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EP3613543
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EP About this file: EP3613543
| EP3613543 - CHARGED PARTICLE MICROSCOPE WITH A MANIPULATOR DEVICE, AND METHOD OF PREPARING A SPECIMEN WITH SAID CHARGED PARTICLE MICROSCOPE [Right-click to bookmark this link] | Status | Request for examination was made Status updated on 07.08.2020 Database last updated on 16.11.2024 | |
| Former | The application has been published Status updated on 24.01.2020 | Most recent event Tooltip | 19.08.2024 | New entry: Renewal fee paid | Applicant(s) | For all designated states FEI Company 5350 NE Dawson Creek Drive Hillsboro, OR 97124-5793 / US | [2020/09] | Inventor(s) | 01 /
Persoon, Hans Vonderveld 13 5583 GX Waalre / NL | 02 /
Engelen, Andre Wildeman 41 5629 KH Eindhoven / NL | 03 /
Schampers, Ruud Metternichstraat 19 5932 AW Tegelen / NL | 04 /
Mitchels, John Sokolsa 720, Modrice 664 42 Brno / CZ | [2020/09] | Representative(s) | Janssen, Francis-Paul FEI Company Patent Department P.O.Box 1745 5602 BS Eindhoven / NL | [2020/09] | Application number, filing date | 18190045.7 | 21.08.2018 | [2020/09] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP3613543 | Date: | 26.02.2020 | Language: | EN | [2020/09] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 07.03.2019 | Classification | IPC: | B25J7/00, B25J15/08, H01J37/20 | [2020/09] | CPC: |
H01J37/20 (EP,US);
H01J37/252 (US);
B25J15/0293 (EP);
B25J7/00 (EP);
G02B21/34 (US);
H01J37/244 (US);
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2020/37] |
| Former [2020/09] | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR | Extension states | BA | Not yet paid | ME | Not yet paid | Validation states | KH | Not yet paid | MA | Not yet paid | MD | Not yet paid | TN | Not yet paid | Title | German: | LADUNGSPARTIKELMIKROSKOP MIT MANIPULATORVORRICHTUNG UND VERFAHREN ZUR HERSTELLUNG EINER PROBE MIT DIESEM LADUNGSPARTIKELMIKROSKOP | [2020/09] | English: | CHARGED PARTICLE MICROSCOPE WITH A MANIPULATOR DEVICE, AND METHOD OF PREPARING A SPECIMEN WITH SAID CHARGED PARTICLE MICROSCOPE | [2020/09] | French: | MICROSCOPE À PARTICULES CHARGÉES COMPORTANT UN DISPOSITIF MANIPULATEUR ET PROCÉDÉ DE PRÉPARATION D'UN ÉCHANTILLON À L'AIDE DUDIT MICROSCOPE À PARTICULES CHARGÉES | [2020/09] | Examination procedure | 04.08.2020 | Amendment by applicant (claims and/or description) | 04.08.2020 | Examination requested [2020/37] | 04.08.2020 | Date on which the examining division has become responsible | Fees paid | Renewal fee | 13.08.2020 | Renewal fee patent year 03 | 13.08.2021 | Renewal fee patent year 04 | 29.08.2022 | Renewal fee patent year 05 | 25.08.2023 | Renewal fee patent year 06 | 19.08.2024 | Renewal fee patent year 07 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [X]JP2005205573 (SEIKO INSTR INC) [X] 1-15 * the whole document *; | [A]CN206566029U (JINAN KEEN DENTAL CLINIC CO LTD) [A] 1-15 * the whole document *; | [A]WO2005031789 (ZYVEX CORP [US], et al) [A] 1-15 * figures 1,4A-4E *; | [A]CN205363650U (GUANGDONG IND AND TRADE COLLEGE, et al) [A] 1-15 * the whole document * | by applicant | - MAYER, J. et al., "TEM Sample Preparation and FIB-Induced Damage", MRS Bulletin, (20070000), vol. 32, pages 400 - 407, XP008086532 |