EP3493065 - SOFTWARE QUALITY DETERMINATION APPARATUS, SOFTWARE QUALITY DETERMINATION METHOD, AND SOFTWARE QUALITY DETERMINATION PROGRAM [Right-click to bookmark this link] | Status | The application has been refused Status updated on 24.02.2023 Database last updated on 13.11.2024 | |
Former | Examination is in progress Status updated on 05.02.2021 | ||
Former | Request for examination was made Status updated on 03.05.2019 | Most recent event Tooltip | 24.02.2023 | Refusal of application | published on 29.03.2023 [2023/13] | Applicant(s) | For all designated states TOYOTA JIDOSHA KABUSHIKI KAISHA 1, Toyota-cho Toyota-shi, Aichi 471 8571 / JP | [2019/23] | Inventor(s) | 01 /
AOKI, Eisuke c/o TOYOTA JIDOSHA KABUSHIKI KAISHA; 1, Toyota-cho Toyota-shi, Aichi 471-8571 / JP | [2019/23] | Representative(s) | TBK Bavariaring 4-6 80336 München / DE | [2019/23] | Application number, filing date | 18200682.5 | 16.10.2018 | [2019/23] | Priority number, date | JP20170229603 | 29.11.2017 Original published format: JP 2017229603 | [2019/23] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP3493065 | Date: | 05.06.2019 | Language: | EN | [2019/23] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 17.04.2019 | Classification | IPC: | G06F11/36 | [2019/23] | CPC: |
G06F11/3616 (EP,US);
G06F11/3648 (US);
G06F11/3688 (CN);
G06F21/577 (CN)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2019/23] | Extension states | BA | Not yet paid | ME | Not yet paid | Validation states | KH | Not yet paid | MA | Not yet paid | MD | Not yet paid | TN | Not yet paid | Title | German: | SOFTWAREQUALITÄTBESTIMMUNGSVORRICHTUNG, SOFTWAREQUALITÄTBESTIMMUNGSVERFAHREN UND SOFTWAREQUALITÄTBESTIMMUNGSPROGRAMM | [2019/23] | English: | SOFTWARE QUALITY DETERMINATION APPARATUS, SOFTWARE QUALITY DETERMINATION METHOD, AND SOFTWARE QUALITY DETERMINATION PROGRAM | [2019/23] | French: | APPAREIL DE DÉTERMINATION DE LA QUALITÉ DE LOGICIELS, PROCÉDÉ DE DÉTERMINATION DE LA QUALITÉ DE LOGICIELS ET PROGRAMME DE DÉTERMINATION DE LA QUALITÉ DE LOGICIELS | [2019/23] | Examination procedure | 16.10.2018 | Examination requested [2019/23] | 19.11.2019 | Amendment by applicant (claims and/or description) | 04.02.2021 | Despatch of a communication from the examining division (Time limit: M04) | 04.06.2021 | Reply to a communication from the examining division | 28.10.2022 | Cancellation of oral proceeding that was planned for 02.11.2022 | 02.11.2022 | Date of oral proceedings (cancelled) | 08.11.2022 | Despatch of communication that the application is refused, reason: substantive examination [2023/13] | 18.11.2022 | Application refused, date of legal effect [2023/13] | Fees paid | Renewal fee | 14.10.2020 | Renewal fee patent year 03 | 29.09.2021 | Renewal fee patent year 04 | Penalty fee | Additional fee for renewal fee | 31.10.2022 | 05   M06   Not yet paid |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US2010180259 (LINDLEY JOE H [US]) [A] 1-6* paragraphs [0011] - [0041] *; | [I]US2014033174 (FARCHI EITAN [IL], et al) [I] 1-6 * abstract * * paragraphs [0018] - [0029] * * paragraphs [0037] - [0044] - [0054] , [0068] , [0071] *; | [A]US8881095 (HUNT JR BILLY EDWARD [US], et al) [A] 1-6 * column 3, line 8 - column 5, line 12 * * figures 1-3 *; | [A] - NORMAN E FENTON ET AL, "Software metrics", PROCEEDINGS OF THE CONFERENCE ON THE FUTURE OF SOFTWARE ENGINEERING , ICSE '00, ACM PRESS, NEW YORK, NEW YORK, USA, (20000501), doi:10.1145/336512.336588, ISBN 978-1-58113-253-3, pages 357 - 370, XP058374916 [A] 1-6 * Table 1 * DOI: http://dx.doi.org/10.1145/336512.336588 | [A] - MORI T ET AL, "Viewpoint-Based Test Analysis for Dependable Onboard Flight Software", SPACE MISSION CHALLENGES FOR INFORMATION TECHNOLOGY, 2009. SMC-IT 2009. THIRD IEEE INTERNATIONAL CONFERENCE ON, IEEE, PISCATAWAY, NJ, USA, (20090719), ISBN 978-0-7695-3637-8, pages 77 - 82, XP031522289 [A] 1-6 * the whole document * | by applicant | JP2014174895 | - FURTHER, Revised Edition, Embedded Software Development Quality Reference guide, (20120000), pages 102 - 103 | - "Defect removal by ODC analysis and visualization of quality maturity", TAKASHI YAMAZAKI, Embedded Technology West 2014 IPA seminar, Olympus Software Technology Corp., (20140729), page 30 | - "Software Reliability Enhancement Center, Technology Headquarters, Information-technology Promotion Agency, independent administrative agency", White Papers on Software Development Data, 2016-2017, (20161001), page 214 |