EP3734467 - DATA PROCESSING DEVICE, DATA PROCESSING METHOD, AND RECORDING MEDIUM [Right-click to bookmark this link] | |||
Former [2020/45] | DATA PROCESSING DEVICE, DATA PROCESSING METHOD, AND PROGRAM | ||
[2024/17] | Status | The patent has been granted Status updated on 29.03.2024 Database last updated on 24.08.2024 | |
Former | Grant of patent is intended Status updated on 04.12.2023 | ||
Former | Examination is in progress Status updated on 01.07.2022 | ||
Former | Request for examination was made Status updated on 02.10.2020 | ||
Former | The international publication has been made Status updated on 05.07.2019 | Most recent event Tooltip | 29.03.2024 | (Expected) grant | published on 01.05.2024 [2024/18] | Applicant(s) | For all designated states Tokyo Electron Limited Akasaka Biz Tower 3-1, Akasaka 5-chome 107-6325 Minato-ku, Tokyo / JP | [2020/45] | Inventor(s) | 01 /
SUZUKI, Atsushi c/o Tokyo Electron Limited, 2F, Ohdori Bus-Center Bldg. No.1, Minami 1-jo Higashi 1-chome, Chuo-ku Sapporo City, Hokkaido 0600051 / JP | 02 /
KATO, Takahiko c/o Tokyo Electron Miyagi Limited, 1 Techno Hills Taiwa-cho Kurokawa-gun, Miyagi 9813629 / JP | [2020/45] | Representative(s) | Diehl & Partner Patent- und Rechtsanwaltskanzlei mbB Erika-Mann-Straße 9 80636 München / DE | [2020/45] | Application number, filing date | 18893557.1 | 25.12.2018 | [2020/45] | WO2018JP47519 | Priority number, date | JP20170253694 | 28.12.2017 Original published format: JP 2017253694 | [2020/45] | Filing language | JA | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2019131608 | Date: | 04.07.2019 | Language: | JA | [2019/27] | Type: | A1 Application with search report | No.: | EP3734467 | Date: | 04.11.2020 | Language: | EN | [2020/45] | Type: | B1 Patent specification | No.: | EP3734467 | Date: | 01.05.2024 | Language: | EN | [2024/18] | Search report(s) | International search report - published on: | JP | 04.07.2019 | (Supplementary) European search report - dispatched on: | EP | 19.08.2021 | Classification | IPC: | G06F16/28 | [2021/38] | CPC: |
G06F16/285 (EP,US);
G06F30/20 (KR);
G05B19/042 (EP);
G06F16/22 (KR);
G06F16/248 (KR);
G06F16/284 (KR);
G06F16/906 (KR);
G06F18/15 (US);
G06F18/2163 (US);
G06F18/231 (US);
G06F18/24765 (US);
G06V30/242 (US);
G05B2219/45031 (EP,US);
G06F18/23 (US);
G06F2119/02 (KR);
G06F2119/18 (KR,US)
(-)
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Former IPC [2020/45] | G06F16/00 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2020/45] | Extension states | BA | Not yet paid | ME | Not yet paid | Validation states | KH | Not yet paid | MA | Not yet paid | MD | Not yet paid | TN | Not yet paid | Title | German: | DATENVERARBEITUNGSVORRICHTUNG, DATENVERARBEITUNGSVERFAHREN, UND AUFZEICHNUNGSMEDIUM | [2024/17] | English: | DATA PROCESSING DEVICE, DATA PROCESSING METHOD, AND RECORDING MEDIUM | [2024/17] | French: | DISPOSITIF DE TRAITEMENT DE DONNÉES, PROCÉDÉ DE TRAITEMENT DE DONNÉES, ET SUPPORT D'ENREGISTREMENT | [2024/17] |
Former [2020/45] | DATENVERARBEITUNGSVORRICHTUNG, DATENVERARBEITUNGSVERFAHREN UND PROGRAMM | ||
