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Extract from the Register of European Patents

EP About this file: EP2863213

EP2863213 - Apparatus for amplifying intensity during transmission small angle X-ray scattering measurements [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  02.10.2020
Database last updated on 08.10.2024
FormerThe patent has been granted
Status updated on  25.10.2019
FormerGrant of patent is intended
Status updated on  24.09.2019
FormerExamination is in progress
Status updated on  22.07.2019
FormerGrant of patent is intended
Status updated on  05.04.2019
FormerExamination is in progress
Status updated on  05.02.2018
Most recent event   Tooltip08.07.2022Lapse of the patent in a contracting state
New state(s): MK		published on 10.08.2022  [2022/32]
Applicant(s)For all designated states
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
No. 195, Sec. 4, Chung Hsing Rd. Chutung
Hsinchu / TW
[2015/17]
Inventor(s)01 / Fu, Wei-En
No. 195, Sec. 4, Chung Hsing Road
Chutung
31040 Hsinchu / TW
02 / Wu, Wen-Li
No. 195, Sec. 4, Chung Hsing Road
Chutung
31040 Hsinchu / TW
 [2015/17]
Representative(s)Hoffmann Eitle
Patent- und Rechtsanwälte PartmbB
Arabellastraße 30
81925 München / DE
[2015/17]
Application number, filing date14188777.814.10.2014
[2015/17]
Priority number, dateUS201361891062P15.10.2013         Original published format: US 201361891062 P
US20141424670207.04.2014         Original published format: US201414246702
[2015/17]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP2863213
Date:22.04.2015
Language:EN
[2015/17]
Type: B1 Patent specification 
No.:EP2863213
Date:27.11.2019
Language:EN
[2019/48]
Search report(s)(Supplementary) European search report - dispatched on:EP02.03.2015
ClassificationIPC:G01N23/201
[2015/17]
CPC:
G01N23/201 (EP,US)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2015/48]
Former [2015/17]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
TitleGerman:Vorrichtung zur Verstärkung der Intensität während der Durchführung kleinwinkliger Transmissions-Röntgenstreuungsmessungen[2019/16]
English:Apparatus for amplifying intensity during transmission small angle X-ray scattering measurements[2015/17]
French:Appareil d'amplification d'intensité pendant des mesures de diffusion des rayons X aux petit angles en transmission[2019/16]
Former [2015/17]Vorrichtung zur Verstärkung der Intensität während der Durchführung kleinwinkliger Röntgenstreuungsmessungen
Former [2015/17]Appareil d'amplification d'intensité pendant la transmission des mesures de diffusion de rayons X à petit angle
Examination procedure20.10.2015Examination requested  [2015/48]
21.10.2015Amendment by applicant (claims and/or description)
16.03.2016Despatch of a communication from the examining division (Time limit: M06)
13.09.2016Reply to a communication from the examining division
25.01.2018Despatch of a communication from the examining division (Time limit: M04)
11.05.2018Reply to a communication from the examining division
06.06.2018Despatch of a communication from the examining division (Time limit: M04)
25.09.2018Reply to a communication from the examining division
05.04.2019Communication of intention to grant the patent
16.07.2019Disapproval of the communication of intention to grant the patent by the applicant or resumption of examination proceedings by the EPO
16.07.2019Fee for grant paid
16.07.2019Fee for publishing/printing paid
25.09.2019Communication of intention to grant the patent
14.10.2019Receipt of the translation of the claim(s)
Opposition(s)28.08.2020No opposition filed within time limit [2020/45]
Fees paidRenewal fee
27.10.2016Renewal fee patent year 03
24.10.2017Renewal fee patent year 04
26.10.2018Renewal fee patent year 05
16.10.2019Renewal fee patent year 06
Opt-out from the exclusive  Tooltip
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Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipHU14.10.2014
