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Extract from the Register of European Patents

EP About this file: EP3666936

EP3666936 - SEMI-INSULATING SILICON CARBIDE SINGLE CRYSTAL DOPED WITH SMALL AMOUNT OF VANADIUM, SUBSTRATE PREPARED THEREFROM, AND PREPARATION METHOD THEREFOR [Right-click to bookmark this link]
StatusExamination is in progress
Status updated on  23.12.2022
Database last updated on 13.07.2024
FormerRequest for examination was made
Status updated on  15.05.2020
FormerThe international publication has been made
Status updated on  24.04.2020
Formerunknown
Status updated on  18.12.2019
Most recent event   Tooltip29.12.2023New entry: Renewal fee paid 
Applicant(s)For all designated states
SICC Co., Ltd
Room 1106-6-01 Building AB Century Wealth Center
West Side of Xinyu Road
Innovation Zone
Jinan
Shandong 250100 / CN
[2020/25]
Inventor(s)01 / GAO, Chao
AB Block 1106-6-01, century Fortune Center
West Side of Xinyu, High-tech District
Jinan, Shandong 250100 / CN
02 / LIU, Jiapeng
AB Block 1106-6-01, century Fortune Center
West Side of Xinyu, High-tech District
Jinan, Shandong 250100 / CN
03 / LI, Jialin
AB Block 1106-6-01, century Fortune Center
West Side of Xinyu, High-tech District
Jinan, Shandong 250100 / CN
04 / LI, Chanjin
AB Block 1106-6-01, century Fortune Center
West Side of Xinyu, High-tech District
Jinan, Shandong 250100 / CN
05 / BAI, Wenwen
AB Block 1106-6-01, century Fortune Center
West Side of Xinyu, High-tech District
Jinan, Shandong 250100 / CN
06 / ZONG, Yanmin
AB Block 1106-6-01, century Fortune Center
West Side of Xinyu, High-tech District
Jinan, Shandong 250100 / CN
 [2021/04]
Representative(s)Huang, Liwei
Cäcilienstraße 12
40597 Düsseldorf / DE
[N/P]
Former [2020/25]Bergenstråhle Group AB
P.O. Box 17704
118 93 Stockholm / SE
Application number, filing date18922091.626.12.2018
[2020/25]
WO2018CN123707
Priority number, dateCN20181120469016.10.2018         Original published format: CN201811204690
CN20181120470216.10.2018         Original published format: CN201811204702
[2020/25]
Filing languageZH
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2020077846
Date:23.04.2020
Language:ZH
[2020/17]
Type: A1 Application with search report 
No.:EP3666936
Date:17.06.2020
Language:EN
[2020/25]
Search report(s)International search report - published on:CN23.04.2020
(Supplementary) European search report - dispatched on:EP24.09.2020
ClassificationIPC:C30B23/02, C30B29/36, C30B33/02, C30B35/00
[2020/44]
CPC:
C30B29/36 (EP,KR); C30B23/02 (EP,KR); C30B33/02 (EP,KR);
C30B35/002 (KR); C30B35/007 (EP); H01L21/02529 (KR)
Former IPC [2020/25]C30B23/02, C30B29/36, C30B33/02
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2020/25]
TitleGerman:MIT GERINGER VANADIUMMENGE DOTIERTER HALBISOLIERENDER SILICIUMCARBID-EINKRISTALL, SUBSTRAT UND HERSTELLUNGSVERFAHREN[2020/25]
English:SEMI-INSULATING SILICON CARBIDE SINGLE CRYSTAL DOPED WITH SMALL AMOUNT OF VANADIUM, SUBSTRATE PREPARED THEREFROM, AND PREPARATION METHOD THEREFOR[2020/25]
French:MONOCRISTAL DE CARBURE DE SILICIUM SEMI-ISOLANT DOPÉ AVEC UNE PETITE QUANTITÉ DE VANADIUM, SUBSTRAT PRÉPARÉ À PARTIR DE CELUI-CI, ET SON PROCÉDÉ DE PRÉPARATION[2020/25]
Entry into regional phase18.12.2019Translation filed 
18.12.2019National basic fee paid 
18.12.2019Search fee paid 
18.12.2019Designation fee(s) paid 
18.12.2019Examination fee paid 
Examination procedure18.12.2019Examination requested  [2020/25]
26.03.2021Amendment by applicant (claims and/or description)
03.01.2023Despatch of a communication from the examining division (Time limit: M04)
29.04.2023Reply to a communication from the examining division
Fees paidRenewal fee
30.12.2020Renewal fee patent year 03
24.12.2021Renewal fee patent year 04
29.12.2022Renewal fee patent year 05
28.12.2023Renewal fee patent year 06
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Documents cited:Search[A]WO0071787  (CREE INC [US], et al) [A] 1-15* the whole document *;
 [XAI]CN102560671  (CHINESE ACAD PHYSICS INST) [X] 1,2,5-10,13-15 * paragraphs [0007] - [0017] - [0 24] - [0029] - [0 49] * * example 1 * * table 1 * * claims 2, 4, 7, 9, 15, 16 * [A] 3,4,12 [I] 11;
 [A]  - SON ET AL, "Prominent defects in semi-insulating SiC substrates", PHYSICA B: CONDENSED MATTER, ELSEVIER, AMSTERDAM, NL, (20071117), vol. 401-402, doi:10.1016/J.PHYSB.2007.08.115, ISSN 0921-4526, pages 67 - 72, XP022349820 [A] 1-15 * the whole document *

DOI:   http://dx.doi.org/10.1016/j.physb.2007.08.115
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.