Former [2020/45] | DATA PROCESSING DEVICE, DATA PROCESSING METHOD, AND PROGRAM | ||
Former [2020/45] | DISPOSITIF DE TRAITEMENT DE DONNÉES, PROCÉDÉ DE TRAITEMENT DE DONNÉES ET PROGRAMME | Entry into regional phase | 23.07.2020 | Translation filed | 23.07.2020 | National basic fee paid | 23.07.2020 | Search fee paid | 23.07.2020 | Designation fee(s) paid | 23.07.2020 | Examination fee paid | Examination procedure | 23.07.2020 | Examination requested [2020/45] | 04.01.2022 | Amendment by applicant (claims and/or description) | 05.07.2022 | Despatch of a communication from the examining division (Time limit: M04) | 14.11.2022 | Reply to a communication from the examining division | 07.11.2023 | Date of oral proceedings | 28.11.2023 | Minutes of oral proceedings despatched | 05.12.2023 | Communication of intention to grant the patent | 19.03.2024 | Fee for grant paid | 19.03.2024 | Fee for publishing/printing paid | 19.03.2024 | Receipt of the translation of the claim(s) | Fees paid | Renewal fee | 05.11.2020 | Renewal fee patent year 03 | 02.12.2021 | Renewal fee patent year 04 | 02.12.2022 | Renewal fee patent year 05 | 06.12.2023 | Renewal fee patent year 06 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [XI]US2016357840 (ODASHIMA SHIGEYUKI [JP], et al) [X] 1,7,8 * abstract * * paragraphs [0013] , [0064] * * paragraph [0104] - paragraph [0110] * [I] 2-6; | [A] - KOH J ET AL, "A MULTI-LAYER KOHONEN'S SELF-ORGANIZING FEATURE MAP FOR RANGE IMAGE SEGMENTATION", PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON NEURAL NETWORKS (ICNN). SAN FRANCISCO, MAR. 28 - APR. 1, 1993; [PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON NEURAL NETWORKS (ICNN)], NEW YORK, IEEE, US, (19930328), vol. 3, doi:10.1109/ICNN.1993.298740, ISBN 978-0-7803-0999-9, pages 1270 - 1276, XP000379462 [A] 1-8 * abstract * * page 1271, paragraph 2.1 * * page 1273, paragraph 2.2.2 * DOI: http://dx.doi.org/10.1109/ICNN.1993.298740 | [A] - YONGCHUL KWON ET AL, "Skew-resistant parallel processing of feature-extracting scientific user-defined functions", PROCEEDINGS OF THE 1ST ACM SYMPOSIUM ON CLOUD COMPUTING, SOCC '10, ACM PRESS, NEW YORK, NEW YORK, USA, (20100610), doi:10.1145/1807128.1807140, ISBN 978-1-4503-0036-0, pages 75 - 86, XP058190167 [A] 1-8 * abstract * * page 80, paragraph 3.3 - page 82 * DOI: http://dx.doi.org/10.1145/1807128.1807140 | International search | [A]JP2001256480 (HITACHI LTD) [A] 1-8 * , *; | [A]WO2012016594 (FRAUNHOFER GES FORSCHUNG [DE], et al) [A] 1-8 * , eta & EP 2601618 A1 *; | [A]JP2016206784 (IHI CORP) [A] 1-8 * , *; | [A] - Kaoru SAKAI and Shunji MAEDA, "LSI wafer inspection method using recursive splitting of feature space", IPSJ SIG Technical Reports, (20060909), vol. 2006, no. 93, ISSN 0913-5685, pages 65 - 72, XP009521997 [A] 1-8 | [A] - SAKATA et al, "Successive Pattern Learning based on Test Feature Classifier and its application to time-series recognition problem", Documents of Research group of the Institute of Electrical of Japan, (20060811), pages 1 - 6, XP055624047 [A] 1-8 | by applicant | JP2009152269 | US2015211122 | US2017177997 | JP20170253694 |