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EP2908118
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EP About this file: EP2908118
| EP2908118 - Analysis apparatus and electronic device [Right-click to bookmark this link] | Status | The application has been withdrawn Status updated on 08.03.2019 Database last updated on 06.11.2024 | Most recent event Tooltip | 08.03.2019 | Withdrawal of application | published on 10.04.2019 [2019/15] | Applicant(s) | For all designated states Seiko Epson Corporation 4-1, Nishishinjuku 2-chome, Shinjuku-ku Tokyo 163-0811 / JP | [2015/34] | Inventor(s) | 01 /
Sugimoto, Mamoru c/o SEIKO EPSON CORPORATION 3-5, Owa 3-chome Suwa-shi Nagano 392-8502 / JP | 02 /
Enari, Megumi c/o SEIKO EPSON CORPORATION 3-5, Owa 3-chome Suwa-shi Nagano 392-8502 / JP | [2015/34] | Representative(s) | Hoffmann Eitle Patent- und Rechtsanwälte PartmbB Arabellastraße 30 81925 München / DE | [2015/34] | Application number, filing date | 15155031.6 | 13.02.2015 | [2015/34] | Priority number, date | JP20140027823 | 17.02.2014 Original published format: JP 2014027823 | [2015/34] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP2908118 | Date: | 19.08.2015 | Language: | EN | [2015/34] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 13.07.2015 | Classification | IPC: | G01N21/552, G01N21/65 | [2015/34] | CPC: |
G01N21/554 (EP,US);
G01N21/553 (US);
G01N21/41 (US);
G01N21/658 (EP,US)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2016/09] |
| Former [2015/34] | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR | Extension states | BA | Not yet paid | ME | Not yet paid | Title | German: | Analysevorrichtung und elektronische Vorrichtung | [2015/34] | English: | Analysis apparatus and electronic device | [2015/34] | French: | Appareil d'analyse et dispositif électronique | [2015/34] | Examination procedure | 08.01.2016 | Amendment by applicant (claims and/or description) | 18.01.2016 | Examination requested [2016/09] | 01.03.2019 | Application withdrawn by applicant [2019/15] | Fees paid | Renewal fee | 06.02.2017 | Renewal fee patent year 03 | 08.02.2018 | Renewal fee patent year 04 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]WO2005121754 (CONSEJO SUPERIOR INVESTIGACION [ES], et al) [A] 1-6* page 1 - page 3 *; | [A]US2006194344 (SAITO TAKAO [JP]) [A] 1-6 * paragraph [0021] - paragraph [0026] *; | [Y]US2009002701 (FATTAL DAVID A [US], et al) [Y] 3-6 * abstract * * paragraph [0019] - paragraph [0030] *; | [A]US2011164252 (HANDA YOICHIRO [JP], et al) [A] 1-6 * paragraph [0034] - paragraph [0088] *; | [A]US2012105853 (PANG LIN [US], et al) [A] 1-6 * paragraph [0003] - paragraph [0057] *; | [Y]WO2013168401 (SEIKO EPSON CORP [JP]) [Y] 1-6 * abstract * * paragraph [0014] - paragraph [0029] * * paragraph [0034] * * paragraph [0041] - paragraph [0044] *; | [Y] - YIZHUO CHU ET AL, "Double resonance surface enhanced Raman scattering substrates: an intuitive coupled oscillator model", OPT. EXPRESS, (20110719), vol. 19, no. 16, pages 14919 - 14928, XP055127289 [Y] 1-6 * the whole document * DOI: http://dx.doi.org/10.1364/OE.19.014919 | by applicant | JP2007538264 | JP2009115492 | - OPTICS LETTERS, (20090201), vol. 34, no. 3 |