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EP3575766
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EP About this file: EP3575766
| EP3575766 - RIGIDITY MEASUREMENT DEVICE AND RIGIDITY MEASUREMENT METHOD [Right-click to bookmark this link] | Status | The application has been refused Status updated on 16.09.2022 Database last updated on 30.10.2024 | |
| Former | Examination is in progress Status updated on 11.05.2021 | ||
| Former | Request for examination was made Status updated on 01.11.2019 | ||
| Former | The international publication has been made Status updated on 04.08.2018 | ||
| Former | unknown Status updated on 29.11.2017 | Most recent event Tooltip | 16.09.2022 | Refusal of application | published on 19.10.2022 [2022/42] | Applicant(s) | For all designated states Panasonic Intellectual Property Management Co., Ltd. 1-61, Shiromi 2-chome Chuo-ku Osaka-shi, Osaka 540-6207 / JP | [2019/49] | Inventor(s) | 01 /
IMAGAWA Taro c/o Panasonic Intellectual Property Management Co., Ltd. 1-61, Shiromi 2-chome Chuo-ku Osaka-shi, Osaka 540-6207 / JP | 02 /
NODA Akihiro c/o Panasonic Intellectual Property Management Co., Ltd. 1-61, Shiromi 2-chome Chuo-ku Osaka-shi, Osaka 540-6207 / JP | 03 /
KUSAKA Hiroya c/o Panasonic Intellectual Property Management Co., Ltd. 1-61, Shiromi 2-chome Chuo-ku Osaka-shi, Osaka 540-6207 / JP | [2019/49] | Representative(s) | Vigand, Philippe, et al Novagraaf International SA Chemin de l'Echo 3 1213 Onex - Genève / CH | [2019/49] | Application number, filing date | 17800994.0 | 07.06.2017 | [2019/49] | WO2017JP21087 | Priority number, date | JP20170010915 | 25.01.2017 Original published format: JP 2017010915 | [2019/49] | Filing language | JA | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2018138943 | Date: | 02.08.2018 | Language: | JA | [2018/31] | Type: | A1 Application with search report | No.: | EP3575766 | Date: | 04.12.2019 | Language: | EN | [2019/49] | Search report(s) | International search report - published on: | JP | 02.08.2018 | (Supplementary) European search report - dispatched on: | EP | 13.01.2020 | Classification | IPC: | G01M5/00, G01B11/00, G01B11/16 | [2019/49] | CPC: |
G01M5/0008 (EP);
G01M5/0058 (CN);
G01B11/00 (EP);
G01B11/16 (EP,CN);
G01B7/16 (CN);
G01M11/081 (CN);
G01N3/068 (CN);
G01N3/20 (CN);
G01N3/28 (CN);
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2019/49] | Title | German: | STARRHEITSMESSVORRICHTUNG UND STARRHEITSMESSVERFAHREN | [2019/49] | English: | RIGIDITY MEASUREMENT DEVICE AND RIGIDITY MEASUREMENT METHOD | [2019/49] | French: | DISPOSITIF ET PROCÉDÉ DE MESURE DE RIGIDITÉ | [2019/49] | Entry into regional phase | 29.11.2017 | Translation filed | 29.11.2017 | National basic fee paid | 29.11.2017 | Search fee paid | 29.11.2017 | Designation fee(s) paid | 29.11.2017 | Examination fee paid | Examination procedure | 29.11.2017 | Examination requested [2019/49] | 31.07.2020 | Amendment by applicant (claims and/or description) | 11.05.2021 | Despatch of a communication from the examining division (Time limit: M04) | 13.09.2021 | Reply to a communication from the examining division | 11.05.2022 | Cancellation of oral proceeding that was planned for 05.07.2022 | 30.05.2022 | Despatch of communication that the application is refused, reason: substantive examination [2022/42] | 09.06.2022 | Application refused, date of legal effect [2022/42] | 05.07.2022 | Date of oral proceedings (cancelled) | Fees paid | Renewal fee | 25.06.2019 | Renewal fee patent year 03 | 24.06.2020 | Renewal fee patent year 04 | 22.06.2021 | Renewal fee patent year 05 | Penalty fee | Additional fee for renewal fee | 30.06.2022 | 06 M06 Not yet paid |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Cited in | International search | [A]JP2000055776 (KOBE STEEL LTD); | [A]JP2006329628 (HITACHI SHIPBUILDING ENG CO, et al); | [A]JP2007163390 (JFE STEEL KK, et al); | [A]JP2007240218 (HITACHI SHIPBUILDING ENG CO, et al); | [A]JP2011174874 (UNIV WAKAYAMA); | [A]WO2013191219 (TOSHIBA KK [JP], et al); | [A]WO2016047093 (NEC CORP [JP]); | [A]JP2016084579 (NAT INST ADVANCED IND SCIENCE & TECH); | by applicant | JP2000055776 |