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Extract from the Register of European Patents

EP About this file: EP2816800

EP2816800 - SEMICONDUCTOR PHOTOMULTIPLIER ELEMENT [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  03.07.2020
Database last updated on 25.09.2024
FormerThe patent has been granted
Status updated on  24.05.2019
FormerGrant of patent is intended
Status updated on  10.01.2019
FormerExamination is in progress
Status updated on  15.09.2017
Most recent event   Tooltip08.07.2022Lapse of the patent in a contracting state
New state(s): MK		published on 10.08.2022  [2022/32]
Applicant(s)For all designated states
Shimadzu Corporation
1, Nishinokyo-Kuwabaracho Nakagyo-ku
Kyoto-shi, Kyoto 604-8511 / JP
[2019/25]
Former [2014/52]For all designated states
Shimadzu Corporation
No. 1 Nishinokyo-kuwabaracho Nakagyo-ku
Kyoto-shi, Kyoto-fu 604-8511 / JP
Inventor(s)01 / FURUMIYA, Tetsuo
c/o SHIMADZU CORPORATION
1 Nishinokyo-Kuwabaracho
Nakagyo-ku
Kyoto-shi Kyoto 604-8511 / JP
 [2014/52]
Representative(s)Mewburn Ellis LLP
Aurora Building
Counterslip
Bristol BS1 6BX / GB
[N/P]
Former [2019/26]Mewburn Ellis LLP
City Tower
40 Basinghall Street
London EC2V 5DE / GB
Former [2014/52]Webster, Jeremy Mark, et al
Mewburn Ellis LLP
33 Gutter Lane
London
EC2V 8AS / GB
Application number, filing date12872834.229.03.2012
[2019/26]
WO2012JP02199
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2013145011
Date:03.10.2013
Language:JA
[2013/40]
Type: A1 Application with search report 
No.:EP2816800
Date:24.12.2014
Language:EN
[2014/52]
Type: B1 Patent specification 
No.:EP2816800
Date:26.06.2019
Language:EN
[2019/26]
Search report(s)International search report - published on:JP03.10.2013
(Supplementary) European search report - dispatched on:EP17.04.2015
ClassificationIPC:H04N5/369, H01L31/10, H04N5/32
[2014/52]
CPC:
H01L31/02019 (EP,US); G01J1/44 (US); G01J1/4228 (US);
G01T1/20 (EP,US); G01T1/208 (EP,US); G01T1/248 (EP,US);
H01L27/1446 (EP,US); G01J2001/4413 (US); G01J2001/446 (US) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2014/52]
Extension statesBANot yet paid
MENot yet paid
TitleGerman:HALBLEITERPHOTOVERVIELFACHERELEMENT[2014/52]
English:SEMICONDUCTOR PHOTOMULTIPLIER ELEMENT[2014/52]
French:ELÉMENT PHOTOMULTIPLICATEUR À SEMI-CONDUCTEURS[2014/52]
Entry into regional phase18.09.2014Translation filed 
19.09.2014National basic fee paid 
19.09.2014Search fee paid 
19.09.2014Designation fee(s) paid 
19.09.2014Examination fee paid 
Examination procedure19.09.2014Examination requested  [2014/52]
17.11.2015Amendment by applicant (claims and/or description)
19.09.2017Despatch of a communication from the examining division (Time limit: M04)
22.01.2018Reply to a communication from the examining division
11.01.2019Communication of intention to grant the patent
13.05.2019Fee for grant paid
13.05.2019Fee for publishing/printing paid
13.05.2019Receipt of the translation of the claim(s)
Divisional application(s)The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is  19.09.2017
Opposition(s)03.06.2020No opposition filed within time limit [2020/32]
Fees paidRenewal fee
19.09.2014Renewal fee patent year 03
24.03.2015Renewal fee patent year 04
21.03.2016Renewal fee patent year 05
23.03.2017Renewal fee patent year 06
27.03.2018Renewal fee patent year 07
18.03.2019Renewal fee patent year 08
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU29.03.2012
AL26.06.2019
AT26.06.2019
CY26.06.2019
CZ26.06.2019
DK26.06.2019
EE26.06.2019
ES26.06.2019
FI26.06.2019
HR26.06.2019
LT26.06.2019
LV26.06.2019
MC26.06.2019
MK26.06.2019
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GR27.09.2019
IS26.10.2019
PT28.10.2019
IE29.03.2020
LU29.03.2020
BE31.03.2020
CH31.03.2020
FR31.03.2020
LI31.03.2020
[2022/32]
Former [2022/27]HU29.03.2012
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GR27.09.2019
IS26.10.2019
PT28.10.2019
IE29.03.2020
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BE31.03.2020
CH31.03.2020
FR31.03.2020
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BG26.09.2019
NO26.09.2019
GR27.09.2019
IS26.10.2019
PT28.10.2019
IE29.03.2020
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CH31.03.2020
FR31.03.2020
LI31.03.2020
Former [2021/04]AL26.06.2019
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PL26.06.2019
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SE26.06.2019
SI26.06.2019
SK26.06.2019
SM26.06.2019
TR26.06.2019
BG26.09.2019
NO26.09.2019
GR27.09.2019
IS26.10.2019
PT28.10.2019
LU29.03.2020
Former [2020/49]AL26.06.2019
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FI26.06.2019
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PL26.06.2019
