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Extract from the Register of European Patents

EP About this file: EP3493257

EP3493257 - SILICON SHIELDING FOR BASEBAND TERMINATION AND RF PERFORMANCE ENHANCEMENT [Right-click to bookmark this link]
StatusGrant of patent is intended
Status updated on  05.11.2024
Database last updated on 13.11.2024
FormerExamination is in progress
Status updated on  18.06.2021
FormerRequest for examination was made
Status updated on  13.12.2019
FormerThe application has been published
Status updated on  03.05.2019
Most recent event   Tooltip05.11.2024New entry: Communication of intention to grant a patent 
Applicant(s)For all designated states
NXP USA, Inc.
6501 William Cannon Drive West
Austin TX 78735 / US
[2019/23]
Inventor(s)01 / ZHU, Ning
NXP Semiconductors, Intellectual Property Group
High Tech Campus 60
5656 AG Eindhoven / NL
02 / HOLMES, Damon G.
NXP Semiconductors, Intellectual Property Group
High Tech Campus 60
5656 AG Eindhoven / NL
03 / JONES, Jeffrey Kevin
NXP Semiconductors, Intellectual Property Group
High Tech Campus 60
5656 AG Eindhoven / NL
 [2019/23]
Representative(s)Hardingham, Christopher Mark
NXP Semiconductors
Intellectual Property Group
Abbey House
25 Clarendon Road
Redhill, Surrey RH1 1QZ / GB
[N/P]
Former [2019/23]Pomper, Till
NXP Semiconductors
Intellectual Property Group
134 avenue Eisenhower
BP 72329
31023 Toulouse Cedex 1 / FR
Application number, filing date18209804.603.12.2018
[2019/23]
Priority number, dateUS20171583112704.12.2017         Original published format: US201715831127
[2019/23]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP3493257
Date:05.06.2019
Language:EN
[2019/23]
Search report(s)(Supplementary) European search report - dispatched on:EP14.03.2019
ClassificationIPC:H01L23/552, H01L23/522, H01L23/64, H01L23/00, // H01L23/66
[2024/46]
CPC:
H01L23/66 (EP,US); H03F3/1935 (US); H01L23/057 (EP,US);
H01L23/562 (EP,US); H01L24/49 (EP,US); H03F1/0205 (US);
H03F1/565 (US); H03F3/195 (US); H03F3/213 (US);
H01L2223/6611 (EP,US); H01L2223/6616 (EP,US); H01L2223/6655 (EP,US);
H01L2223/6672 (EP,US); H01L2224/131 (EP,US); H01L2224/16245 (EP,US);
H01L2224/291 (EP,US); H01L2224/2929 (EP,US); H01L2224/293 (EP,US);
H01L2224/32245 (EP,US); H01L2224/48091 (EP,US); H01L2224/48105 (EP,US);
H01L2224/48195 (EP,US); H01L2224/48247 (EP,US); H01L2224/48463 (EP,US);
H01L2224/49052 (EP,US); H01L2224/49112 (EP,US); H01L2224/49113 (EP,US);
H01L2224/49175 (EP,US); H01L2224/73265 (EP,US); H01L2224/83805 (EP,US);
H01L2224/8384 (EP,US); H01L24/13 (EP,US); H01L24/16 (EP,US);
H01L24/29 (EP,US); H01L24/32 (EP,US); H01L24/48 (EP,US);
H01L2924/00014 (EP,US); H01L2924/13091 (EP,US); H01L2924/19041 (EP,US);
H01L2924/19105 (EP,US); H03F2200/451 (US) (-)
C-Set:
H01L2224/131, H01L2924/014 (US,EP);
H01L2224/291, H01L2924/014 (US,EP);
H01L2224/2929, H01L2924/0665 (US,EP);
H01L2224/293, H01L2924/00014 (US,EP);
H01L2224/73265, H01L2224/32245, H01L2224/48247, H01L2924/00 (EP,US);
H01L2224/83805, H01L2924/00014 (EP,US);
H01L2224/8384, H01L2924/00014 (EP,US);
H01L2924/00014, H01L2224/45099 (EP,US);
H01L2924/13091, H01L2924/00 (EP,US)
(-)
Former IPC [2019/23]H01L23/552, H01L23/522, H01L23/64, H01L49/02, H01L23/00
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2020/03]
Former [2019/23]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
Extension statesBANot yet paid
MENot yet paid
Validation statesKHNot yet paid
MANot yet paid
MDNot yet paid
TNNot yet paid
TitleGerman:SILIZIUMABSCHIRMUNG FÜR BASISBANDABSCHLUSS UND HF-LEISTUNGSSTEIGERUNG[2019/23]
English:SILICON SHIELDING FOR BASEBAND TERMINATION AND RF PERFORMANCE ENHANCEMENT[2019/23]
French:BLINDAGE DE SILICIUM DE TERMINAISON DE BANDE DE BASE ET AMÉLIORATION DE PERFORMANCES RF[2019/23]
Examination procedure13.11.2019Amendment by applicant (claims and/or description)
05.12.2019Examination requested  [2020/03]
05.12.2019Date on which the examining division has become responsible
22.06.2021Despatch of a communication from the examining division (Time limit: M04)
12.10.2021Reply to a communication from the examining division
08.10.2024Cancellation of oral proceeding that was planned for 10.10.2024
10.10.2024Date of oral proceedings (cancelled)
06.11.2024Communication of intention to grant the patent
Fees paidRenewal fee
11.01.2021Renewal fee patent year 03
03.01.2022Renewal fee patent year 04
02.01.2023Renewal fee patent year 05
02.01.2024Renewal fee patent year 06
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Documents cited:Search[A]US2010140772  (LIN YAOJIAN [SG], et al);
 [Y]US2011068433  (KIM JONGHAE [US], et al);
 [A]US2012062439  (LIAO KUO-HSIEN [TW], et al);
 [A]US2012139091  (WAKABAYASHI YOSHIAKI [JP]);
 [Y]US2015381121  (JONES JEFFREY K [US], et al);
 [A]US2016344353  (WATTS MICHAEL E [US], et al);
 [Y]US2017025363  (TSAI MING-HORNG [TW], et al)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.