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Extract from the Register of European Patents

EP About this file: EP3633351

EP3633351 - ORIENTATION CHARACTERISTIC MEASUREMENT METHOD, ORIENTATION CHARACTERISTIC MEASUREMENT PROGRAM, AND ORIENTATION CHARACTERISTIC MEASUREMENT DEVICE [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  02.02.2024
Database last updated on 28.02.2026
FormerThe patent has been granted
Status updated on  24.02.2023
FormerGrant of patent is intended
Status updated on  10.10.2022
FormerRequest for examination was made
Status updated on  06.03.2020
FormerThe international publication has been made
Status updated on  01.12.2018
Most recent event   Tooltip19.12.2025Lapse of the patent in a contracting state
New state(s): TR		published on 21.01.2026  [2026/04]
Applicant(s)For all designated states
Hamamatsu Photonics K.K.
1126-1, Ichino-cho
Higashi-ku
Hamamatsu-shi, Shizuoka 435-8558 / JP
[2020/15]
Inventor(s)01 / HOSOKAWA Kiyotada
c/o Hamamatsu Photonics K.K.
1126-1 Ichino-cho
Higashi-ku
Hamamatsu-shi Shizuoka 435-8558 / JP
02 / EURA Shigeru
c/o Hamamatsu Photonics K.K.
1126-1 Ichino-cho
Higashi-ku
Hamamatsu-shi Shizuoka 435-8558 / JP
 [2020/15]
Representative(s)Hoffmann Eitle
Patent- und Rechtsanwälte PartmbB
Arabellastraße 30
81925 München / DE
[2020/15]
Application number, filing date17910576.222.11.2017
[2020/15]
WO2017JP42073
Priority number, dateJP2017010192623.05.2017         Original published format: JP 2017101926
[2020/15]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2018216246
Date:29.11.2018
Language:JA
[2018/48]
Type: A1 Application with search report 
No.:EP3633351
Date:08.04.2020
Language:EN
[2020/15]
Type: B1 Patent specification 
No.:EP3633351
Date:29.03.2023
Language:EN
[2023/13]
Search report(s)International search report - published on:JP29.11.2018
(Supplementary) European search report - dispatched on:EP21.01.2021
ClassificationIPC:G01N21/64
[2021/08]
CPC:
G01N21/6445 (EP); G01N21/21 (KR); G01B11/26 (US);
G01N21/64 (KR); G01N21/645 (EP); H05B33/10 (KR);
H10K50/00 (KR); G01N2021/6417 (EP); G01N2021/6484 (EP) (-)
Former IPC [2020/15]G01N21/21, G01N21/64, H01L51/50, H05B33/10
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2020/15]
Extension statesBANot yet paid
MENot yet paid
Validation statesMANot yet paid
MDNot yet paid
TitleGerman:AUSRICHTUNGSEIGENSCHAFTMESSVERFAHREN, AUSRICHTUNGSEIGENSCHAFTMESSPROGRAMM UND AUSRICHTUNGSEIGENSCHAFTMESSVORRICHTUNG[2020/15]
English:ORIENTATION CHARACTERISTIC MEASUREMENT METHOD, ORIENTATION CHARACTERISTIC MEASUREMENT PROGRAM, AND ORIENTATION CHARACTERISTIC MEASUREMENT DEVICE[2020/15]
French:PROCÉDÉ DE MESURE DE CARACTÉRISTIQUE D'ORIENTATION, PROGRAMME DE MESURE DE CARACTÉRISTIQUE D'ORIENTATION ET DISPOSITIF DE MESURE DE CARACTÉRISTIQUE D'ORIENTATION[2020/15]
Entry into regional phase23.10.2019Translation filed 
23.10.2019National basic fee paid 
23.10.2019Search fee paid 
23.10.2019Designation fee(s) paid 
23.10.2019Examination fee paid 
Examination procedure23.10.2019Examination requested  [2020/15]
28.07.2021Amendment by applicant (claims and/or description)
11.10.2022Communication of intention to grant the patent
10.02.2023Fee for grant paid
10.02.2023Fee for publishing/printing paid
10.02.2023Receipt of the translation of the claim(s)
Divisional application(s)EP23151476.1  / EP4191236
Opposition(s)03.01.2024No opposition filed within time limit [2024/10]
Fees paidRenewal fee
22.11.2019Renewal fee patent year 03
13.11.2020Renewal fee patent year 04
30.11.2021Renewal fee patent year 05
13.10.2022Renewal fee patent year 06
Opt-out from the exclusive  Tooltip
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Patent Court		 See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipCY22.11.2017
HU22.11.2017
AT29.03.2023
BG29.03.2023
CZ29.03.2023
DK29.03.2023
EE29.03.2023
ES29.03.2023
FI29.03.2023
HR29.03.2023
IT29.03.2023
LT29.03.2023
LV29.03.2023
MC29.03.2023
NL29.03.2023
PL29.03.2023
RO29.03.2023
RS29.03.2023
SE29.03.2023
SI29.03.2023
SK29.03.2023
SM29.03.2023
TR29.03.2023
NO29.06.2023
GR30.06.2023
IS29.07.2023
PT31.07.2023
IE22.11.2023
LU22.11.2023
BE30.11.2023
[2026/04]
Former [2025/39]CY22.11.2017
HU22.11.2017
AT29.03.2023
BG29.03.2023
CZ29.03.2023
DK29.03.2023
EE29.03.2023
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FI29.03.2023
HR29.03.2023
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PL29.03.2023
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IE22.11.2023
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IE22.11.2023
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SM29.03.2023
NO29.06.2023
GR30.06.2023
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PT31.07.2023
IE22.11.2023
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SM29.03.2023
NO29.06.2023
GR30.06.2023
IS29.07.2023
PT31.07.2023
IE22.11.2023
LU22.11.2023
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DK29.03.2023
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Documents cited:Search[A]   WOLFGANG BRTTING ET AL: "Device efficiency of organic light-emitting diodes: Progress by improved light outcoupling", PHYSICA STATUS SOLIDI. A: APPLICATIONS AND MATERIALS SCIENCE, vol. 210, no. 1, 24 September 2012 (2012-09-24), DE, pages 44 - 65, XP055561096, ISSN: 1862-6300, DOI: 10.1002/pssa.201228320 [A] 1-12 * figures 23, 30 *

