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Extract from the Register of European Patents

EP About this file: EP3305400

EP3305400 - MICROARRAY FABRICATION SYSTEM AND METHOD [Right-click to bookmark this link]
StatusExamination is in progress
Status updated on  06.04.2019
Database last updated on 12.10.2024
FormerRequest for examination was made
Status updated on  14.12.2018
FormerThe application has been published
Status updated on  09.03.2018
Most recent event   Tooltip28.11.2023New entry: Reply to examination report 
Applicant(s)For all designated states
Illumina, Inc.
5200 Illumina Way
San Diego, CA 92122 / US
[2018/15]
Inventor(s)01 / BOWEN, Shane M.
5200 Illumina Way
San Diego, CA 92122 / US
02 / GUNDERSON, Kevin L.
5200 Illumina Way
San Diego, CA 92122 / US
03 / LIN, Shengrong
25861 Industrial Boulevard
Hayward, CA 94545 / US
04 / BACIGALUPO, Maria Candelaria Rogert
5200 Illumina Way
San Diego, CA 92122 / US
05 / VIJAYAN, Kandaswamy
5200 Illumina Way
San Diego, CA 92122 / US
06 / WU, Yir-Shyuan
25861 Industrial Boulevard
Hayward, CA 94545 / US
07 / VENKATESAN, Bala Murali
5200 Illumina Way
San Diego, CA 92122 / US
08 / TSAY, James
5200 Illumina Way
San Diego, CA 92122 / US
09 / BEIERLE, John M.
5200 Illumina Way
San Diego, CA 92122 / US
10 / BERTI, Lorenzo
5200 Illumina Way
San Diego, CA 92122 / US
11 / PARK, Sang Ryul
5200 Illumina Way
San Diego, CA 92122 / US
 [2018/15]
Representative(s)Grünecker Patent- und Rechtsanwälte PartG mbB
Leopoldstraße 4
80802 München / DE
[2018/15]
Application number, filing date17185952.326.10.2012
[2018/15]
Priority number, dateUS201161552712P28.10.2011         Original published format: US 201161552712 P
[2018/15]
Filing languageEN
Procedural languageEN
PublicationType: A2 Application without search report 
No.:EP3305400
Date:11.04.2018
Language:EN
[2018/15]
Type: A3 Search report 
No.:EP3305400
Date:06.06.2018
Language:EN
[2018/23]
Search report(s)(Supplementary) European search report - dispatched on:EP08.05.2018
ClassificationIPC:B01J19/00, C12Q1/68, G01N33/543, // C40B50/18
[2018/15]
CPC:
B01J19/0046 (EP,US); C12Q1/6844 (US); C12Q1/686 (EP,US);
C40B50/18 (US); B01J2219/00529 (EP,US); B01J2219/00608 (EP,US);
B01J2219/00621 (EP,US); B01J2219/00637 (EP,US); B01J2219/00641 (EP,US);
B01J2219/00644 (EP,US); B01J2219/00648 (EP,US); B01J2219/00653 (EP,US);
B01J2219/00659 (EP,US); B01J2219/00662 (EP,US); B01J2219/00722 (EP,US);
B01J2219/00788 (US); C40B40/06 (US) (-)
C-Set:
C12Q1/686, C12Q2527/125, C12Q2535/122, C12Q2565/543 (EP,US)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2019/03]
Former [2018/15]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
TitleGerman:SYSTEM UND VERFAHREN ZUR HERSTELLUNG VON MIKROARRAYS[2018/15]
English:MICROARRAY FABRICATION SYSTEM AND METHOD[2018/15]
French:SYSTÈME ET PROCÉDÉ DE FABRICATION DE MICRORÉSEAU[2018/15]
Examination procedure05.12.2018Amendment by applicant (claims and/or description)
05.12.2018Examination requested  [2019/03]
05.12.2018Date on which the examining division has become responsible
10.04.2019Despatch of a communication from the examining division (Time limit: M04)
29.07.2019Reply to a communication from the examining division
06.07.2020Despatch of a communication from the examining division (Time limit: M04)
10.11.2020Reply to a communication from the examining division
24.07.2023Despatch of a communication from the examining division (Time limit: M04)
28.11.2023Reply to a communication from the examining division
Parent application(s)   TooltipEP12791335.8  / EP2771103
Fees paidRenewal fee
29.11.2017Renewal fee patent year 03
29.11.2017Renewal fee patent year 04
29.11.2017Renewal fee patent year 05
29.11.2017Renewal fee patent year 06
11.10.2018Renewal fee patent year 07
15.10.2019Renewal fee patent year 08
14.10.2020Renewal fee patent year 09
21.10.2021Renewal fee patent year 10
15.09.2022Renewal fee patent year 11
26.10.2023Renewal fee patent year 12
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Documents cited:Search[XI]US2003059929  (HELLER MICHAEL J [US], et al);
 [XI]WO03049677  (NANOGEN INC [US]);
 [XI]US2006102471  (MAURER KARL [US], et al)
by applicantUS5641658
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 WO0101143
 WO0162982
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 WO03014392
 EP0868530
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 US2010111768
 US2010137143
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The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.