AL27.11.2019
AT27.11.2019
CY27.11.2019
CZ27.11.2019
DK27.11.2019
EE27.11.2019
ES27.11.2019
FI27.11.2019
HR27.11.2019
IT27.11.2019
LT27.11.2019
LV27.11.2019
MC27.11.2019
MK27.11.2019
MT27.11.2019
PL27.11.2019
RO27.11.2019
RS27.11.2019
SE27.11.2019
SI27.11.2019
SK27.11.2019
SM27.11.2019
TR27.11.2019
BG27.02.2020
NO27.02.2020
GR28.02.2020
IS27.03.2020
PT19.04.2020
[2022/32]
Former [2022/27]HU14.10.2014
AL27.11.2019
AT27.11.2019
CY27.11.2019
CZ27.11.2019
DK27.11.2019
EE27.11.2019
ES27.11.2019
FI27.11.2019
HR27.11.2019
IT27.11.2019
LT27.11.2019
LV27.11.2019
MC27.11.2019
MT27.11.2019
PL27.11.2019
RO27.11.2019
RS27.11.2019
SE27.11.2019
SI27.11.2019
SK27.11.2019
SM27.11.2019
TR27.11.2019
BG27.02.2020
NO27.02.2020
GR28.02.2020
IS27.03.2020
PT19.04.2020
Former [2021/31]AL27.11.2019
AT27.11.2019
CZ27.11.2019
DK27.11.2019
EE27.11.2019
ES27.11.2019
FI27.11.2019
HR27.11.2019
IT27.11.2019
LT27.11.2019
LV27.11.2019
MC27.11.2019
PL27.11.2019
RO27.11.2019
RS27.11.2019
SE27.11.2019
SI27.11.2019
SK27.11.2019
SM27.11.2019
BG27.02.2020
NO27.02.2020
GR28.02.2020
IS27.03.2020
PT19.04.2020
Former [2021/10]AL27.11.2019
AT27.11.2019
CZ27.11.2019
DK27.11.2019
EE27.11.2019
ES27.11.2019
FI27.11.2019
HR27.11.2019
IT27.11.2019
LT27.11.2019
LV27.11.2019
PL27.11.2019
RO27.11.2019
RS27.11.2019
SE27.11.2019
SI27.11.2019
SK27.11.2019
SM27.11.2019
BG27.02.2020
NO27.02.2020
GR28.02.2020
IS27.03.2020
PT19.04.2020
Former [2020/51]AL27.11.2019
AT27.11.2019
CZ27.11.2019
DK27.11.2019
EE27.11.2019
ES27.11.2019
FI27.11.2019
HR27.11.2019
LT27.11.2019
LV27.11.2019
PL27.11.2019
RO27.11.2019
RS27.11.2019
SE27.11.2019
SI27.11.2019
SK27.11.2019
SM27.11.2019
BG27.02.2020
NO27.02.2020
GR28.02.2020
IS27.03.2020
PT19.04.2020
Former [2020/37]AL27.11.2019
CZ27.11.2019
DK27.11.2019
EE27.11.2019
ES27.11.2019
FI27.11.2019
HR27.11.2019
LT27.11.2019
LV27.11.2019
RO27.11.2019
RS27.11.2019
SE27.11.2019
SK27.11.2019
SM27.11.2019
BG27.02.2020
NO27.02.2020
GR28.02.2020
IS27.03.2020
PT19.04.2020
Former [2020/36]AL27.11.2019
CZ27.11.2019
DK27.11.2019
EE27.11.2019
ES27.11.2019
FI27.11.2019
HR27.11.2019
LT27.11.2019
LV27.11.2019
RO27.11.2019
RS27.11.2019
SE27.11.2019
BG27.02.2020
NO27.02.2020
GR28.02.2020
IS27.03.2020
PT19.04.2020
Former [2020/35]AL27.11.2019
CZ27.11.2019
ES27.11.2019
FI27.11.2019
HR27.11.2019
LT27.11.2019
LV27.11.2019
RO27.11.2019
RS27.11.2019
SE27.11.2019
BG27.02.2020
NO27.02.2020
GR28.02.2020
IS27.03.2020
Former [2020/32]AL27.11.2019
ES27.11.2019
FI27.11.2019
HR27.11.2019
LT27.11.2019
LV27.11.2019
RS27.11.2019
SE27.11.2019
BG27.02.2020
NO27.02.2020
GR28.02.2020
IS27.03.2020
Former [2020/26]ES27.11.2019
FI27.11.2019
HR27.11.2019
LT27.11.2019
LV27.11.2019
RS27.11.2019
SE27.11.2019
BG27.02.2020
NO27.02.2020
GR28.02.2020
IS27.03.2020
Former [2020/24]ES27.11.2019
FI27.11.2019
LT27.11.2019
LV27.11.2019
SE27.11.2019
BG27.02.2020
NO27.02.2020
GR28.02.2020
IS27.03.2020
Former [2020/23]ES27.11.2019
FI27.11.2019
LT27.11.2019
LV27.11.2019
SE27.11.2019
BG27.02.2020
NO27.02.2020
GR28.02.2020
Former [2020/22]FI27.11.2019
LT27.11.2019
SE27.11.2019
BG27.02.2020
NO27.02.2020
Former [2020/21]NO27.02.2020
Documents cited:Search[A]WO9833062  (QUANTA VISION INC [US]) [A] 1-12 * page 12, line 20 - page 13, line 23; figure 1 *;
 [I]WO2011096584  (FUJIFILM CORP [JP], et al) [I] 1-12 * page 13, line 23 - page 16, line 26 * * page 18, lines 28-31 * * page 27, line 15 - page 28, line 2 * * page 53, lines 3-6 * * figures 1, 4, 11C, 31 *;
 [A]  - WANG C ET AL, "Small angle X-ray scattering measurements of spatial dependent linewidth in dense nanoline gratings", THIN SOLID FILMS, ELSEVIER-SEQUOIA S.A. LAUSANNE, CH, vol. 517, no. 20, doi:10.1016/J.TSF.2009.03.040, ISSN 0040-6090, (20090831), pages 5844 - 5847, (20090316), XP027077206 [A] 1-12 * the whole document *

DOI:   http://dx.doi.org/10.1016/j.tsf.2009.03.040
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