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Extract from the Register of European Patents

EP About this file: EP3707790

EP3707790 - TRIGGERABLE SPARK GAP, SWITCHING CIRCUIT HAVING A TRIGGERABLE SPARK GAP, AND PROCESS FOR MANUFACTURING A TRIGGERABLE SPARK GAP [Right-click to bookmark this link]
StatusExamination is in progress
Status updated on  29.03.2024
Database last updated on 19.10.2024
FormerGrant of patent is intended
Status updated on  02.01.2024
FormerExamination is in progress
Status updated on  24.12.2021
FormerRequest for examination was made
Status updated on  14.08.2020
FormerThe international publication has been made
Status updated on  18.05.2019
Formerunknown
Status updated on  21.11.2018
Most recent event   Tooltip05.07.2024New entry: Reply to examination report 
Applicant(s)For all designated states
TDK Electronics AG
Rosenheimer Strasse 141e
81671 München / DE
[2020/38]
Inventor(s)01 / DAEUMER, Wolfgang
Lindenallee 1
15738 Zeuthen / DE
02 / MEWES, Michael
Dalandweg 31 B
12167 Berlin / DE
03 / FANG, Zhipeng
Changzheng Road 110
Xiaogan Hubei 432104 / CN
 [2020/38]
Representative(s)Epping - Hermann - Fischer
Patentanwaltsgesellschaft mbH
Schloßschmidstraße 5
80639 München / DE
[2020/38]
Application number, filing date18800140.808.11.2018
[2020/38]
WO2018EP80621
Priority number, dateDE20171012637110.11.2017         Original published format: DE102017126371
[2020/38]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report
No.:WO2019092108
Date:16.05.2019
Language:DE
[2019/20]
Type: A1 Application with search report 
No.:EP3707790
Date:16.09.2020
Language:DE
The application published by WIPO in one of the EPO official languages on 16.05.2019 takes the place of the publication of the European patent application.
[2020/38]
Search report(s)International search report - published on:EP16.05.2019
ClassificationIPC:H01T2/02, H01T1/22, H01T1/24, H01T15/00, H01T21/00, H01T4/12
[2020/38]
CPC:
H01T2/02 (EP,US); H01T1/24 (EP,US); H01T1/22 (EP,US);
H01T15/00 (EP); H01T21/00 (EP,US); H01T4/12 (EP);
H03K3/537 (EP) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2020/38]
TitleGerman:TRIGGERBARE FUNKENSTRECKE, SCHALTKREIS MIT TRIGGERBARER FUNKENSTRECKE UND VERFAHREN ZUR HERSTELLUNG EINER TRIGGERBAREN FUNKENSTRECKE[2020/38]
English:TRIGGERABLE SPARK GAP, SWITCHING CIRCUIT HAVING A TRIGGERABLE SPARK GAP, AND PROCESS FOR MANUFACTURING A TRIGGERABLE SPARK GAP[2020/38]
French:ÉCLATEUR À DÉCLENCHEMENT, CIRCUIT AVEC ÉCLATEUR À DÉCLENCHEMENT ET PROCÉDÉ DE FABRICATION D'UN ÉCLATEUR À DÉCLENCHEMENT[2020/38]
Entry into regional phase20.03.2020National basic fee paid 
20.03.2020Designation fee(s) paid 
20.03.2020Examination fee paid 
Examination proceduredeletedCommunication of intention to grant the patent
20.03.2020Examination requested  [2020/38]
20.03.2020Date on which the examining division has become responsible
17.12.2020Amendment by applicant (claims and/or description)
05.01.2022Despatch of a communication from the examining division (Time limit: M04)
02.05.2022Reply to a communication from the examining division
03.01.2024Communication of intention to grant the patent
28.03.2024Disapproval of the communication of intention to grant the patent by the applicant or resumption of examination proceedings by the EPO
06.05.2024Despatch of a communication from the examining division (Time limit: M02)
04.07.2024Reply to a communication from the examining division
Fees paidRenewal fee
24.11.2020Renewal fee patent year 03
23.11.2021Renewal fee patent year 04
21.11.2022Renewal fee patent year 05
22.11.2023Renewal fee patent year 06
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Cited inInternational search[A]DE1763559  (INST FRANCAIS DU PETROLE);
 [YA]DE2742502  (SIEMENS AG);
 [XAY]DE3100924  (SIEMENS AG [DE]);
 [A]DE3723571  (SIEMENS AG [DE]);
 [YA]DE102004006988  (DEHN & SOEHNE [DE]);
 [XAY]US2006209485  (IMAI KOICHI [JP], et al)
by applicantDE102015114846
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.