EP2875521 - ETCHING METHOD, AND METHOD OF PRODUCING SEMICONDUCTOR SUBSTRATE PRODUCT AND SEMICONDUCTOR DEVICE USING THE SAME [Right-click to bookmark this link] | Status | No opposition filed within time limit Status updated on 15.01.2021 Database last updated on 24.01.2025 | |
Former | The patent has been granted Status updated on 07.02.2020 | ||
Former | Grant of patent is intended Status updated on 24.11.2019 | Most recent event Tooltip | 08.07.2022 | Lapse of the patent in a contracting state New state(s): MK | published on 10.08.2022 [2022/32] | Applicant(s) | For all designated states FUJIFILM Corporation 26-30, Nishiazabu 2-chome Minato-ku Tokyo 106-8620 / JP | [N/P] |
Former [2015/22] | For all designated states FUJIFILM Corporation 26-30, Nishiazabu 2-chome Minato-ku Tokyo 106-8620 / JP | Inventor(s) | 01 /
MURO, Naotsugu c/o FUJIFILM Corporation 4000 Kawashiri Yoshida-cho Haibara-gun Shizuoka 421-0396 / JP | 02 /
KAMIMURA, Tetsuya c/o FUJIFILM Corporation 4000 Kawashiri Yoshida-cho Haibara-gun Shizuoka 421-0396 / JP | 03 /
INABA, Tadashi c/o FUJIFILM Corporation 4000 Kawashiri Yoshida-cho Haibara-gun Shizuoka 421-0396 / JP | 04 /
WATANABE, Takahiro c/o FUJIFILM Corporation 4000 Kawashiri Yoshida-cho Haibara-gun Shizuoka 421-0396 / JP | 05 /
PARK, Kee Young c/o FUJIFILM Corporation 4000 Kawashiri Yoshida-cho Haibara-gun Shizuoka, 4210396 / JP | [2015/22] | Representative(s) | Hoffmann Eitle Patent- und Rechtsanwälte PartmbB Arabellastraße 30 81925 München / DE | [2015/22] | Application number, filing date | 13819989.8 | 17.07.2013 | [2020/11] | WO2013JP69961 | Priority number, date | JP20120161913 | 20.07.2012 Original published format: JP 2012161913 | [2015/22] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2014014125 | Date: | 23.01.2014 | Language: | EN | [2014/04] | Type: | A1 Application with search report | No.: | EP2875521 | Date: | 27.05.2015 | Language: | EN | The application published by WIPO in one of the EPO official languages on 23.01.2014 takes the place of the publication of the European patent application. | [2015/22] | Type: | B1 Patent specification | No.: | EP2875521 | Date: | 11.03.2020 | Language: | EN | [2020/11] | Search report(s) | International search report - published on: | JP | 23.01.2014 | (Supplementary) European search report - dispatched on: | EP | 28.01.2016 | Classification | IPC: | H01L21/3213, // H01L21/311 | [2016/09] | CPC: |
H01L21/02063 (EP,CN,KR,US);
H01L21/30608 (US);
H01L21/31144 (EP,KR,US);
H01L21/32134 (EP,CN,KR,US)
|
Former IPC [2015/22] | H01L21/306, H01L21/308 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2015/22] | Extension states | BA | Not yet paid | ME | Not yet paid | Title | German: | ÄTZVERFAHREN UND VERFAHREN ZUR HERSTELLUNG EINES HALBLEITERSUBSTRATPRODUKTS SOWIE HALBLEITERBAUELEMENT DAMIT | [2015/22] | English: | ETCHING METHOD, AND METHOD OF PRODUCING SEMICONDUCTOR SUBSTRATE PRODUCT AND SEMICONDUCTOR DEVICE USING THE SAME | [2015/22] | French: | PROCÉDÉ DE GRAVURE, PROCÉDÉ DE PRODUCTION D'UN SUBSTRAT SEMI-CONDUCTEUR ET DISPOSITIF À SEMI-CONDUCTEUR L'UTILISANT | [2015/22] | Entry into regional phase | 09.02.2015 | National basic fee paid | 09.02.2015 | Search fee paid | 09.02.2015 | Designation fee(s) paid | 09.02.2015 | Examination fee paid | Examination