EP2657764 - Manufacturing method of a photomask blank [Right-click to bookmark this link] | |||
Former [2013/44] | Photomask blank and manufacturing method thereof | ||
[2020/06] | Status | No opposition filed within time limit Status updated on 12.03.2021 Database last updated on 13.11.2024 | |
Former | The patent has been granted Status updated on 03.04.2020 | ||
Former | Grant of patent is intended Status updated on 30.01.2020 | ||
Former | Request for examination was made Status updated on 29.09.2017 | Most recent event Tooltip | 06.09.2024 | Lapse of the patent in a contracting state New state(s): MT | published on 09.10.2024 [2024/41] | Applicant(s) | For all designated states Shin-Etsu Chemical Co., Ltd. 6-1, Ohtemachi 2-chome Chiyoda-ku Tokyo 100-0004 / JP | [2020/19] |
Former [2013/44] | For all designated states Shin-Etsu Chemical Co., Ltd. 6-1, Ohtemachi 2-chome Chiyoda-ku Tokyo 100-0004 / JP | Inventor(s) | 01 /
Fukaya, Souichi c/o Shin-Etsu Chemical Co., Ltd. New Functional Materials Research Center 28-1, Nishifukushima Kubiki-ku Joetsu-shi, Niigata 942-8601 / JP | [2013/44] | Representative(s) | Forrest, Stuart, et al WP Thompson 138 Fetter Lane London EC4A 1BT / GB | [2020/19] |
Former [2013/44] | Smaggasgale, Gillian Helen WP Thompson 55 Drury Lane London WC2B 5SQ / GB | Application number, filing date | 13165445.1 | 25.04.2013 | [2013/44] | Priority number, date | JP20120100821 | 26.04.2012 Original published format: JP 2012100821 | [2013/44] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP2657764 | Date: | 30.10.2013 | Language: | EN | [2013/44] | Type: | A3 Search report | No.: | EP2657764 | Date: | 05.07.2017 | Language: | EN | [2017/27] | Type: | B1 Patent specification | No.: | EP2657764 | Date: | 06.05.2020 | Language: | EN | [2020/19] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 01.06.2017 | Classification | IPC: | G03F1/26, G03F1/50, G03F1/32 | [2017/27] | CPC: |
G03F1/26 (EP,KR,US);
H01L21/0274 (KR);
G03F1/20 (KR);
G03F1/32 (EP,KR,US);
G03F1/50 (KR,US);
G03F1/58 (KR);
G03F1/82 (KR)
(-)
|
Former IPC [2013/44] | G03F1/26, G03F1/50 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2017/44] |
Former [2013/44] | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR | Title | German: | Herstellungsverfahren für einen Fotomaskenrohling | [2020/06] | English: | Manufacturing method of a photomask blank | [2020/06] | French: | Procédé de fabrication d'une ébauche de photomasque | [2020/06] |
Former [2013/44] | Fotomaskenrohling und Herstellungsverfahren dafür | ||
Former [2013/44] | Photomask blank and manufacturing method thereof | ||
Former [2013/44] | Ébauche de photomasque et son procédé de fabrication | Examination procedure | 25.04.2013 | Date on which the examining division has become responsible | 20.09.2017 | Amendment by applicant (claims and/or description) | 20.09.2017 | Examination requested [2017/44] | 31.01.2020 | Communication of intention to grant the patent | 25.03.2020 | Fee for grant paid | 25.03.2020 | Fee for publishing/printing paid | 25.03.2020 | Receipt of the translation of the claim(s) | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 31.01.2020 | Opposition(s) | 09.02.2021 | No opposition filed within time limit [2021/15] | Fees paid | Renewal fee | 10.04.2015 | Renewal fee patent year 03 | 30.03.2016 | Renewal fee patent year 04 | 10.04.2017 | Renewal fee patent year 05 | 11.04.2018 | Renewal fee patent year 06 | 15.04.2019 | Renewal fee patent year 07 | 31.03.2020 | Renewal fee patent year 08 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | HU | 25.04.2013 | AL | 06.05.2020 | AT | 06.05.2020 | CY | 06.05.2020 | CZ | 06.05.2020 | DK | 06.05.2020 | EE | 06.05.2020 | ES | 06.05.2020 | FI | 06.05.2020 | HR | 06.05.2020 | LT | 06.05.2020 | LV | 06.05.2020 | MC | 06.05.2020 | MK | 06.05.2020 | MT | 06.05.2020 | NL | 06.05.2020 | PL | 06.05.2020 | RO | 06.05.2020 | RS | 06.05.2020 | SE | 06.05.2020 | SI | 06.05.2020 | SK | 06.05.2020 | SM | 06.05.2020 | BG | 06.08.2020 | NO | 06.08.2020 | GR | 07.08.2020 | PT | 07.09.2020 | [2024/41] |
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Former [2020/46] | IS | 06.09.2020 | Documents cited: | Search | [X]JPH06258817 (TOPPAN PRINTING CO LTD) [X] 1,4,5,10 * paragraphs [0046] , [0050] - [0055]; examples 1-9 *; | [X]US2002061452 (NOZAWA OSAMU [JP], et al) [X] 1,4 * paragraphs [0037] , [0044] - [0051] - [0056] , [0065] , [0075] , [0084]; examples 1-16; claims 1,2,5,9-11; tables 1-4 *; | [AD]JP2004199035 (SHINETSU CHEMICAL CO) [AD] 1-10* paragraph [0022] *; | [XI]EP2237109 (SHINETSU CHEMICAL CO [JP]) [X] 1-5,7,8,10 * paragraphs [0018] - [0021] - [0067] - [0069] - [0073] , [0080] - [0089]; figures 1,2; examples 1,2; claims 1,6-8 * [I] 9; | [X]US2011111332 (IWASHITA HIROYUKI [JP], et al) [X] 1,2,4 * paragraph [0204]; example 1 * | by applicant | JPH07140635 | JP2002229183 | JP2003050458 | JP2004199035 | JP2005331554 |