DOI:   http://dx.doi.org/10.1002/pssa.201228320
 [A]   FRISCHEISEN JRG ET AL: "Determination of molecular dipole orientation in doped fluorescent organic thin films by photoluminescence measurements", APPLIED PHYSICS LETTERS, A I P PUBLISHING LLC, US, vol. 96, no. 7, 17 February 2010 (2010-02-17), pages 73302 - 73302, XP012132258, ISSN: 0003-6951, DOI: 10.1063/1.3309705 [A] 1-12 * the whole document *

DOI:   http://dx.doi.org/10.1063/1.3309705
 [A]   TAKESHI KOMINO ET AL: "Selectively Controlled Orientational Order in Linear-Shaped Thermally Activated Delayed Fluorescent Dopants", CHEMISTRY OF MATERIALS, vol. 26, no. 12, 6 June 2014 (2014-06-06), pages 3665 - 3671, XP055561032, ISSN: 0897-4756, DOI: 10.1021/cm500802p [A] 1-12 * figure 3 * * the corresponding description on p. 3668 *

DOI:   http://dx.doi.org/10.1021/cm500802p
 [AD]   KOMINO TAKESHI ET AL: "Electroluminescence from completely horizontally oriented dye molecules", APPLIED PHYSICS LETTERS, A I P PUBLISHING LLC, US, vol. 108, no. 24, XP012208563, ISSN: 0003-6951, [retrieved on 19010101], DOI: 10.1063/1.4954163 [AD] 1-12 * the whole document *

DOI:   http://dx.doi.org/10.1063/1.4954163
International search[A] JP2006308549  (SEIKO EPSON CORP et al.) [A] 1-12 * , & US 2006/0222782 A1 *
 [A] JP2002267573  (SHINTECH KK et al.) [A] 1-12 * , *
 [A] JPH0843307  (NEC CORP et al.) [A] 1-12 * , *
 [A] JPS6435418  (MATSUSHITA ELECTRIC INDUSTRIAL CO LTD et al.) [A] 1-12 * , *
by applicant  TAKESHI KOMINO: "Electroluminescence from completely horizontally oriented dye molecules", APPLIED PHYSICS LETTERS, vol. 108, 2016, pages 241106, XP012208563, DOI: 10.1063/1.4954163

DOI:   http://dx.doi.org/10.1063/1.4954163
   "New method for determining refractive index and thickness of fluorescent thin films", OPTICS COMMUNICATIONS, vol. 31, no. 3, December 1979 (1979-12-01)
   "Light emission by multipole sources in thin layers. I. Radiation patterns of electric and magnetic dipoles", J. OPT. SOC. AM., vol. 71, no. 6, June 1981 (1981-06-01)
   "Electroluminescence from completely horizontally oriented dyed molecules", APPLIED PHYSICS LETTERS, vol. 108, 2016, pages 241106
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.