procedure | 09.02.2015 | Examination requested [2015/22] | 22.08.2016 | Amendment by applicant (claims and/or description) | 25.11.2019 | Communication of intention to grant the patent | 30.01.2020 | Fee for grant paid | 30.01.2020 | Fee for publishing/printing paid | 30.01.2020 | Receipt of the translation of the claim(s) | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 25.11.2019 | Opposition(s) | 14.12.2020 | No opposition filed within time limit [2021/07] | Fees paid | Renewal fee | 28.07.2015 | Renewal fee patent year 03 | 11.07.2016 | Renewal fee patent year 04 | 12.07.2017 | Renewal fee patent year 05 | 11.07.2018 | Renewal fee patent year 06 | 15.07.2019 | Renewal fee patent year 07 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Lapses during opposition Tooltip | HU | 17.07.2013 | AL | 11.03.2020 | AT | 11.03.2020 | CY | 11.03.2020 | CZ | 11.03.2020 | DK | 11.03.2020 | EE | 11.03.2020 | ES | 11.03.2020 | FI | 11.03.2020 | HR | 11.03.2020 | IT | 11.03.2020 | LT | 11.03.2020 | LV | 11.03.2020 | MC | 11.03.2020 | MK | 11.03.2020 | MT | 11.03.2020 | NL | 11.03.2020 | PL | 11.03.2020 | RO | 11.03.2020 | RS | 11.03.2020 | SE | 11.03.2020 | SI | 11.03.2020 | SK | 11.03.2020 | SM | 11.03.2020 | TR | 11.03.2020 | BG | 11.06.2020 | NO | 11.06.2020 | GR | 12.06.2020 | IS | 11.07.2020 | GB | 17.07.2020 | IE | 17.07.2020 | LU | 17.07.2020 | BE | 31.07.2020 | CH | 31.07.2020 | FR | 31.07.2020 | LI | 31.07.2020 | PT | 05.08.2020 | [2022/31] |
Former [2022/30] | HU | 17.07.2013 | |
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CY | 11.03.2020 | ||
CZ | 11.03.2020 | ||
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EE | 11.03.2020 | ||
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GR | 12.06.2020 | ||
IS | 11.07.2020 | ||
GB | 17.07.2020 | ||
IE | 17.07.2020 | ||
LU | 17.07.2020 | ||
BE | 31.07.2020 | ||
CH | 31.07.2020 | ||
FR | 31.07.2020 | ||
LI | 31.07.2020 | ||
PT | 05.08.2020 | ||
Former [2022/27] | HU | 17.07.2013 | |
AT | 11.03.2020 | ||
CY | 11.03.2020 | ||
CZ | 11.03.2020 | ||
DK | 11.03.2020 | ||
EE | 11.03.2020 | ||
ES | 11.03.2020 | ||
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TR | 11.03.2020 | ||
BG | 11.06.2020 | ||
NO | 11.06.2020 | ||
GR | 12.06.2020 | ||
IS | 11.07.2020 | ||
GB | 17.07.2020 | ||
IE | 17.07.2020 | ||
LU | 17.07.2020 | ||
BE | 31.07.2020 | ||
CH | 31.07.2020 | ||
FR | 31.07.2020 | ||
LI | 31.07.2020 | ||
PT | 05.08.2020 | ||
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SM | 11.03.2020 | ||
TR | 11.03.2020 | ||
BG | 11.06.2020 | ||
NO | 11.06.2020 | ||
GR | 12.06.2020 | ||
IS | 11.07.2020 | ||
GB | 17.07.2020 | ||
IE | 17.07.2020 | ||
LU | 17.07.2020 | ||
BE | 31.07.2020 | ||
CH | 31.07.2020 | ||
FR | 31.07.2020 | ||
LI | 31.07.2020 | ||
PT | 05.08.2020 | ||
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CZ | 11.03.2020 | ||
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RO | 11.03.2020 | ||
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SM | 11.03.2020 | ||
BG | 11.06.2020 | ||
NO | 11.06.2020 | ||
GR | 12.06.2020 | ||
IS | 11.07.2020 | ||
GB | 17.07.2020 | ||
IE | 17.07.2020 | ||
LU | 17.07.2020 | ||
BE | 31.07.2020 | ||
CH | 31.07.2020 | ||
FR | 31.07.2020 | ||
LI | 31.07.2020 | ||
PT | 05.08.2020 | ||
