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Extract from the Register of European Patents

EP About this file: EP3249691

EP3249691 - IMAGING SYSTEMS WITH THROUGH-OXIDE VIA CONNECTIONS [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  07.06.2024
Database last updated on 12.07.2024
FormerThe patent has been granted
Status updated on  30.06.2023
FormerGrant of patent is intended
Status updated on  06.03.2023
FormerExamination is in progress
Status updated on  27.03.2020
FormerRequest for examination was made
Status updated on  01.06.2018
FormerThe application has been published
Status updated on  27.10.2017
Most recent event   Tooltip07.06.2024No opposition filed within time limitpublished on 10.07.2024  [2024/28]
Applicant(s)For all designated states
Semiconductor Components Industries, LLC
5005 E. McDowell Road
Phoenix, AZ 85008 / US
[2017/48]
Inventor(s)01 / Borthakur, Swarnal
3606 S. North Church Avenue
Boise, ID 83706 / US
02 / Korobov, Vladimir
15 Treetop Lane
San Mateo, CA 94402 / US
03 / Sulfridge, Marc
3428 N. Lancer Avenue
Boise, ID 83713 / US
 [2017/48]
Representative(s)Manitz Finsterwald Patent- und Rechtsanwaltspartnerschaft mbB
Martin-Greif-Strasse 1
80336 München / DE
[2023/31]
Former [2017/48]Manitz Finsterwald Patentanwälte PartmbB
Martin-Greif-Strasse 1
80336 München / DE
Application number, filing date17178489.525.02.2015
[2017/48]
Priority number, dateUS20141419196527.02.2014         Original published format: US201414191965
[2017/48]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP3249691
Date:29.11.2017
Language:EN
[2017/48]
Type: B1 Patent specification 
No.:EP3249691
Date:02.08.2023
Language:EN
[2023/31]
Search report(s)(Supplementary) European search report - dispatched on:EP17.10.2017
ClassificationIPC:H01L27/146
[2017/48]
CPC:
H01L27/14618 (EP,KR,US); H01L21/76224 (KR,US); H01L21/76898 (US);
H01L27/14634 (EP,KR,US); H01L27/14636 (EP,KR,US); H01L27/14687 (EP,KR,US);
H01L27/1469 (EP,KR,US); H04N25/00 (KR,US) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2017/48]
TitleGerman:ABBILDUNGSSYSTEME MIT THROUGH-OXIDE-VIA-VERBINDUNGEN[2017/48]
English:IMAGING SYSTEMS WITH THROUGH-OXIDE VIA CONNECTIONS[2017/48]
French:SYSTÈMES D'IMAGERIE AYANT DES TROUS D'INTERCONNEXION TRANSVERSANT UN OXYDE[2017/48]
Examination procedure28.06.2017Date on which the examining division has become responsible
29.05.2018Amendment by applicant (claims and/or description)
29.05.2018Examination requested  [2018/27]
31.03.2020Despatch of a communication from the examining division (Time limit: M06)
12.10.2020Reply to a communication from the examining division
01.02.2021Despatch of a communication from the examining division (Time limit: M04)
11.06.2021Reply to a communication from the examining division
16.11.2022Despatch of a communication from the examining division (Time limit: M02)
26.01.2023Reply to a communication from the examining division
07.03.2023Communication of intention to grant the patent
28.06.2023Fee for grant paid
28.06.2023Fee for publishing/printing paid
28.06.2023Receipt of the translation of the claim(s)
Parent application(s)   TooltipEP15156628.8  / EP2913851
Opposition(s)03.05.2024No opposition filed within time limit [2024/28]
Fees paidRenewal fee
28.06.2017Renewal fee patent year 03
22.02.2018Renewal fee patent year 04
20.02.2019Renewal fee patent year 05
20.02.2020Renewal fee patent year 06
19.02.2021Renewal fee patent year 07
17.02.2022Renewal fee patent year 08
22.02.2023Renewal fee patent year 09
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See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipAT02.08.2023
CZ02.08.2023
DK02.08.2023
EE02.08.2023
ES02.08.2023
FI02.08.2023
HR02.08.2023
IT02.08.2023
LT02.08.2023
LV02.08.2023
NL02.08.2023
PL02.08.2023
RO02.08.2023
RS02.08.2023
SE02.08.2023
SK02.08.2023
SM02.08.2023
NO02.11.2023
GR03.11.2023
IS02.12.2023
PT04.12.2023
[2024/26]
Former [2024/23]AT02.08.2023
CZ02.08.2023
DK02.08.2023
EE02.08.2023
ES02.08.2023
FI02.08.2023
HR02.08.2023
LT02.08.2023
LV02.08.2023
NL02.08.2023
PL02.08.2023
RO02.08.2023
RS02.08.2023
SE02.08.2023
SK02.08.2023
SM02.08.2023
NO02.11.2023
GR03.11.2023
IS02.12.2023
PT04.12.2023
Former [2024/22]AT02.08.2023
CZ02.08.2023
DK02.08.2023
FI02.08.2023
HR02.08.2023
LT02.08.2023
LV02.08.2023
NL02.08.2023
PL02.08.2023
RO02.08.2023
RS02.08.2023
SE02.08.2023
SM02.08.2023
NO02.11.2023
GR03.11.2023
IS02.12.2023
PT04.12.2023
Former [2024/20]AT02.08.2023
FI02.08.2023
HR02.08.2023
LT02.08.2023
LV02.08.2023
NL02.08.2023
PL02.08.2023
RS02.08.2023
SE02.08.2023
SM02.08.2023
NO02.11.2023
GR03.11.2023
IS02.12.2023
PT04.12.2023
Former [2024/10]AT02.08.2023
FI02.08.2023
HR02.08.2023
LT02.08.2023
LV02.08.2023
NL02.08.2023
PL02.08.2023
RS02.08.2023
SE02.08.2023
NO02.11.2023
GR03.11.2023
IS02.12.2023
PT04.12.2023
Former [2024/09]AT02.08.2023
FI02.08.2023
LT02.08.2023
NL02.08.2023
SE02.08.2023
NO02.11.2023
GR03.11.2023
IS02.12.2023
Former [2024/08]LT02.08.2023
NL02.08.2023
NO02.11.2023
GR03.11.2023
Documents cited:Search[X]US2011049336  (MATSUNUMA TAKESHI [JP]) [X] 1,3-11 * paragraphs [0081] , [0121]; figures 1-36 *;
 [X]US2011233702  (TAKAHASHI HIROSHI [JP], et al) [X] 1-11 * columns 110-145; figures 2B, 2C, 4 *;
 [X]US2012256319  (MITSUHASHI IKUE [JP]) [X] 1,3-11 * figures 3,5,6,8-16 *;
 [A]US2012292730  (TSAI SHUANG-JI [TW], et al) [A] 1-11* paragraph [0014]; figures 1-7 *
ExaminationUS2007096263
 US2012168935
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.