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EP2793329
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EP About this file: EP2793329
| EP2793329 - OPTICAL SEMICONDUCTOR PACKAGE, MICHELSON INTERFEROMETER, AND FOURIER TRANSFORM SPECTROSCOPIC ANALYSIS APPARATUS [Right-click to bookmark this link] | Status | The application has been withdrawn Status updated on 25.05.2018 Database last updated on 14.11.2024 | |
| Former | Examination is in progress Status updated on 27.04.2018 | Most recent event Tooltip | 25.05.2018 | Withdrawal of application | published on 27.06.2018 [2018/26] | Applicant(s) | For all designated states Konica Minolta, Inc. 2-7-2 Marunouchi Chiyoda-ku Tokyo 100-7015 / JP | [2014/43] | Inventor(s) | 01 /
HIRAO, Yusuke c/o Konica Minolta, Inc. 2-7-2 Marunouchi, Chiyoda-ku Tokyo 100-7015 / JP | [2014/43] | Representative(s) | Hoffmann Eitle Patent- und Rechtsanwälte PartmbB Arabellastraße 30 81925 München / DE | [N/P] |
| Former [2014/43] | HOFFMANN EITLE Patent- und Rechtsanwälte Arabellastrasse 4 81925 München / DE | Application number, filing date | 12856468.9 | 27.11.2012 | WO2012JP80557 | Priority number, date | JP20110266874 | 06.12.2011 Original published format: JP 2011266874 | [2014/43] | Filing language | JA | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2013084746 | Date: | 13.06.2013 | Language: | JA | [2013/24] | Type: | A1 Application with search report | No.: | EP2793329 | Date: | 22.10.2014 | Language: | EN | [2014/43] | Search report(s) | International search report - published on: | JP | 13.06.2013 | (Supplementary) European search report - dispatched on: | EP | 05.08.2015 | Classification | IPC: | H01S5/068, H01S5/183, H01S5/022, G01J3/10, G01J3/45, G01J5/06, G01B9/02, // H01S5/024 | [2015/36] | CPC: |
G01J3/10 (EP,US);
H01S5/024 (US);
G01B9/02001 (US);
G01J3/45 (EP,US);
G01J5/061 (EP,US);
H01S5/02325 (EP,US);
H01S5/06804 (EP,US);
H01S5/183 (EP,US);
H01S5/02212 (EP,US);
H01S5/02415 (EP,US)
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| Former IPC [2014/43] | H01S5/022, G01J3/10, G01J3/45, H01S5/024, H01S5/183 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2014/43] | Title | German: | OPTISCHES HALBLEITERGEHÄUSE, MICHELSON-INTERFEROMETER UND SPEKTROSKOPISCHE FOURIER-TRANSFORMATIONS-ANALYSEVORRICHTUNG | [2014/43] | English: | OPTICAL SEMICONDUCTOR PACKAGE, MICHELSON INTERFEROMETER, AND FOURIER TRANSFORM SPECTROSCOPIC ANALYSIS APPARATUS | [2014/43] | French: | BOÎTIER SEMI-CONDUCTEUR OPTIQUE, INTERFÉROMÈTRE DE MICHELSON, ET APPAREIL D'ANALYSE SPECTROSCOPIQUE À TRANSFORMÉE DE FOURIER | [2014/43] | Entry into regional phase | 24.06.2014 | Translation filed | 24.06.2014 | National basic fee paid | 24.06.2014 | Search fee paid | 24.06.2014 | Designation fee(s) paid | 24.06.2014 | Examination fee paid | Examination procedure | 24.06.2014 | Examination requested [2014/43] | 14.12.2015 | Amendment by applicant (claims and/or description) | 26.04.2018 | Despatch of a communication from the examining division (Time limit: M04) | 24.05.2018 | Application withdrawn by applicant [2018/26] | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 26.04.2018 | Fees paid | Renewal fee | 10.11.2014 | Renewal fee patent year 03 | 10.11.2015 | Renewal fee patent year 04 | 10.11.2016 | Renewal fee patent year 05 | 13.11.2017 | Renewal fee patent year 06 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [I]JPH11186645 (MITSUBISHI ELECTRIC CORP) [I] 1 * paragraphs [0005] , [0026] , [0027]; figure 2 *; | [Y]US2005259250 (SIMON ARNO [DE]) [Y] 8,9* paragraphs [0037] , [0039] , [0046] - [0050]; figure 1 *; | [IY]US2011006124 (KAI YUTAKA [JP]) [I] 1-7 * paragraphs [0044] , [0052] , [0054] , [0123]; figure 2 * [Y] 8,9; | [I] - NASU H ET AL, "25-GHz-spacing wavelength-monitor integrated DFB laser module for DWDM applications", IEEE PHOTONICS TECHNOLOGY LETTERS, IEEE SERVICE CENTER, PISCATAWAY, NJ, US, (200302), vol. 15, no. 2, doi:10.1109/LPT.2002.806845, ISSN 1041-1135, pages 293 - 295, XP011426997 [I] 1 * the whole document * DOI: http://dx.doi.org/10.1109/LPT.2002.806845 | International search | [A]JPH0590698 (MITSUBISHI ELECTRIC CORP); | [A]JP2000294868 (FURUKAWA ELECTRIC CO LTD); | [A]JP2005303242 (HITACHI CABLE); | [A]JP2011018833 (FUJITSU LTD); | [A]WO2011148726 (KONICA MINOLTA HOLDINGS INC [JP], et al) | by applicant | JP2003142766 |