AT  BE  BG  CH  CY  CZ  DK  EE  ES  FI  FR  GB  GR  HR  HU  IE  IS  IT  LI  LT  LU  LV  MC  MK  MT  NL  NO  PL  PT  RO  RS  SE  SI  SK  SM  TR 
Koninklijke Philips Electronics N.V.
High Tech Campus 5
5656 AE Eindhoven / NL
For:DE 
Philips Deutschland GmbH
Lübeckertordamm 5
20099 Hamburg / DE
Inventor(s)01 / HERRMANN, Christoph
c/o High Tech Campus Building 44
5656 AE Eindhoven / NL
 [2019/23]
Former [2014/28]01 / HERRMANN, Christoph
c/o High Tech Campus Building 44
NL-5656AE Eindhoven / NL
Representative(s)Philips Intellectual Property & Standards
High Tech Campus 52
5656 AG Eindhoven / NL
[N/P]
Former [2019/42]Steffen, Thomas
Philips Intellectual Property & Standards
High Tech Campus 5
5656 AE Eindhoven / NL
Former [2014/28]Steffen, Thomas
Philips Intellectual Property & Standards P.O. Box 220
5600 AE Eindhoven / NL
Application number, filing date12818817.406.12.2012
[2019/42]
WO2012IB57009
Priority number, dateUS201161577322P19.12.2011         Original published format: US 201161577322 P
[2014/28]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report
No.:WO2013093684
Date:27.06.2013
Language:EN
[2013/26]
Type: A2 Application without search report 
No.:EP2751593
Date:09.07.2014
Language:EN
The application published by WIPO in one of the EPO official languages on 27.06.2013 takes the place of the publication of the European patent application.
[2014/28]
Type: B1 Patent specification 
No.:EP2751593
Date:16.10.2019
Language:EN
[2019/42]
Search report(s)International search report - published on:EP24.10.2013
ClassificationIPC:G01T1/17, G01T1/24, G01T1/29
[2014/28]
CPC:
G01T1/17 (EP,US); G01N23/04 (EP,US); G01T1/208 (US);
G01T1/247 (EP,US); G01T1/2985 (EP,US)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2014/28]
Extension statesBANot yet paid
MENot yet paid
TitleGerman:RÖNTGENDETEKTOR[2014/28]
English:X-RAY DETECTOR[2014/28]
French:DÉTECTEUR DE RAYONS X[2014/28]
Entry into regional phase31.03.2014National basic fee paid 
31.03.2014Designation fee(s) paid 
31.03.2014Examination fee paid 
Examination procedure28.03.2014Amendment by applicant (claims and/or description)
31.03.2014Examination requested  [2014/28]
16.12.2016Despatch of a communication from the examining division (Time limit: M06)
09.05.2017Reply to a communication from the examining division
12.07.2018Despatch of a communication from the examining division (Time limit: M04)
09.10.2018Reply to a communication from the examining division
21.03.2019Cancellation of oral proceeding that was planned for 13.05.2019
10.05.2019Communication of intention to grant the patent
13.05.2019Date of oral proceedings (cancelled)
04.09.2019Fee for grant paid
04.09.2019Fee for publishing/printing paid
04.09.2019Receipt of the translation of the claim(s)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  16.12.2016
Opposition(s)17.07.2020No opposition filed within time limit [2020/39]
Fees paidRenewal fee
05.01.2015Renewal fee patent year 03
04.01.2016Renewal fee patent year 04
02.01.2017Renewal fee patent year 05
02.01.2018Renewal fee patent year 06
02.01.2019Renewal fee patent year 07
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU06.12.2012
AL16.10.2019
AT16.10.2019
CY16.10.2019
CZ16.10.2019
DK16.10.2019
EE16.10.2019
ES16.10.2019
FI16.10.2019
HR16.10.2019
IT16.10.2019
LT16.10.2019
LV16.10.2019
MC16.10.2019
MK16.10.2019
MT16.10.2019
NL16.10.2019
PL16.10.2019
RO16.10.2019
RS16.10.2019
SE16.10.2019
SI16.10.2019
SK16.10.2019
SM16.10.2019
TR16.10.2019
IE06.12.2019
LU06.12.2019
BE31.12.2019
CH31.12.2019
LI31.12.2019
BG16.01.2020
GB16.01.2020
NO16.01.2020
GR17.01.2020
IS16.02.2020
PT17.02.2020
[2022/31]
Former [2022/26]HU06.12.2012
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SM16.10.2019
TR16.10.2019
IE06.12.2019
LU06.12.2019
BE31.12.2019
CH31.12.2019
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GR17.01.2020
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Former [2021/34]HU06.12.2012
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DK16.10.2019
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FI16.10.2019
HR16.10.2019
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LT16.10.2019
LV16.10.2019
MC16.10.2019
MT16.10.2019
NL16.10.2019
PL16.10.2019
RO16.10.2019
RS16.10.2019
SE16.10.2019
SI16.10.2019
SK16.10.2019
SM16.10.2019
IE06.12.2019
LU06.12.2019
BE31.12.2019
CH31.12.2019
LI31.12.2019
BG16.01.2020
