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EP2760137
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EP About this file: EP2760137
| EP2760137 - Sigma-delta modulator with trimmed reference voltage for quantizer [Right-click to bookmark this link] | Status | The application has been refused Status updated on 07.05.2021 Database last updated on 14.11.2024 | |
| Former | Examination is in progress Status updated on 10.08.2018 | Most recent event Tooltip | 07.05.2021 | Refusal of application | published on 09.06.2021 [2021/23] | Applicant(s) | For all designated states NXP USA, Inc. 6501 William Cannon Drive West Austin TX 78735 / US | [N/P] |
| Former [2016/50] | For all designated states NXP USA, Inc. 6501 William Cannon Drive Austin TX 78735 / US | ||
| Former [2014/31] | For all designated states Freescale Semiconductor, Inc. 6501 William Cannon Drive West Austin, TX 78735 / US | Inventor(s) | 01 /
Wang, Peijun 1901 Crossing Place Apt 2304 Austin, TX Texas 78741 / US | 02 /
Jones, Robert S. 9200 Rock Castle Austin, TX Texas 78749 / US | [2014/31] | Representative(s) | Hardingham, Christopher Mark NXP Semiconductors Intellectual Property Group Abbey House 25 Clarendon Road Redhill, Surrey RH1 1QZ / GB | [N/P] |
| Former [2014/31] | Optimus Patents Ltd Grove House, Lutyens Close Chineham Court Basingstoke Hampshire RG24 8AG / GB | Application number, filing date | 14150668.3 | 09.01.2014 | [2014/31] | Priority number, date | US201313748796 | 24.01.2013 Original published format: US201313748796 | [2014/31] | Previously filed application, date | US201313748796 | 24.01.2013 | [2014/31] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP2760137 | Date: | 30.07.2014 | Language: | EN | [2014/31] | Type: | A3 Search report | No.: | EP2760137 | Date: | 11.03.2015 | Language: | EN | [2015/11] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 10.02.2015 | Classification | IPC: | H03M3/00 | [2014/31] | CPC: |
H03M3/386 (EP,US);
H03M1/34 (US);
H03M3/416 (EP,US);
H03M3/438 (EP,US)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2015/43] |
| Former [2014/31] | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR | Extension states | BA | Not yet paid | ME | Not yet paid | Title | German: | Sigma-Delta-Modulator mit angepasster Referenzspannung für den Quantisierer | [2014/31] | English: | Sigma-delta modulator with trimmed reference voltage for quantizer | [2014/31] | French: | Modulateur sigma-delta avec tension de référence ajustée pour la quantificateur | [2014/31] | Examination procedure | 03.09.2015 | Amendment by applicant (claims and/or description) | 11.09.2015 | Examination requested [2015/43] | 20.02.2019 | Despatch of a communication from the examining division (Time limit: M04) | 25.06.2019 | Reply to a communication from the examining division | 07.10.2020 | Cancellation of oral proceeding that was planned for 08.10.2020 | 08.10.2020 | Date of oral proceedings (cancelled) | 25.01.2021 | Despatch of communication that the application is refused, reason: substantive examination [2021/23] | 04.02.2021 | Application refused, date of legal effect [2021/23] | Divisional application(s) | The date of the Examining Division's first communication in respect of the earliest application for which a communication has been issued is 20.02.2019 | Fees paid | Renewal fee | 27.01.2016 | Renewal fee patent year 03 | 31.01.2017 | Renewal fee patent year 04 | 31.01.2018 | Renewal fee patent year 05 | 31.01.2019 | Renewal fee patent year 06 | 31.01.2020 | Renewal fee patent year 07 | Penalty fee | Additional fee for renewal fee | 31.01.2021 | 08 M06 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]JP2008191348 (HITACHI DISPLAYS LTD); | [A]US2008272944 (ZHOU BINLING [US], et al); | [I]US7852253 (BIEN DAVID E [US], et al) | Examination | US5541551 |