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Extract from the Register of European Patents

EP About this file: EP2946197

EP2946197 - IN-SITU SPECTROSCOPY FOR MONITORING FABRICATION OF INTEGRATED COMPUTATIONAL ELEMENTS [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  17.11.2017
Database last updated on 14.09.2024
FormerRequest for examination was made
Status updated on  30.07.2017
Most recent event   Tooltip17.11.2017Application deemed to be withdrawnpublished on 20.12.2017  [2017/51]
Applicant(s)For all designated states
Halliburton Energy Services, Inc.
10200 Bellaire Boulevard
Houston, TX 77072 / US
[2015/48]
Inventor(s)01 / PRICE, James M.
5 Gambrel Oak Lane
The Woodlands, Texas 77380 / US
02 / NAYAK, Aditya B.
4855 Magnolia Cove Drive
Apt. 110
Humble, Texas 77345 / US
03 / PERKINS, David L.
27 Bark Bend Place
The Woodlands, Texas 77385 / US
 [2015/48]
Representative(s)Jennings, Michael John, et al
AA Thornton IP LLP
8th Floor, 125 Old Broad Street
London EC2N 1AR / GB
[N/P]
Former [2015/48]Jennings, Michael John, et al
A.A. Thornton & Co.
10 Old Bailey
London EC4M 7NG / GB
Application number, filing date14824758.814.02.2014
[2015/48]
WO2014US16603
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2015122923
Date:20.08.2015
Language:EN
[2015/33]
Type: A1 Application with search report 
No.:EP2946197
Date:25.11.2015
Language:EN
The application published by WIPO in one of the EPO official languages on 20.08.2015 takes the place of the publication of the European patent application.
[2015/48]
Search report(s)International search report - published on:KR20.08.2015
(Supplementary) European search report - dispatched on:EP18.11.2016
ClassificationIPC:G01N21/41, G01B11/06, E21B49/00, B29D11/00, G01N21/84, G02B5/28, G01J3/28, G05B19/4099, G01N21/31
[2016/50]
CPC:
G01J3/28 (EP,US); G05B19/4099 (US); B29D11/0073 (EP,US);
B32B3/266 (EP,US); G01J3/0264 (EP,US); G01J3/0286 (EP,US);
G01J3/08 (EP,US); G01J3/12 (EP,US); G01J3/45 (EP,US);
G01N21/31 (EP,US); G01N21/8422 (EP,US); G02B5/285 (EP,US);
G02B5/287 (EP,US); B32B2307/40 (EP,US); B32B2307/418 (EP,US);
B32B2307/732 (EP,US); B32B2551/00 (EP,US); G01J2003/1226 (EP,US);
G01N2021/8438 (EP,US); G05B2219/49023 (US) (-)
Former IPC [2015/48]G01N21/41, G01B11/06, E21B49/00
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2015/48]
TitleGerman:IN-SITU-SPEKTROSKOPIE ZUR ÜBERWACHUNG DER HERSTELLUNG VON INTEGRIERTEN RECHENELEMENTEN[2015/48]
English:IN-SITU SPECTROSCOPY FOR MONITORING FABRICATION OF INTEGRATED COMPUTATIONAL ELEMENTS[2015/48]
French:SPECTROSCOPIE IN-SITU DE SURVEILLANCE DE LA FABRICATION D'ÉLÉMENTS DE CALCUL INTÉGRÉS[2015/48]
Entry into regional phase20.01.2015National basic fee paid 
20.01.2015Search fee paid 
20.01.2015Designation fee(s) paid 
20.01.2015Examination fee paid 
Examination procedure20.01.2015Examination requested  [2015/48]
17.03.2016Amendment by applicant (claims and/or description)
17.06.2017Application deemed to be withdrawn, date of legal effect  [2017/51]
31.07.2017Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2017/51]
Fees paidRenewal fee
08.02.2016Renewal fee patent year 03
Penalty fee
Additional fee for renewal fee
28.02.201704   M06   Not yet paid
Opt-out from the exclusive  Tooltip
competence of the Unified
Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[Y]US5657124  (ZHANG JINGWEI [FR], et al) [Y] 11-15,18 * abstract *;
 [Y]US6215556  (ZHANG JINGWEI [FR], et al) [Y] 5,11-15,18 * figures 1, 6, 8, 11; claim 1 *;
 [Y]JP2001110806  (MATSUSHITA ELECTRIC IND CO LTD) [Y] 2-16,18-20 * abstract *;
 [A]US6395563  (ERIGUCHI KOJI [JP]) [A] 1-20 * column 4, line 21 - line 25; figures 1, 2 * * column 9, line 8 - line 14 *;
 [A]US2007070357  (AIYER ARUN A [US]) [A] 1-20 * abstract *;
 [Y]US2010291714  (HESSE RAIK [DE], et al) [Y] 3,8-10,19,20 * paragraph [0013] - paragraph [0018] * * paragraph [0080]; figure 1 *;
 [A]US2012140235  (LEE CHENG-CHUNG [US], et al) [A] 1-20* page 2, column 1, line 25 - line 36; figures 1, 2 *;
 [XY]US2013284895  (FREESE ROBERT [US], et al) [X] 1,17 * paragraph [0037] - paragraph [0039]; figure 1 * [Y] 2-16,18-20;
 [XY]  - SOYEMI O ET AL, "DESIGN AND TESTING OF A MULTIVARIATE OPTICAL ELEMENT: THE FIRST DEMONSTRATION OF MULTIVARIATE OPTICAL COMPUTING FOR PREDICTIVE SPECTROSOCPY", ANALYTICAL CHEMISTRY, AMERICAN CHEMICAL SOCIETY, US, (20010315), vol. 73, no. 6, doi:10.1021/AC0012896, ISSN 0003-2700, pages 1069 - 1079, XP001063566 [X] 1,17 * page 1071, column 1, paragraph 1 - column 2, paragraph 2 * * abstract * [Y] 2-16,18-20

