EP3504575 - METHOD FOR IMAGING IN A MICROSCOPE WITH OBLIQUE ILLUMINATION [Right-click to bookmark this link] | Status | The application is deemed to be withdrawn Status updated on 23.06.2023 Database last updated on 24.01.2025 | |
Former | Request for examination was made Status updated on 31.05.2019 | ||
Former | The international publication has been made Status updated on 03.03.2018 | ||
Former | unknown Status updated on 01.09.2017 | Most recent event Tooltip | 23.06.2023 | Application deemed to be withdrawn | published on 26.07.2023 [2023/30] | Applicant(s) | For all designated states Leica Microsystems CMS GmbH Ernst-Leitz-Strasse 17-37 35578 Wetzlar / DE | [2019/27] | Inventor(s) | 01 /
DEISSLER, Benjamin John-F.-Kennedy-Str. 26a 35510 Butzbach / DE | 02 /
WEISS, Albrecht Schillerstr. 18 35440 Linden / DE | 03 /
WEISS, Alexander Schillerstr. 18 35440 Linden / DE | [2019/27] | Representative(s) | Dehns Germany Partnerschaft mbB Postfach 33 04 29 80064 München / DE | [N/P] |
Former [2019/27] | m patent group Postfach 33 04 29 80064 München / DE | Application number, filing date | 17755484.7 | 17.08.2017 | [2019/27] | WO2017EP70882 | Priority number, date | DE201610115856 | 25.08.2016 Original published format: DE102016115856 | [2019/27] | Filing language | DE | Procedural language | DE | Publication | Type: | A1 Application with search report | No.: | WO2018036911 | Date: | 01.03.2018 | Language: | DE | [2018/09] | Type: | A1 Application with search report | No.: | EP3504575 | Date: | 03.07.2019 | Language: | DE | The application published by WIPO in one of the EPO official languages on 01.03.2018 takes the place of the publication of the European patent application. | [2019/27] | Search report(s) | International search report - published on: | EP | 01.03.2018 | Classification | IPC: | G02B21/08, G02B21/36, G06T5/00 | [2019/27] | CPC: |
G02B21/367 (EP);
G02B21/365 (US);
G02B21/082 (EP,US);
G06T5/20 (EP,US);
G06T5/92 (EP);
G06T2207/10056 (EP,US)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2019/27] | Title | German: | VERFAHREN ZUR BILDGEBUNG IN EINEM MIKROSKOP MIT SCHIEFER BELEUCHTUNG | [2019/27] | English: | METHOD FOR IMAGING IN A MICROSCOPE WITH OBLIQUE ILLUMINATION | [2019/27] | French: | PROCÉDÉ DE FORMATION D'IMAGE DANS UN MICROSCOPE AVEC ÉCLAIRAGE DE BIAIS | [2019/27] | Entry into regional phase | 15.02.2019 | National basic fee paid | 15.02.2019 | Designation fee(s) paid | 15.02.2019 | Examination fee paid | Examination procedure | 15.02.2019 | Examination requested [2019/27] | 15.02.2019 | Date on which the examining division has become responsible | 14.10.2019 | Amendment by applicant (claims and/or description) | 01.03.2023 | Application deemed to be withdrawn, date of legal effect [2023/30] | 22.03.2023 | Despatch of communication that the application is deemed to be withdrawn, reason: renewal fee not paid in time [2023/30] | Fees paid | Renewal fee | 29.08.2019 | Renewal fee patent year 03 | 28.08.2020 | Renewal fee patent year 04 | 26.08.2021 | Renewal fee patent year 05 | Penalty fee | Additional fee for renewal fee | 31.08.2022 | 06   M06   Not yet paid |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [XYI]US2012057013 (ISHIWATA HIROSHI [JP]) [X] 1,6-10 * paragraphs [0076] - [0102] - [0104] - [0109]; figures 1-8 * [Y] 2-5 [I] 2-5; | [Y]US2014347460 (RICHFIELD STEVEN E [US]) [Y] 2-5 * paragraph [0111] *; | [T] - ISHIWATA HIROSHI ET AL, "A new method of three-dimensional measurement by differential interference contrast microscope", OPTICS COMMUNICATIONS, ELSEVIER, AMSTERDAM, NL, (20051121), vol. 260, no. 1, doi:10.1016/J.OPTCOM.2005.10.079, ISSN 0030-4018, pages 117 - 126, XP029604753 [T] * the whole document * DOI: http://dx.doi.org/10.1016/j.optcom.2005.10.079 | by applicant | DE3527426 | DE102010042351 |