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Extract from the Register of European Patents

EP About this file: EP3504575

EP3504575 - METHOD FOR IMAGING IN A MICROSCOPE WITH OBLIQUE ILLUMINATION [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  23.06.2023
Database last updated on 24.01.2025
FormerRequest for examination was made
Status updated on  31.05.2019
FormerThe international publication has been made
Status updated on  03.03.2018
Formerunknown
Status updated on  01.09.2017
Most recent event   Tooltip23.06.2023Application deemed to be withdrawnpublished on 26.07.2023  [2023/30]
Applicant(s)For all designated states
Leica Microsystems CMS GmbH
Ernst-Leitz-Strasse 17-37
35578 Wetzlar / DE
[2019/27]
Inventor(s)01 / DEISSLER, Benjamin
John-F.-Kennedy-Str. 26a
35510 Butzbach / DE
02 / WEISS, Albrecht
Schillerstr. 18
35440 Linden / DE
03 / WEISS, Alexander
Schillerstr. 18
35440 Linden / DE
 [2019/27]
Representative(s)Dehns Germany Partnerschaft mbB
Postfach 33 04 29
80064 München / DE
[N/P]
Former [2019/27]m patent group
Postfach 33 04 29
80064 München / DE
Application number, filing date17755484.717.08.2017
[2019/27]
WO2017EP70882
Priority number, dateDE20161011585625.08.2016         Original published format: DE102016115856
[2019/27]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report
No.:WO2018036911
Date:01.03.2018
Language:DE
[2018/09]
Type: A1 Application with search report 
No.:EP3504575
Date:03.07.2019
Language:DE
The application published by WIPO in one of the EPO official languages on 01.03.2018 takes the place of the publication of the European patent application.
[2019/27]
Search report(s)International search report - published on:EP01.03.2018
ClassificationIPC:G02B21/08, G02B21/36, G06T5/00
[2019/27]
CPC:
G02B21/367 (EP); G02B21/365 (US); G02B21/082 (EP,US);
G06T5/20 (EP,US); G06T5/92 (EP); G06T2207/10056 (EP,US)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2019/27]
TitleGerman:VERFAHREN ZUR BILDGEBUNG IN EINEM MIKROSKOP MIT SCHIEFER BELEUCHTUNG[2019/27]
English:METHOD FOR IMAGING IN A MICROSCOPE WITH OBLIQUE ILLUMINATION[2019/27]
French:PROCÉDÉ DE FORMATION D'IMAGE DANS UN MICROSCOPE AVEC ÉCLAIRAGE DE BIAIS[2019/27]
Entry into regional phase15.02.2019National basic fee paid 
15.02.2019Designation fee(s) paid 
15.02.2019Examination fee paid 
Examination procedure15.02.2019Examination requested  [2019/27]
15.02.2019Date on which the examining division has become responsible
14.10.2019Amendment by applicant (claims and/or description)
01.03.2023Application deemed to be withdrawn, date of legal effect  [2023/30]
22.03.2023Despatch of communication that the application is deemed to be withdrawn, reason: renewal fee not paid in time  [2023/30]
Fees paidRenewal fee
29.08.2019Renewal fee patent year 03
28.08.2020Renewal fee patent year 04
26.08.2021Renewal fee patent year 05
Penalty fee
Additional fee for renewal fee
31.08.202206   M06   Not yet paid
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Cited inInternational search[XYI]US2012057013  (ISHIWATA HIROSHI [JP]) [X] 1,6-10 * paragraphs [0076] - [0102] - [0104] - [0109]; figures 1-8 * [Y] 2-5 [I] 2-5;
 [Y]US2014347460  (RICHFIELD STEVEN E [US]) [Y] 2-5 * paragraph [0111] *;
 [T]  - ISHIWATA HIROSHI ET AL, "A new method of three-dimensional measurement by differential interference contrast microscope", OPTICS COMMUNICATIONS, ELSEVIER, AMSTERDAM, NL, (20051121), vol. 260, no. 1, doi:10.1016/J.OPTCOM.2005.10.079, ISSN 0030-4018, pages 117 - 126, XP029604753 [T] * the whole document *

DOI:   http://dx.doi.org/10.1016/j.optcom.2005.10.079
by applicantDE3527426
 DE102010042351
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.