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SK | 11.03.2020 | ||
SM | 11.03.2020 | ||
BG | 11.06.2020 | ||
NO | 11.06.2020 | ||
GR | 12.06.2020 | ||
IS | 11.07.2020 | ||
GB | 17.07.2020 | ||
LU | 17.07.2020 | ||
BE | 31.07.2020 | ||
CH | 31.07.2020 | ||
FR | 31.07.2020 | ||
LI | 31.07.2020 | ||
PT | 05.08.2020 | ||
Former [2021/22] | AT | 11.03.2020 | |
CZ | 11.03.2020 | ||
DK | 11.03.2020 | ||
EE | 11.03.2020 | ||
ES | 11.03.2020 | ||
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RS | 11.03.2020 | ||
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SI | 11.03.2020 | ||
SK | 11.03.2020 | ||
SM | 11.03.2020 | ||
BG | 11.06.2020 | ||
NO | 11.06.2020 | ||
GR | 12.06.2020 | ||
IS | 11.07.2020 | ||
GB | 17.07.2020 | ||
LU | 17.07.2020 | ||
CH | 31.07.2020 | ||
LI | 31.07.2020 | ||
PT | 05.08.2020 | ||
Former [2021/20] | AT | 11.03.2020 | |
CZ | 11.03.2020 | ||
DK | 11.03.2020 | ||
EE | 11.03.2020 | ||
ES | 11.03.2020 | ||
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MC | 11.03.2020 | ||
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PL | 11.03.2020 | ||
RO | 11.03.2020 | ||
RS | 11.03.2020 | ||
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SI | 11.03.2020 | ||
SK | 11.03.2020 | ||
SM | 11.03.2020 | ||
BG | 11.06.2020 | ||
NO | 11.06.2020 | ||
GR | 12.06.2020 | ||
IS | 11.07.2020 | ||
LU | 17.07.2020 | ||
CH | 31.07.2020 | ||
LI | 31.07.2020 | ||
PT | 05.08.2020 | ||
Former [2021/13] | AT | 11.03.2020 | |
CZ | 11.03.2020 | ||
DK | 11.03.2020 | ||
EE | 11.03.2020 | ||
ES | 11.03.2020 | ||
FI | 11.03.2020 | ||
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SM | 11.03.2020 | ||
BG | 11.06.2020 | ||
NO | 11.06.2020 | ||
GR | 12.06.2020 | ||
IS | 11.07.2020 | ||
PT | 05.08.2020 | ||
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CZ | 11.03.2020 | ||
DK | 11.03.2020 | ||
EE | 11.03.2020 | ||
ES | 11.03.2020 | ||
FI | 11.03.2020 | ||
HR | 11.03.2020 | ||
IT | 11.03.2020 | ||
LT | 11.03.2020 | ||
LV | 11.03.2020 | ||
NL | 11.03.2020 | ||
PL | 11.03.2020 | ||
RO | 11.03.2020 | ||
RS | 11.03.2020 | ||
SE | 11.03.2020 | ||
SI | 11.03.2020 | ||
SK | 11.03.2020 | ||
SM | 11.03.2020 | ||
BG | 11.06.2020 | ||
NO | 11.06.2020 | ||
GR | 12.06.2020 | ||
IS | 11.07.2020 | ||
PT | 05.08.2020 | ||
Former [2021/09] | AT | 11.03.2020 | |
CZ | 11.03.2020 | ||
DK | 11.03.2020 | ||
EE | 11.03.2020 | ||
ES | 11.03.2020 | ||
FI | 11.03.2020 | ||
HR | 11.03.2020 | ||
IT | 11.03.2020 | ||
LT | 11.03.2020 | ||
LV | 11.03.2020 | ||
NL | 11.03.2020 | ||
RO | 11.03.2020 | ||
RS | 11.03.2020 | ||
SE | 11.03.2020 | ||
SK | 11.03.2020 | ||
SM | 11.03.2020 | ||
BG | 11.06.2020 | ||
NO | 11.06.2020 | ||
GR | 12.06.2020 | ||
IS | 11.07.2020 | ||
PT | 05.08.2020 | ||
Former [2021/08] | CZ | 11.03.2020 | |
DK | 11.03.2020 | ||
EE | 11.03.2020 | ||
ES | 11.03.2020 | ||
FI | 11.03.2020 | ||
HR | 11.03.2020 | ||
LT | 11.03.2020 | ||
LV | 11.03.2020 | ||
NL | 11.03.2020 | ||
RO | 11.03.2020 | ||
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SK | 11.03.2020 | ||
SM | 11.03.2020 | ||
BG | 11.06.2020 | ||
NO | 11.06.2020 | ||
GR | 12.06.2020 | ||
IS | 11.07.2020 | ||
PT | 05.08.2020 | ||
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EE | 11.03.2020 | ||
FI | 11.03.2020 | ||
HR | 11.03.2020 | ||
LT | 11.03.2020 | ||
LV | 11.03.2020 | ||
NL | 11.03.2020 | ||
