-
EP3189494
European procedure
- EP About this file
- EP Legal status
- EP Federated register
- EP Event history
- EP Citations
- EP Patent family
- EP All documents
Extract from the Register of European Patents
EP About this file: EP3189494
| EP3189494 - DEPTH MAP ENHANCEMENT [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 07.09.2018 Database last updated on 02.09.2024 | |
| Former | Examination is in progress Status updated on 28.12.2017 | ||
| Former | Request for examination was made Status updated on 15.06.2017 | ||
| Former | The international publication has been made Status updated on 11.02.2017 | Most recent event Tooltip | 07.09.2018 | Application deemed to be withdrawn | published on 10.10.2018 [2018/41] | Applicant(s) | For all designated states Microsoft Technology Licensing, LLC One Microsoft Way Redmond, WA 98052-6399 / US | [2017/28] | Inventor(s) | 01 /
KANG, Sing Bing Microsoft Technology Licensing LLC One Microsoft Way Redmond, Washington 98052-6399 / US | 02 /
KIRK, Adam Microsoft Technology Licensing LLC One Microsoft Way Redmond, Washington 98052-6399 / US | 03 /
KUSHAL, Avanish Microsoft Technology Licensing LLC One Microsoft Way Redmond, Washington 98052-6399 / US | [2017/28] | Representative(s) | CMS Cameron McKenna Nabarro Olswang LLP Cannon Place 78 Cannon Street London EC4N 6AF / GB | [N/P] |
| Former [2017/28] | Holtby, Christopher Lawrence, et al Olswang Germany LLP Rosental 4 80331 München / DE | Application number, filing date | 15770683.9 | 03.09.2015 | [2017/28] | WO2015US48221 | Priority number, date | US201414479150 | 05.09.2014 Original published format: US201414479150 | [2017/28] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2016036898 | Date: | 10.03.2016 | Language: | EN | [2016/10] | Type: | A1 Application with search report | No.: | EP3189494 | Date: | 12.07.2017 | Language: | EN | The application published by WIPO in one of the EPO official languages on 10.03.2016 takes the place of the publication of the European patent application. | [2017/28] | Search report(s) | International search report - published on: | EP | 10.03.2016 | Classification | IPC: | G06T3/40 | [2017/28] | CPC: |
G06T3/4069 (EP,CN,KR,US);
H04N13/271 (KR,US);
G06T7/571 (KR);
G06T7/579 (EP,US);
H04N13/221 (EP,CN,KR,US);
H04N13/257 (EP,KR,US);
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2017/28] | Title | German: | TIEFENKARTENERWEITERUNG | [2017/28] | English: | DEPTH MAP ENHANCEMENT | [2017/28] | French: | AMÉLIORATION DE CARTE DE PROFONDEUR | [2017/28] | Entry into regional phase | 10.02.2017 | National basic fee paid | 10.02.2017 | Designation fee(s) paid | 10.02.2017 | Examination fee paid | Examination procedure | 21.03.2016 | Request for preliminary examination filed International Preliminary Examining Authority: EP | 10.02.2017 | Examination requested [2017/28] | 10.02.2017 | Date on which the examining division has become responsible | 12.10.2017 | Amendment by applicant (claims and/or description) | 20.12.2017 | Despatch of a communication from the examining division (Time limit: M04) | 01.05.2018 | Application deemed to be withdrawn, date of legal effect [2018/41] | 04.06.2018 | Despatch of communication that the application is deemed to be withdrawn, reason: reply to the communication from the examining division not received in time [2018/41] | Fees paid | Renewal fee | 12.09.2017 | Renewal fee patent year 03 |
| Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [X] - J. KIM ET AL, "A High Quality Depth Map Upsampling Method Robust to Misalignment of Depth and Color Boundaries", JOURNAL OF SIGNAL PROCESSING SYSTEMS, (201404), vol. 75, no. 1, pages 23 - 37, XP002751092 [X] 1-15 * page 29, column l, paragraph 1 - page 30, column r, paragraph 1; figure 7 * DOI: http://dx.doi.org/10.1007/s11265-013-0783-x | [A] - RAJAGOPALAN A N ET AL, Resolution Enhancement of PMD Range Maps, PATTERN RECOGNITION; LECTURE NOTES IN COMPUTER SCIENCE, SPRINGER BERLIN HEIDELBERG, BERLIN, HEIDELBERG, PAGE(S) 304 - 313, (20080610), XP019090376 [A] 1-15 * page 305, paragraph 2 - page 307, paragraph 3 * | [A] - AL ISMAEIL KASSEM ET AL, Depth Super-Resolution by Enhanced Shift and Add, GRID AND COOPERATIVE COMPUTING, THIRD INTERNATIONAL CONFERENCE ON, WUHAN, CHINA, OCTOBER 21 - 24, 2004. IN: LECTURE NOTES IN COMPUTER SCIENCE , VOL. 3251; SPRINGER VERLAG, (20130827), ISSN 0302-9743, XP047038844 [A] 1-15 * page 101, paragraph 1 - page 102, paragraph 2 * DOI: http://dx.doi.org/10.1007/978-3-642-40246-3_13 | [A] - QINGXIONG YANG ET AL, "Spatial-Depth Super Resolution for Range Images", 2007 IEEE CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, (20070601), pages 1 - 8, XP055103282 [A] 1-15 * page 1, column r, paragraph 2; figure 1 * DOI: http://dx.doi.org/10.1109/CVPR.2007.383211 | [A] - JAESIK PARK ET AL, "High quality depth map upsampling for 3D-TOF cameras", COMPUTER VISION (ICCV), 2011 IEEE INTERNATIONAL CONFERENCE ON, (20111106), pages 1623 - 1630, XP032101376 [A] 1-15 * abstract * DOI: http://dx.doi.org/10.1109/ICCV.2011.6126423 | [A] - DEEPU RAJAN ET AL, "SIMULTANEOUS ESTIMATION OF SUPER-RESOLVED SCENCE AND DEPTH MAP FROM LOW RESOLUTION DEFOCUSED OBSERVATIONS", IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, IEEE COMPUTER SOCIETY, USA, (20030901), vol. 25, no. 9, pages 1102 - 1117, XP001185140 [A] 1-15 * page 1103, column r, paragraph 1 * DOI: http://dx.doi.org/10.1109/TPAMI.2003.1227986 | [A] - TRAVIS A R L, "THE DISPLAY OF THREE-DIMENSIONAL VIDEO IMAGES", PROCEEDINGS OF THE IEEE, NEW YORK, US, (19971101), vol. 85, no. 11, pages 1817 - 1832, XP000755850 [A] 1-15 * the whole document * DOI: http://dx.doi.org/10.1109/5.649659 | Examination | - SCHUON S ET AL, "High-quality scanning using time-of-flight depth superresolution", COMPUTER VISION AND PATTERN RECOGNITION, IEEE COMPUTER SOCIETY CONFERENCE ON, IEEE, PISCATAWAY, NJ, USA, (20080623), pages 1 - 7, XP031285727 |