DOI:   http://dx.doi.org/10.1021/ac0012896
 [XY]  - HAIBACH F G ET AL, "ON-LINE REOPTIMIZATION OF FILTER DESIGNS FOR MULTIVARIATE OPTICAL ELEMENTS", APPLIED OPTICS, OPTICAL SOCIETY OF AMERICA, WASHINGTON, DC; US, (20030401), vol. 42, no. 10, doi:10.1364/AO.42.001833, ISSN 0003-6935, pages 1833 - 1838, XP001152469 [X] 1,17 * page 1835, column 1, paragraph 1 - paragraph 4 * [Y] 2-16,18-20

DOI:   http://dx.doi.org/10.1364/AO.42.001833
 [Y]  - KALIMANOVA I ET AL, "Ellipsometry and thin films parameters measurement", ELECTRONICS TECHNOLOGY: MEETING THE CHALLENGES OF ELECTRONICS TECHNOLO GY PROGRESS, 2005. 28TH INTERNATIONAL SPRING SEMINAR ON WIENER NEUSTADT, AUSTRIA MAY 19-20, 2005, PISCATAWAY, NJ, USA,IEEE, (20050519), doi:10.1109/ISSE.2005.1491074, ISBN 978-0-7803-9325-7, pages 472 - 475, XP010824549 [Y] 2-4,6,7,16 * page 473, column 1, paragraph 2 - page 475, column 1, paragraph 5 *

DOI:   http://dx.doi.org/10.1109/ISSE.2005.1491074
International search[A]US7138156  (MYRICK MICHAEL L [US], et al) [A] 1-49 * See abstract, column 9, line 51- column 10, line 41, claims 20-23 and figures 5-10. *;
 [A]US2010245096  (JONES CHRISTOPHER M [US], et al) [A] 1-49 * See abstract, paragraphs [0112]-[0117] and figures 1-5. *;
 [A]US2013032338  (KALIA NITIKA [US], et al) [A] 1-49* See abstract, paragraphs [0040]-[0044], claims 1, 13 and figures 1, 2. *;
 [A]US2013284894  (FREESE ROBERT [US], et al) [A] 1-49 * See abstract, paragraphs [0038]-[0052], [0068]-[0077], claims 1, 8 and figures 1-9B. *;
 [A]US2013284900  (FREESE ROBERT [US], et al) [A] 1-49 * See abstract, paragraphs [0036]-[0042], [0087]-[0093] and figures 1-10. *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.