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EP3438670
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EP About this file: EP3438670
| EP3438670 - AUTOMATED ANALYZER [Right-click to bookmark this link] | Status | Examination is in progress Status updated on 11.02.2022 Database last updated on 02.11.2024 | |
| Former | Request for examination was made Status updated on 04.01.2019 | ||
| Former | The international publication has been made Status updated on 07.10.2017 | Most recent event Tooltip | 15.03.2024 | Change - inventor | published on 17.04.2024 [2024/16] | Applicant(s) | For all designated states Hitachi High-Tech Corporation 17-1, Toranomon 1-chome Minato-ku Tokyo 105-6409 / JP | [2020/25] |
| Former [2019/06] | For all designated states Hitachi High-Technologies Corporation 24-14 Nishishimbashi 1-chome Minato-ku Tokyo 105-8717 / JP | Inventor(s) | 01 /
HIRAMA Yoshiteru Tokyo 105-6409 / JP | 02 /
FUKUGAKI Tatsuya Tokyo 105-6409 / JP | [2024/16] |
| Former [2019/06] | 01 /
HIRAMA Yoshiteru c/o HITACHI HIGH-TECHNOLOGIES CORPORATION 24-14 Nishi Shimbashi 1-chome Minato-ku Tokyo 105-8717 / JP | ||
| 02 /
FUKUGAKI Tatsuya c/o HITACHI HIGH-TECHNOLOGIES CORPORATION 24-14 Nishi Shimbashi 1-chome Minato-ku Tokyo 105-8717 / JP | Representative(s) | Strehl Schübel-Hopf & Partner Maximilianstrasse 54 80538 München / DE | [2019/06] | Application number, filing date | 17773543.8 | 23.01.2017 | [2019/06] | WO2017JP02048 | Priority number, date | JP20160062975 | 28.03.2016 Original published format: JP 2016062975 | [2019/06] | Filing language | JA | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2017168993 | Date: | 05.10.2017 | Language: | JA | [2017/40] | Type: | A1 Application with search report | No.: | EP3438670 | Date: | 06.02.2019 | Language: | EN | [2019/06] | Search report(s) | International search report - published on: | JP | 05.10.2017 | (Supplementary) European search report - dispatched on: | EP | 15.11.2019 | Classification | IPC: | G01N35/00, G01N35/02, B01L7/00 | [2019/51] | CPC: |
G01N35/025 (EP,US);
G01N35/1002 (US);
G01N35/00 (US);
B01J19/00 (US);
B01L3/00 (US);
B23P11/00 (US);
B65B43/42 (US);
B65G1/04 (US);
B67C3/00 (US);
F27B9/06 (US);
G01N2035/00287 (US);
G01N2035/00306 (EP,US);
G01N2035/00435 (EP,US);
G01N2035/00673 (US);
G01N2035/0443 (EP,US);
G01N2035/0465 (EP);
G01N21/64 (US);
G01N33/50 (US);
|
| Former IPC [2019/06] | G01N35/00 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2019/06] | Title | German: | AUTOMATISIERTER ANALYSATOR | [2019/06] | English: | AUTOMATED ANALYZER | [2019/06] | French: | ANALYSEUR AUTOMATISÉ | [2019/06] | Entry into regional phase | 05.09.2018 | Translation filed | 05.09.2018 | National basic fee paid | 05.09.2018 | Search fee paid | 05.09.2018 | Designation fee(s) paid | 05.09.2018 | Examination fee paid | Examination procedure | deleted | Date on which the examining division has become responsible | 26.01.2018 | Request for preliminary examination filed International Preliminary Examining Authority: JP | 05.09.2018 | Examination requested [2019/06] | 27.03.2020 | Amendment by applicant (claims and/or description) | 10.02.2022 | Despatch of a communication from the examining division (Time limit: M04) | 30.03.2022 | Reply to a communication from the examining division | 21.11.2023 | Despatch of a communication from the examining division (Time limit: M04) | 08.03.2024 | Reply to a communication from the examining division | Fees paid | Renewal fee | 31.01.2019 | Renewal fee patent year 03 | 31.01.2020 | Renewal fee patent year 04 | 31.01.2021 | Renewal fee patent year 05 | 31.01.2022 | Renewal fee patent year 06 | 31.01.2023 | Renewal fee patent year 07 | 31.01.2024 | Renewal fee patent year 08 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [Y]US2001050276 (INAMI ATSUSHI [JP]) [Y] 1-8 * figures 5A-6C * * paragraphs [0002] , [0008] * * paragraph [0033] - paragraph [0041] *; | [A]WO2011012657 (HOFFMANN LA ROCHE [CH], et al) [A] 1-8* abstract *; | [Y]WO2015025616 (HITACHI HIGH TECH CORP [JP]) [Y] 1-8 * figures 1,5-7,22 * * paragraph [0014] - paragraph [0021] * * paragraph [0026] - paragraph [0027] * | International search | [A]EP1225450 (RANDOX LAB LTD [GB]) [A] 1-8* , entire text; all drawings (Family: none) *; | [A]JP2008096201 (SYSMEX CORP) [A] 1-8 * , entire text; all drawings & US 2008/0085215 A1 entire text; all drawings & EP 1914555 A2 & CN 101162235 A *; | [A]JP2011027663 (HITACHI HIGH TECH CORP, et al) [A] 1-8 * , entire text; all drawings & US 2012/0301359 A1 entire text; all drawings & WO 2011/012657 A1 & EP 2460018 A1 & CN 102597785 A *; | [A]JP2013007688 (HITACHI HIGH TECH CORP) [A] 1-8 * , entire text; all drawings & US 2012/0329143 A1 entire text; all drawings *; | [A]JP2013508237 (Nexus Biosystems, Inc.) [A] 1-8 * , entire text; all drawings & US 2012/0272500 A1 entire text; all drawings & WO 2011/047710 A1 & EP 2491403 A1 *; | [XA]WO2015025616 (HITACHI HIGH TECH CORP [JP]) [X] 1, 4-5, 8 * , entire text; all drawings & US 2016/0161521 A1 entire text; all drawings & EP 3037825 A1 & CN 105593687 A * [A] 2-3, 6-7 |