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Extract from the Register of European Patents

EP About this file: EP3203510

EP3203510 - SEMICONDUCTOR PACKAGE MANUFACTURING METHOD AND SEMICONDUCTOR PACKAGE [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  10.05.2021
Database last updated on 18.11.2024
FormerExamination is in progress
Status updated on  05.03.2021
FormerRequest for examination was made
Status updated on  07.07.2017
Most recent event   Tooltip10.05.2021Withdrawal of applicationpublished on 09.06.2021  [2021/23]
Applicant(s)For all designated states
Shindengen Electric Manufacturing Co., Ltd.
2-1 Ohtemachi 2-chome Chiyoda-ku
Tokyo 100-0004 / JP
[2017/32]
Inventor(s)01 / MIZAWA, Yuichi
c/o SHINDENGEN ELECTRIC
MANUFACTURING CO. LTD.
Factory
10-13 Minami-cho
Hanno-shi Saitama 357-8585 / JP
02 / NAGASE, Takeo
c/o Higashine Shindengen Co. Ltd.
5600-1 Ooaza Higashine Kou
Higashine-shi Yamagata 999-3701 / JP
 [2017/32]
Representative(s)Dr. Weitzel & Partner
Patent- und Rechtsanwälte mbB
Friedenstrasse 10
89522 Heidenheim / DE
[2017/32]
Application number, filing date14863035.329.09.2014
[2017/32]
WO2014JP75819
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2016051449
Date:07.04.2016
Language:JA
[2016/14]
Type: A1 Application with search report 
No.:EP3203510
Date:09.08.2017
Language:EN
[2017/32]
Search report(s)International search report - published on:JP07.04.2016
(Supplementary) European search report - dispatched on:EP10.04.2018
ClassificationIPC:H01L23/29, H01L23/31, H01L23/48
[2017/32]
CPC:
H01L23/49513 (EP,US); H01L21/56 (EP,US); H01L23/29 (US);
H01L23/293 (US); H01L23/31 (US); H01L23/3107 (EP,US);
H01L23/3142 (EP,US); H01L23/4952 (EP,US); H01L23/49524 (EP,US);
H01L23/49541 (US); H01L23/49562 (EP,US); H01L24/32 (EP,US);
H01L24/34 (US); H01L24/48 (EP,US); H01L24/73 (EP,US);
H01L24/83 (EP,US); H01L24/85 (EP,US); H01L24/92 (EP,US);
H01L2224/05553 (EP,US); H01L2224/05624 (EP,US); H01L2224/0603 (EP,US);
H01L2224/29101 (EP,US); H01L2224/29139 (US); H01L2224/29339 (EP,US);
H01L2224/32245 (EP,US); H01L2224/40095 (EP,US); H01L2224/45124 (EP,US);
H01L2224/48091 (EP,US); H01L2224/48106 (US); H01L2224/48245 (US);
H01L2224/48247 (EP,US); H01L2224/48472 (EP,US); H01L2224/4903 (EP,US);
H01L2224/49171 (EP,US); H01L2224/73263 (EP,US); H01L2224/73265 (EP,US);
H01L2224/8302 (US); H01L2224/83048 (US); H01L2224/83815 (EP,US);
H01L2224/8385 (EP,US); H01L2224/8392 (EP,US); H01L2224/83948 (EP,US);
H01L2224/8485 (EP,US); H01L2224/8592 (EP,US); H01L2224/92247 (EP,US);
H01L23/562 (EP,US); H01L24/06 (EP,US); H01L24/29 (EP,US);
H01L24/40 (EP,US); H01L24/45 (EP,US); H01L24/49 (EP,US);
H01L2924/00014 (EP,US); H01L2924/01028 (US); H01L2924/1305 (EP,US);
H01L2924/13055 (US); H01L2924/181 (EP,US); H01L2924/20102 (US);
H01L2924/20103 (US); H01L2924/20104 (US); H01L2924/20105 (US) (-)
C-Set:
H01L2224/05624, H01L2924/00014 (US,EP);
H01L2224/29101, H01L2924/014, H01L2924/00014 (EP,US);
H01L2224/29339, H01L2924/00014 (EP,US);
H01L2224/45124, H01L2924/00014 (US,EP);
H01L2224/48091, H01L2924/00014 (US,EP);
H01L2224/48472, H01L2224/48247, H01L2924/00 (US,EP);
H01L2224/73265, H01L2224/32245, H01L2224/48247, H01L2924/00 (US);
H01L2224/73265, H01L2224/32245, H01L2224/48247, H01L2924/00012 (US,EP);
H01L2224/83815, H01L2924/00014 (EP,US);
H01L2224/92247, H01L2224/73265, H01L2224/32245, H01L2224/48247, H01L2924/00012 (US,EP);
H01L2924/00014, H01L2224/37099 (US,EP);
H01L2924/00014, H01L2224/45015, H01L2924/207 (US,EP);
H01L2924/00014, H01L2224/73221 (EP);
H01L2924/181, H01L2924/00012 (US,EP)
(-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2017/32]
TitleGerman:HALBLEITERGEHÄUSEHERSTELLUNGSVERFAHREN UND HALBLEITERGEHÄUSE[2017/32]
English:SEMICONDUCTOR PACKAGE MANUFACTURING METHOD AND SEMICONDUCTOR PACKAGE[2017/32]
French:PROCÉDÉ DE FABRICATION DE BOÎTIER DE SEMI-CONDUCTEUR ET BOÎTIER DE SEMI-CONDUCTEUR[2017/32]
Entry into regional phase22.05.2015Translation filed 
22.05.2015National basic fee paid 
22.05.2015Search fee paid 
22.05.2015Designation fee(s) paid 
22.05.2015Examination fee paid 
Examination procedure22.05.2015Examination requested  [2017/32]
22.05.2015Date on which the examining division has become responsible
24.08.2018Amendment by applicant (claims and/or description)
04.03.2021Despatch of a communication from the examining division (Time limit: M04)
30.04.2021Application withdrawn by applicant  [2021/23]
Fees paidRenewal fee
29.09.2016Renewal fee patent year 03
25.09.2017Renewal fee patent year 04
25.09.2018Renewal fee patent year 05
17.09.2019Renewal fee patent year 06
29.09.2020Renewal fee patent year 07
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Documents cited:Search[A]JPH1154747  (TOSHIBA CORP);
 [Y]JP2005142258  (DENSO CORP);
 [A]JP2005203548  (HONDA MOTOR CO LTD);
 [Y]EP2472584  (RENESAS ELECTRONICS CORP [JP])
International search[A]JPH11297730  (DENSO CORP) [A] 1-11* , paragraphs [0031] to [0036]; fig. 7 (Family: none) *;
 [A]JP2001118885  (MATSUSHITA ELECTRIC IND CO LTD) [A] 1-11 * , paragraphs [0034] to [0035], [0045], [0053] to [0056]; fig. 1, 3 (Family: none) *;
 [A]JP2006319109  (MATSUSHITA ELECTRIC IND CO LTD) [A] 1-11 * , paragraphs [0014] to [0017]; fig. 1 (Family: none) *;
 [A]JP2012023233  (MITSUBISHI ELECTRIC CORP) [A] 1-11 * , paragraphs [0011] to [0022]; fig. 1 to 3 (Family: none) *
ExaminationJP2005226096
 JP2005340474
by applicantJP2005072306
 JP2005226096
 JP2005340474
 JP2011082389
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.