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Extract from the Register of European Patents

EP About this file: EP3264072

EP3264072 - INSPECTION SYSTEM [Right-click to bookmark this link]
StatusExamination is in progress
Status updated on  26.03.2021
Database last updated on 30.10.2024
FormerRequest for examination was made
Status updated on  01.12.2017
Most recent event   Tooltip02.06.2024New entry: Date of oral proceedings 
Applicant(s)For all designated states
Omron Corporation
801 Minamifudodo-cho
Horikawahigashiiru
Shiokoji-dori
Shimogyo-ku
Kyoto-shi, Kyoto 600-8530 / JP
[2018/01]
Inventor(s)01 / KIMURA, Yuki
c/o OMRON Corporation, 801, Minamifudodo-cho
Horikawahigashiiru, Shiokoji-dori, Shimogyo-ku
Kyoto-shi, Kyoto 600-8530 / JP
02 / MATSUI, Akira
c/o OMRON Corporation, 801, Minamifudodo-cho
Horikawahigashiiru, Shiokoji-dori, Shimogyo-ku
Kyoto-shi, Kyoto 600-8530 / JP
03 / INAZUMI, Shingo
c/o OMRON Corporation, 801, Minamifudodo-cho
Horikawahigashiiru, Shiokoji-dori, Shimogyo-ku
Kyoto-shi, Kyoto 600-8530 / JP
 [2018/01]
Representative(s)Piotrowicz, Pawel Jan Andrzej, et al
Venner Shipley LLP
406 Science Park
Milton Road
Cambridge CB4 0WW / GB
[N/P]
Former [2018/01]Piotrowicz, Pawel Jan Andrzej, et al
Venner Shipley LLP
Byron House
Cambridge Business Park
Cowley Road
Cambridge CB4 0WZ / GB
Application number, filing date17159082.103.03.2017
[2018/01]
Priority number, dateJP2016013045830.06.2016         Original published format: JP 2016130458
[2018/01]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP3264072
Date:03.01.2018
Language:EN
[2018/01]
Search report(s)(Supplementary) European search report - dispatched on:EP29.09.2017
ClassificationIPC:G01N21/95, G01B11/10, G01B11/24, G01N21/952
[2018/01]
CPC:
G01B11/105 (EP,US); G06T7/0004 (US); B25J9/0087 (US);
G01B11/14 (EP,US); G01B11/2416 (EP,US); G01B11/245 (EP,US);
G01N21/8806 (EP,US); G01N21/8851 (EP,US); G01N21/9515 (EP,US);
G01N21/952 (EP,US); H04N7/181 (US); G01N2021/8887 (EP,US) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2018/32]
Former [2018/01]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
Extension statesBANot yet paid
MENot yet paid
Validation statesMANot yet paid
MDNot yet paid
TitleGerman:ÜBERPRÜFUNGSSYSTEM[2018/01]
English:INSPECTION SYSTEM[2018/01]
French:SYSTÈME D'INSPECTION[2018/01]
Examination procedure03.03.2017Examination requested  [2018/01]
03.03.2017Date on which the examining division has become responsible
27.06.2018Amendment by applicant (claims and/or description)
29.03.2021Despatch of a communication from the examining division (Time limit: M04)
09.08.2021Reply to a communication from the examining division
12.04.2023Despatch of a communication from the examining division (Time limit: M04)
21.08.2023Reply to a communication from the examining division
03.12.2024Date of oral proceedings
Fees paidRenewal fee
18.03.2019Renewal fee patent year 03
23.03.2020Renewal fee patent year 04
17.03.2021Renewal fee patent year 05
18.03.2022Renewal fee patent year 06
17.03.2023Renewal fee patent year 07
19.03.2024Renewal fee patent year 08
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[X]WO2005022076  (GEN INSPECTION LLC [US], et al);
 [X]WO2011072157  (FALLGATTER CALE [US], et al);
 [XI]US2013202195  (PEREZ CORTES JUAN CARLOS [ES], et al);
 [XI]US2015254828  (BEACH GLENN J [US], et al)
ExaminationDE102008019435
 WO2015080669
by applicantJP2009014696
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.