RO | 11.03.2020 | ||
RS | 11.03.2020 | ||
SE | 11.03.2020 | ||
SK | 11.03.2020 | ||
SM | 11.03.2020 | ||
BG | 11.06.2020 | ||
NO | 11.06.2020 | ||
GR | 12.06.2020 | ||
IS | 11.07.2020 | ||
PT | 05.08.2020 | ||
Former [2020/49] | CZ | 11.03.2020 | |
FI | 11.03.2020 | ||
HR | 11.03.2020 | ||
LT | 11.03.2020 | ||
LV | 11.03.2020 | ||
NL | 11.03.2020 | ||
RO | 11.03.2020 | ||
RS | 11.03.2020 | ||
SE | 11.03.2020 | ||
SK | 11.03.2020 | ||
SM | 11.03.2020 | ||
BG | 11.06.2020 | ||
NO | 11.06.2020 | ||
GR | 12.06.2020 | ||
IS | 11.07.2020 | ||
PT | 05.08.2020 | ||
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HR | 11.03.2020 | ||
LT | 11.03.2020 | ||
LV | 11.03.2020 | ||
NL | 11.03.2020 | ||
RO | 11.03.2020 | ||
RS | 11.03.2020 | ||
SE | 11.03.2020 | ||
SM | 11.03.2020 | ||
BG | 11.06.2020 | ||
NO | 11.06.2020 | ||
GR | 12.06.2020 | ||
IS | 11.07.2020 | ||
PT | 05.08.2020 | ||
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HR | 11.03.2020 | ||
LT | 11.03.2020 | ||
LV | 11.03.2020 | ||
NL | 11.03.2020 | ||
RS | 11.03.2020 | ||
SE | 11.03.2020 | ||
BG | 11.06.2020 | ||
NO | 11.06.2020 | ||
GR | 12.06.2020 | ||
IS | 11.07.2020 | ||
Former [2020/46] | FI | 11.03.2020 | |
HR | 11.03.2020 | ||
LV | 11.03.2020 | ||
NL | 11.03.2020 | ||
RS | 11.03.2020 | ||
SE | 11.03.2020 | ||
BG | 11.06.2020 | ||
NO | 11.06.2020 | ||
GR | 12.06.2020 | ||
IS | 11.07.2020 | ||
Former [2020/45] | FI | 11.03.2020 | |
HR | 11.03.2020 | ||
LV | 11.03.2020 | ||
NL | 11.03.2020 | ||
RS | 11.03.2020 | ||
SE | 11.03.2020 | ||
BG | 11.06.2020 | ||
NO | 11.06.2020 | ||
GR | 12.06.2020 | ||
Former [2020/39] | FI | 11.03.2020 | |
HR | 11.03.2020 | ||
LV | 11.03.2020 | ||
RS | 11.03.2020 | ||
SE | 11.03.2020 | ||
BG | 11.06.2020 | ||
NO | 11.06.2020 | ||
GR | 12.06.2020 | ||
Former [2020/38] | FI | 11.03.2020 | |
HR | 11.03.2020 | ||
LV | 11.03.2020 | ||
RS | 11.03.2020 | ||
SE | 11.03.2020 | ||
NO | 11.06.2020 | ||
GR | 12.06.2020 | ||
Former [2020/37] | FI | 11.03.2020 | |
HR | 11.03.2020 | ||
LV | 11.03.2020 | ||
RS | 11.03.2020 | ||
SE | 11.03.2020 | ||
NO | 11.06.2020 | ||
Former [2020/35] | FI | 11.03.2020 | |
NO | 11.06.2020 | Documents cited: | Search | [I]JPH05121378 (SONY CORP) [I] 1,2,4-12 * abstract ** paragraphs [0015] - [0022]; figure 1 *; | [I]WO2007044446 (ADVANCED TECH MATERIALS [US], et al) [I] 1-12 * paragraphs [0010] , [0034] , [0038] , [0042] , [0046] - [0050] - [0052] - [0063] - [0066] , [0071] - [0077]; figures 1A,1B *; | [I]US2010203731 (KONG BOB [US], et al) [I] 1-12 * paragraphs [0001] , [0009] - [0012]; figures 1,2A-2C * | International search | EP0000083 [ ] (SOLVAY [BE]); | EP0000085 [ ] (EURATOM [LU]); | EP0000087 [ ] (UNILEVER NV [NL], et al); | EP0000092 [ ] (PFIZER [US]); | EP0000095 [ ] (EVIN IND LTD [CA]); | EP0000105 [ ] (REXNORD INC [US]); | EP0000114 [ ] (IBM [US]); | EP0000129 [ ] (SUED CHEMIE AG [DE]); | EP0000137 [ ] (HOECHST AG [DE]); | EP0000145 [ ] (COMP GENERALE ELECTRICITE [FR]); | [A]JPH0364473 (VARIAN ASSOCIATES); | [A]EP0711846 (APPLIED MATERIALS INC [US]); | [A]US5965465 (RATH DAVID L [US], et al); | [A]JP2006093453 (SILTRONIC JAPAN CORP); | [A]WO2006110279 (SACHEM INC [US], et al); | [A]JP2008285508 (MITSUBISHI GAS CHEMICAL CO); | [A]EP2234145 (WAKO PURE CHEM IND LTD [JP]); | [AP]JP2013033942 (FUJIFILM CORP) |