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Extract from the Register of European Patents

EP About this file: EP3314648

EP3314648 - INTEGRATED CIRCUIT STRUCTURES WITH INTERPOSERS HAVING RECESSES [Right-click to bookmark this link]
StatusThe application has been refused
Status updated on  28.10.2022
Database last updated on 18.09.2024
FormerExamination is in progress
Status updated on  26.03.2021
FormerRequest for examination was made
Status updated on  30.03.2018
FormerThe international publication has been made
Status updated on  30.12.2016
Most recent event   Tooltip28.10.2022Refusal of applicationpublished on 30.11.2022  [2022/48]
Applicant(s)For all designated states
Intel Corporation
2200 Mission College Boulevard
Santa Clara, CA 95054 / US
[2018/18]
Inventor(s)01 / LEE, Kyu-Oh
400 N Coronado 1076
Chandler, Arizona 85224 / US
02 / SALAMA, Islam, A.
9348 N. 109th Place
Scottsdale, Arizona 85259 / US
 [2018/18]
Representative(s)Rummler, Felix
Maucher Jenkins
Seventh Floor Offices
Artillery House
11-19 Artillery Row
London SW1P 1RT / GB
[N/P]
Former [2018/18]Rummler, Felix
Maucher Jenkins
26 Caxton Street
London SW1H 0RJ / GB
Application number, filing date15896530.125.06.2015
[2018/18]
WO2015US37808
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2016209243
Date:29.12.2016
Language:EN
[2016/52]
Type: A1 Application with search report 
No.:EP3314648
Date:02.05.2018
Language:EN
The application published by WIPO in one of the EPO official languages on 29.12.2016 takes the place of the publication of the European patent application.
[2018/18]
Search report(s)International search report - published on:KR29.12.2016
(Supplementary) European search report - dispatched on:EP12.12.2018
ClassificationIPC:H01L25/065, H01L23/48, H01L23/13, H01L23/498, H01L21/48
[2019/02]
CPC:
H01L23/13 (EP,CN,KR,US); H01L23/49838 (CN,KR,US); H01L21/4853 (CN,KR,US);
H01L21/4857 (CN,KR,US); H01L23/48 (EP,CN,US); H01L23/49822 (EP,CN,KR,US);
H01L23/49833 (CN,KR,US); H01L23/50 (EP,CN,KR,US); H01L23/5385 (EP,CN,KR,US);
H01L23/66 (CN,KR,US); H01L24/16 (CN,KR,US); H01L25/0655 (EP,CN,US);
H01L25/0657 (EP,CN,KR,US); H01L2223/6666 (CN,US); H01L2224/16157 (CN,US);
H01L2224/16197 (CN,US); H01L2224/16225 (EP,CN,US); H01L2924/1205 (CN,US);
H01L2924/15311 (EP,CN,US); H01L2924/19041 (EP); H01L2924/19042 (EP);
H01L2924/19043 (EP) (-)
Former IPC [2018/18]H01L25/065, H01L23/48
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2018/18]
TitleGerman:INTEGRIERTE SCHALTUNGSSTRUKTUREN MIT INTERPOSERN MIT AUSSPARUNGEN[2018/18]
English:INTEGRATED CIRCUIT STRUCTURES WITH INTERPOSERS HAVING RECESSES[2018/18]
French:STRUCTURES DE CIRCUIT INTÉGRÉ AVEC ÉLÉMENTS D'INTERPOSITION PRÉSENTANT DES ÉVIDEMENTS[2018/18]
Entry into regional phase20.11.2017National basic fee paid 
20.11.2017Search fee paid 
20.11.2017Designation fee(s) paid 
20.11.2017Examination fee paid 
Examination procedure19.11.2017Date on which the examining division has become responsible
20.11.2017Examination requested  [2018/18]
18.07.2019Amendment by applicant (claims and/or description)
30.03.2021Despatch of a communication from the examining division (Time limit: M04)
09.08.2021Reply to a communication from the examining division
29.06.2022Cancellation of oral proceeding that was planned for 13.07.2022
13.07.2022Date of oral proceedings (cancelled)
15.07.2022Despatch of communication that the application is refused, reason: substantive examination [2022/48]
25.07.2022Application refused, date of legal effect [2022/48]
Fees paidRenewal fee
20.11.2017Renewal fee patent year 03
12.06.2018Renewal fee patent year 04
13.06.2019Renewal fee patent year 05
15.06.2020Renewal fee patent year 06
14.06.2021Renewal fee patent year 07
26.05.2022Renewal fee patent year 08
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Documents cited:Search[XI]US2005087850  (NISHIKAWA HIROYUKI [JP], et al) [X] 1,10 * paragraphs [0019] , [0047] , [0095] - [0097]; figures 5,6 *[I] 2-9,11-15;
 [XI]US2005258548  (OGAWA KOUKI [JP], et al) [X] 1,2,5,7,8,10,12,13,15 * paragraphs [0108] - [0116] - [0180] , [0181]; figures 1,12 * [I] 3,4,6,9,11,14
International search[Y]US2007117275  (DCAMP JON B [US], et al) [Y] 1-11, 19-25 * See abstract, paragraph [0026] and figures 1-3. *;
 [A]US2009152233  (CHO SUK HYEON [KR], et al) [A] 1-25 * See abstract, paragraphs [0023]-[0028] and figure 1. *;
 [Y]US2011068444  (CHI HEEJO [KR], et al) [Y] 1-11, 18-25 * See abstract, paragraphs [0041]-[0047] and figures 3a-3d. *;
 [A]US2011278741  (CHUA LINDA PEI EE [SG], et al) [A] 1-25* See abstract, paragraphs [0043]-[0057] and figures 3a-3o. *;
 [XY]US2015156880  (DAIZO TOMOYA [JP]) [X] 12-17 * See abstract, paragraphs - and figures 2(A)-8(B), 10. * [Y] 3, 5, 10, 18, 20, 22, 24
by applicantUS2005087850
 US2005258548
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.