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Former [2021/32]HU06.12.2012
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FI16.10.2019
HR16.10.2019
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LV16.10.2019
MC16.10.2019
NL16.10.2019
PL16.10.2019
RO16.10.2019
RS16.10.2019
SE16.10.2019
SI16.10.2019
SK16.10.2019
SM16.10.2019
IE06.12.2019
LU06.12.2019
BE31.12.2019
CH31.12.2019
LI31.12.2019
BG16.01.2020
GB16.01.2020
NO16.01.2020
GR17.01.2020
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PT17.02.2020
Former [2021/26]AL16.10.2019
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HR16.10.2019
IT16.10.2019
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MC16.10.2019
NL16.10.2019
PL16.10.2019
RO16.10.2019
RS16.10.2019
SE16.10.2019
SI16.10.2019
SK16.10.2019
SM16.10.2019
IE06.12.2019
LU06.12.2019
BE31.12.2019
CH31.12.2019
LI31.12.2019
BG16.01.2020
GB16.01.2020
NO16.01.2020
GR17.01.2020
IS16.02.2020
PT17.02.2020
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IT16.10.2019
LT16.10.2019
LV16.10.2019
MC16.10.2019
NL16.10.2019
PL16.10.2019
RO16.10.2019
RS16.10.2019
SE16.10.2019
SI16.10.2019
SK16.10.2019
SM16.10.2019
IE06.12.2019
LU06.12.2019
BE31.12.2019
CH31.12.2019
LI31.12.2019
BG16.01.2020
GB16.01.2020
NO16.01.2020
GR17.01.2020
IS16.02.2020
PT17.02.2020
Former [2020/48]AL16.10.2019
AT16.10.2019
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EE16.10.2019
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IT16.10.2019
LT16.10.2019
LV16.10.2019
MC16.10.2019
NL16.10.2019
PL16.10.2019
RO16.10.2019
RS16.10.2019
SE16.10.2019
SK16.10.2019
SM16.10.2019
IE06.12.2019
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BG16.01.2020
GB16.01.2020
NO16.01.2020
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PT17.02.2020
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EE16.10.2019
ES16.10.2019
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IT16.10.2019
LT16.10.2019
LV16.10.2019
MC16.10.2019
NL16.10.2019
PL16.10.2019
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RS16.10.2019
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SK16.10.2019
SM16.10.2019
IE06.12.2019
LU06.12.2019
BG16.01.2020
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PT17.02.2020
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IT16.10.2019
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MC16.10.2019
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PL16.10.2019
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SE16.10.2019
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SM16.10.2019
BG16.01.2020
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PT17.02.2020
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NL16.10.2019
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RO16.10.2019
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SM16.10.2019
BG16.01.2020
NO16.01.2020
GR17.01.2020
IS16.02.2020
PT17.02.2020
Former [2020/37]AL16.10.2019
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BG16.01.2020
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NL16.10.2019
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RO16.10.2019
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BG16.01.2020
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BG16.01.2020
NO16.01.2020
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PT17.02.2020
IS24.02.2020
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IS24.02.2020
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Cited inInternational search[Y]US2006208195  (PETRICK SCOTT W [US], et al) [Y] 7 * paragraph [0008] *;
 [Y]US7433443  (TKACZYK JOHN ERIC [US], et al) [Y] 2,3* column 8, line 32 - line 59; figure - *;
 [XY]WO2010043926  (KONINKL PHILIPS ELECTRONICS NV [NL], et al) [X] 1,4-6,8-11,13-15 * page 5, line 14 - line 26 * * page 11, line 16 - page 12, line 10 * * page 13, line 1 - line 13; figure - * [Y] 2,3,7,12;
 [Y]  - ROESSL EWALD ET AL, "A comparative study of a dual-energy-like imaging technique based on counting-integrating readout", MEDICAL PHYSICS, AIP, MELVILLE, NY, US, vol. 38, no. 12, doi:10.1118/1.3651643, ISSN 0094-2405, ISBN 978-1-930524-56-9, (20111201), pages 6416 - 6428, (20111110), XP012152010 [Y] 12 * abstract *

DOI:   http://dx.doi.org/10.1118/1.3651643
by applicantUS2001048080
 WO2007010448
 WO2009072056
    - GLENN KNOLL, Radiation detection and measurement, WILEY, pages 119 - 122
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.