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SE26.06.2019
SI26.06.2019
SK26.06.2019
SM26.06.2019
TR26.06.2019
BG26.09.2019
NO26.09.2019
GR27.09.2019
IS26.10.2019
PT28.10.2019
Former [2020/37]AL26.06.2019
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PL26.06.2019
RO26.06.2019
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SE26.06.2019
SI26.06.2019
SK26.06.2019
SM26.06.2019
TR26.06.2019
BG26.09.2019
NO26.09.2019
GR27.09.2019
IS26.10.2019
PT28.10.2019
Former [2020/36]AL26.06.2019
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SK26.06.2019
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BG26.09.2019
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GR27.09.2019
IS26.10.2019
PT28.10.2019
Former [2020/24]AL26.06.2019
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EE26.06.2019
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FI26.06.2019
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PL26.06.2019
RO26.06.2019
RS26.06.2019
SE26.06.2019
SK26.06.2019
SM26.06.2019
TR26.06.2019
BG26.09.2019
NO26.09.2019
GR27.09.2019
PT28.10.2019
IS24.02.2020
Former [2020/22]AL26.06.2019
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EE26.06.2019
ES26.06.2019
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TR26.06.2019
BG26.09.2019
NO26.09.2019
GR27.09.2019
IS26.10.2019
PT28.10.2019
Former [2020/17]AL26.06.2019
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TR26.06.2019
BG26.09.2019
NO26.09.2019
GR27.09.2019
IS26.10.2019
PT28.10.2019
Former [2020/13]AL26.06.2019
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EE26.06.2019
ES26.06.2019
FI26.06.2019
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LV26.06.2019
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SE26.06.2019
SK26.06.2019
SM26.06.2019
BG26.09.2019
NO26.09.2019
GR27.09.2019
IS26.10.2019
PT28.10.2019
Former [2020/12]AL26.06.2019
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LV26.06.2019
RO26.06.2019
RS26.06.2019
SE26.06.2019
SK26.06.2019
BG26.09.2019
NO26.09.2019
GR27.09.2019
IS26.10.2019
PT28.10.2019
Former [2020/11]AL26.06.2019
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EE26.06.2019
ES26.06.2019
FI26.06.2019
HR26.06.2019
LT26.06.2019
LV26.06.2019
RO26.06.2019
RS26.06.2019
SE26.06.2019
SK26.06.2019
BG26.09.2019
NO26.09.2019
GR27.09.2019
PT28.10.2019
Former [2020/10]AL26.06.2019
AT26.06.2019
CZ26.06.2019
FI26.06.2019
HR26.06.2019
LT26.06.2019
LV26.06.2019
RO26.06.2019
RS26.06.2019
SE26.06.2019
BG26.09.2019
NO26.09.2019
GR27.09.2019
PT28.10.2019
Former [2020/09]AL26.06.2019
CZ26.06.2019
FI26.06.2019
HR26.06.2019
LT26.06.2019
LV26.06.2019
RS26.06.2019
SE26.06.2019
BG26.09.2019
NO26.09.2019
GR27.09.2019
Former [2019/51]AL26.06.2019
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HR26.06.2019
LT26.06.2019
LV26.06.2019
RS26.06.2019
SE26.06.2019
BG26.09.2019
NO26.09.2019
GR27.09.2019
Former [2019/50]AL26.06.2019
FI26.06.2019
HR26.06.2019
LT26.06.2019
LV26.06.2019
RS26.06.2019
SE26.06.2019
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GR27.09.2019
Former [2019/49]AL26.06.2019
FI26.06.2019
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Former [2019/48]FI26.06.2019
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Former [2019/47]FI26.06.2019
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NO26.09.2019
Documents cited:Search[IY]US2006202129  (NICLASS CRISTIANO [CH], et al) [I] 1,6,8 * paragraph [0033] - paragraph [0034]; figure - * * paragraph [0018] *[Y] 3-5,7;
 [Y]WO2010073136  (KONINKL PHILIPS ELECTRONICS NV [NL], et al) [Y] 3,4 * page 5, line 31 - page 6, line 10; figure - *;
 [Y]DE102010041805  (SIEMENS AG [DE]) [Y] 5 * paragraph [0027] - paragraph [0031]; figure 2 *;
 [IY]  - FRACH T, "Optimization of the digital Silicon Photomultiplier for Cherenkov light detection", JOURNAL OF INSTRUMENTATION, INSTITUTE OF PHYSICS PUBLISHING, BRISTOL, GB, (20120131), vol. 7, no. 1, doi:10.1088/1748-0221/7/01/C01112, ISSN 1748-0221, page C01112, XP020217167 [I] 1,2 * abstract * * page 1, line 16 - line 24 * [Y] 3-5,7

DOI:   http://dx.doi.org/10.1088/1748-0221/7/01/C01112
 [Y]  - ROBERT G. W. BROWN ET AL, "Characterization of silicon avalanche photodiodes for photon correlation measurements 1: Passive quenching", APPLIED OPTICS, (19861115), vol. 25, no. 22, doi:10.1364/AO.25.004122, ISSN 0003-6935, page 4122, XP055017179 [Y] 7 * page 4123, paragraph IV. *

DOI:   http://dx.doi.org/10.1364/AO.25.004122
International search[A]JP2005251974  (YOKOGAWA ELECTRIC CORP);
 [A]JP2006179587  (ANRITSU CORP);
 [A]JP2010536186  (SENSL TECHNOLOGIES LTD.);
 [A]JP2012060012  (TOYOTA CENTRAL RES & DEV)
by applicantJP2010536186
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.