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Extract from the Register of European Patents

EP About this file: EP3658032

EP3658032 - X-RAY IMAGING SYSTEM AND METHOD OF X-RAY IMAGE TRACKING [Right-click to bookmark this link]
StatusExamination is in progress
Status updated on  21.04.2023
Database last updated on 18.11.2024
FormerRequest for examination was made
Status updated on  01.05.2020
FormerThe international publication has been made
Status updated on  02.02.2019
Most recent event   Tooltip05.09.2024New entry: Additional fee for renewal fee: despatch of communication + time limit 
Applicant(s)For all designated states
Shenzhen Xpectvision Technology Co., Ltd.
B507, Block A and B
Nanshan Medical Device Industrial Park
Nanhai Avenue 1019
Nanshan District
Shenzhen, Guangdong 518000 / CN
[2022/14]
Former [2020/23]For all designated states
Shenzhen Xpectvision Technology Co., Ltd.
Suite 201, Building B52
Tanglang Industrial Area
No. 13 at No. Five Xinyi Road
Tanglang Community, Taoyuan Str., Nanshan District
Shenzhen, Guangdong 518071 / CN
Inventor(s)01 / CAO, Peiyan
Room 201 Block A
No. 1 Qianwan Road 1
Shenzhen-Hong Kong Cooperative District
Shenzhen Guangdong 518054 / CN
02 / LIU, Yurun
Room 201 Block A
No. 1 Qianwan Road 1
Shenzhen-Hong Kong Cooperative District
Shenzhen Guangdong 518054 / CN
 [2020/23]
Representative(s)Beck Greener LLP
Fulwood House
12 Fulwood Place
London WC1V 6HR / GB
[2020/23]
Application number, filing date17918811.526.07.2017
[2020/23]
WO2017CN94456
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2019019048
Date:31.01.2019
Language:EN
[2019/05]
Type: A1 Application with search report 
No.:EP3658032
Date:03.06.2020
Language:EN
The application published by WIPO in one of the EPO official languages on 31.01.2019 takes the place of the publication of the European patent application.
[2020/23]
Search report(s)International search report - published on:CN31.01.2019
(Supplementary) European search report - dispatched on:EP03.02.2021
ClassificationIPC:A61B6/03
[2020/23]
CPC:
A61B6/487 (EP,US); A61B6/4266 (EP,US); A61B6/03 (EP);
A61B6/42 (US); A61B6/4208 (US); A61B6/4233 (US);
A61B6/4241 (EP,US); A61B6/44 (US); A61B6/4405 (US);
A61B6/4411 (US); A61B6/4452 (US); A61B6/4458 (US);
A61B6/482 (US); A61B6/486 (US); A61B6/504 (EP,US);
A61B6/508 (US); A61B6/54 (US); A61B6/547 (US);
A61N5/1001 (US); G01T1/2014 (US); G01T1/241 (US);
G01T1/2914 (US) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2020/23]
TitleGerman:RÖNTGENBILDGEBUNGSSYSTEM UND VERFAHREN ZUR RÖNTGENBILDVERFOLGUNG[2020/23]
English:X-RAY IMAGING SYSTEM AND METHOD OF X-RAY IMAGE TRACKING[2020/23]
French:SYSTÈME D'IMAGERIE RADIOLOGIQUE ET MÉTHODE DE SUIVI D'IMAGE RADIOLOGIQUE[2020/23]
Entry into regional phase14.02.2020National basic fee paid 
14.02.2020Search fee paid 
14.02.2020Designation fee(s) paid 
14.02.2020Examination fee paid 
Examination procedure14.02.2020Examination requested  [2020/23]
06.09.2021Amendment by applicant (claims and/or description)
25.04.2023Despatch of a communication from the examining division (Time limit: M06)
06.11.2023Reply to a communication from the examining division
Fees paidRenewal fee
14.02.2020Renewal fee patent year 03
25.06.2020Renewal fee patent year 04
23.06.2021Renewal fee patent year 05
22.06.2022Renewal fee patent year 06
23.06.2023Renewal fee patent year 07
Penalty fee
Additional fee for renewal fee
31.07.202408   M06   Not yet paid
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]US2006039537  (STROBEL NORBERT K [US]) [A] 1-15 * paragraph [0053] * * paragraph [0043] * * figures 4-6 *;
 [XI]JP2011004966  (TOSHIBA CORP, et al) [X] 1-3,5-7,10,15 * abstract * * paragraph [0014] * * paragraph [0045] * * figures 2A, 2B, 12 * * paragraph [0031] * * paragraph [0040] * * paragraph [0020] * [I] 4,8,9,11-14;
 [A]JP2015150206  (HITACHI MEDICAL CORP) [A] 1-15* abstract *
International search[Y]US2005169426  (GROH BURKHARD [US], et al) [Y] 1-52 * description, paragraphs [0004]-[0049] and figures 1-13 *;
 [Y]US2015342556  (VAN DIJK ERIK MARTINUS HUBERTUS PETRUS [NL]) [Y] 1-52 * description, paragraphs [0033]-[0062] and figures 1-2 *;
 [Y]WO2016161542  (SHENZHEN XPECTVISION TECH CO LTD [CN]) [Y] 17-26, 43-52 * claims 1, 3-10, 12, description, paragraphs [0060], [0079]-[0099] and figures 1A, 7A-12 *;
 [A]CN102858249  (TOSHIBA KK, et al) [A] 1-52 * the whole document *;
 [A]DE102012203291  (SIEMENS AG [DE]) [A] 1-52 * the whole document *;
 [A]US2008125649  (MEYER ANDREAS [DE], et al) [A] 1-52 * the whole document *;
 [A]JP2014217615  (TOSHIBA CORP, et al) [A] 1-52 * the whole document *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.