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Extract from the Register of European Patents

EP About this file: EP2975431

EP2975431 - METHOD AND APPARATUS FOR PROCESSING SIGNALS OF SEMICONDUCTOR DETECTOR [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  30.09.2022
Database last updated on 16.09.2024
FormerExamination is in progress
Status updated on  02.11.2018
Most recent event   Tooltip30.09.2022Application deemed to be withdrawnpublished on 02.11.2022  [2022/44]
Applicant(s)For all designated states
Tsinghua University
Tsinghua Park
Haidian District
Beijing 100084 / CN
For all designated states
Nuctech Company Limited
2nd Floor, Block A
TongFang Building
Shuangqinglu
Haidian District
Beijing 100084 / CN
[N/P]
Former [2016/03]For all designated states
Tsinghua University
Tsinghua Park
Haidian District
Beijing 100084 / CN
For all designated states
Nuctech Company Limited
2nd Fl., Block A
TongFang Building
Shuangqinglu
Haidian District
Beijing 100084 / CN
Inventor(s)01 / Li, Yulan
2nd Floor, Block A
Tongfang Building Shuangqinglu
Haidian District
Beijing 100084 / CN
02 / Li, Yuanjing
2nd Floor, Block A
Tongfang Building Shuangqinglu
Haidian District
Beijing 100084 / CN
03 / Fu, Jianqiang
2nd Floor, Block A
Tongfang Building Shuangqinglu
Haidian District
Beijing 100084 / CN
04 / Zhang, Lan
2nd Floor, Block A
Tongfang Building Shuangqinglu
Haidian District
Beijing 100084 / CN
05 / Du, Yingshuai
2nd Floor, Block A
Tongfang Building Shuangqinglu
Haidian District
100084 Beijing / CN
06 / Zhang, Wei
2nd Floor, Block A
Tongfang Building Shuangqinglu
Haidian District
Beijing 100084 / CN
07 / Ma, Xuming
2nd Floor, Block A
Tongfang Building Shuangqinglu
Haidian District
Beijing 100084 / CN
08 / Li, Jun
2nd Floor, Block A
Tongfang Building Shuangqinglu
Haidian District
Beijing 100084 / CN
 [2016/09]
Former [2016/03]01 / Li, Yulan
2nd Floor, Block A
Tongfang Building Shuangqinglu
Haidian District
Beijing 100084 / CN
02 / Li, Yuangjing
2nd Floor, Block A
Tongfang Building Shuangqinglu
Haidian District
Beijing 100084 / CN
03 / Fu, Jianqiang
2nd Floor, Block A
Tongfang Building Shuangqinglu
Haidian District
Beijing 100084 / CN
04 / Zhang, Lan
2nd Floor, Block A
Tongfang Building Shuangqinglu
Haidian District
Beijing 100084 / CN
05 / Du, Yigshuai
2nd Floor, Block A
Tongfang Building Shuangqinglu
Haidian District
100084 Beijing / CN
06 / Zhang, Wei
2nd Floor, Block A
Tongfang Building Shuangqinglu
Haidian District
Beijing 100084 / CN
07 / Ma, Xuming
2nd Floor, Block A
Tongfang Building Shuangqinglu
Haidian District
Beijing 100084 / CN
08 / Li, Jun
2nd Floor, Block A
Tongfang Building Shuangqinglu
Haidian District
Beijing 100084 / CN
Representative(s)Dilg, Haeusler, Schindelmann Patentanwaltsgesellschaft mbH
Leonrodstraße 58
80636 München / DE
[N/P]
Former [2016/03]Gulde & Partner
Patent- und Rechtsanwaltskanzlei mbB
Wallstraße 58/59
10179 Berlin / DE
Application number, filing date15176890.015.07.2015
[2016/03]
Priority number, dateCN20141033625615.07.2014         Original published format: CN201410336256
[2016/03]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP2975431
Date:20.01.2016
Language:EN
[2016/03]
Type: A3 Search report 
No.:EP2975431
Date:20.04.2016
Language:EN
[2016/16]
Search report(s)(Supplementary) European search report - dispatched on:EP17.03.2016
ClassificationIPC:G01T1/24
[2016/03]
CPC:
G01T1/247 (EP,US); G01T1/241 (US); H04N5/32 (US)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2016/48]
Former [2016/03]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
Extension statesBANot yet paid
MENot yet paid
Validation statesMANot yet paid
TitleGerman:VERFAHREN UND VORRICHTUNG ZUR VERARBEITUNG VON SIGNALEN EINES HALBLEITERDETEKTORS[2016/03]
English:METHOD AND APPARATUS FOR PROCESSING SIGNALS OF SEMICONDUCTOR DETECTOR[2016/03]
French:PROCÉDÉ ET APPAREIL DE TRAITEMENT DE SIGNAUX DE DÉTECTEUR À SEMI-CONDUCTEURS[2016/03]
Examination procedure20.10.2016Amendment by applicant (claims and/or description)
20.10.2016Examination requested  [2016/48]
06.11.2018Despatch of a communication from the examining division (Time limit: M04)
28.02.2019Reply to a communication from the examining division
11.11.2019Despatch of a communication from the examining division (Time limit: M04)
15.04.2020Reply to a communication from the examining division
19.10.2020Despatch of a communication from the examining division (Time limit: M04)
24.02.2021Reply to a communication from the examining division
04.06.2022Application deemed to be withdrawn, date of legal effect  [2022/44]
28.06.2022Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time  [2022/44]
Fees paidRenewal fee
24.07.2017Renewal fee patent year 03
23.07.2018Renewal fee patent year 04
15.07.2019Renewal fee patent year 05
14.07.2020Renewal fee patent year 06
15.07.2021Renewal fee patent year 07
15.06.2022Renewal fee patent year 08
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Documents cited:Search[XY]WO2006039494  (UNIV STANFORD [US], et al) [X] 1,3,6,7,9,12 * figures 3, 4, 6, 8 * * page 22, line 9 - page 23, line 2 * * page 19, line 11 - line 23 * * page 15, line 27 - page 16, line 7 * [Y] 2,5,8,11;
 [XY]US2009026371  (BOLOTNIKOV ALEKSEY E [US], et al) [X] 3,4,9,10 * figures 8, 9, 10 * * paragraph [0053] * [Y] 2,8;
 [Y]  - KUVVETLI I ET AL, "A 3D CZT high resolution detector for x- and gamma-ray astronomy", OPTOMECHATRONIC MICRO/NANO DEVICES AND COMPONENTS III : 8 - 10 OCTOBER 2007, LAUSANNE, SWITZERLAND; [PROCEEDINGS OF SPIE , ISSN 0277-786X], SPIE, BELLINGHAM, WASH, (20130724), vol. 9154, doi:10.1117/12.2055119, ISBN 978-1-62841-730-2, pages 91540X - 91540X, XP060038579 [Y] 5,11 * abstract * * page 2, paragraphs 1-2 * * page 4, paragraph 2 *

DOI:   http://dx.doi.org/10.1117/12.2055119
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.