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Extract from the Register of European Patents

EP About this file: EP3650905

EP3650905 - IMPROVED METHOD AND DEVICES FOR MICROSCOPY WITH STRUCTURED ILLUMINATION [Right-click to bookmark this link]
StatusNo opposition filed within time limit
Status updated on  17.11.2023
Database last updated on 20.03.2026
FormerThe patent has been granted
Status updated on  09.12.2022
FormerGrant of patent is intended
Status updated on  01.08.2022
FormerRequest for examination was made
Status updated on  10.04.2020
Most recent event   Tooltip26.12.2025Lapse of the patent in a contracting state
New state(s): TR		published on 28.01.2026  [2026/05]
Applicant(s)For all designated states
Carl Zeiss Microscopy GmbH
Carl-Zeiss-Promenade 10
07745 Jena / DE
[2023/02]
Former [2020/20]For all designated states
Carl Zeiss Microscopy GmbH
Carl-Zeiss-Promenade 10
07745 Jena / DE
Inventor(s)01 / Kleppe, Ingo
Kaninchenweg 31
07749 Jena / DE
02 / Novikau, Yauheni
Fichtestraße 33
99510 Apolda / DE
 [2020/31]
Former [2020/20]01 / Kleppe, Ingo
Kaninchenweg 31
07749 Jena / DE
02 / Novikau, Yauheni
Cospedaer Grund 7
07743 Jena / DE
Representative(s)Schiffer, Axel Martin
Rundfunkplatz 2
80335 München / DE
[2023/02]
Former [2020/20]Loritz, Rainer
Carl Zeiss AG Konzernfunktion Recht und Patente Patentabteilung Jena Carl-Zeiss-Promenade 10
07745 Jena / DE
Application number, filing date19205973.129.10.2019
[2020/20]
Priority number, dateDE2018100905612.11.2018         Original published format: DE102018009056
[2020/20]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP3650905
Date:13.05.2020
Language:DE
[2020/20]
Type: B1 Patent specification 
No.:EP3650905
Date:11.01.2023
Language:DE
[2023/02]
Search report(s)(Supplementary) European search report - dispatched on:EP03.04.2020
ClassificationIPC:G02B21/00, G02B21/36, G02B27/58, G06T3/40
[2020/20]
CPC:
G02B21/367 (EP); G01N21/6402 (CN); G01N21/6458 (CN,US);
G02B21/0032 (EP); G02B21/0076 (CN,US); G02B21/008 (EP);
G02B21/06 (US); G02B21/361 (US); G02B27/58 (EP);
G06T17/00 (US) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2020/20]
TitleGerman:BESCHLEUNIGTE VERFAHREN UND VORRICHTUNGEN FÜR DIE DREIDIMENSIONALE MIKROSKOPIE MIT STRUKTURIERTER BELEUCHTUNG[2020/20]
English:IMPROVED METHOD AND DEVICES FOR MICROSCOPY WITH STRUCTURED ILLUMINATION[2020/20]
French:PROCÉDÉS ET DISPOSITIFS ACCÉLÉRÉS POUR UNE MICROSCOPIE TRIDIMENSIONNELLE À ÉCLAIRAGE STRUCTURÉ[2020/20]
Examination procedure29.10.2019Examination requested  [2020/20]
17.02.2020Amendment by applicant (claims and/or description)
08.12.2020Despatch of communication that the application is deemed to be withdrawn, reason: reply to the Extended European Search Report/Written Opinion of the International Searching Authority/International Preliminary Examination Report/Supplementary international search report not received in time
02.08.2022Communication of intention to grant the patent
29.11.2022Fee for grant paid
29.11.2022Fee for publishing/printing paid
29.11.2022Receipt of the translation of the claim(s)
Opposition(s)12.10.2023No opposition filed within time limit [2023/51]
Request for further processing for:The application is deemed to be withdrawn due to failure to reply to the Extended European Search Report/Written Opinion of the International Searching Authority/International Preliminary Examination Report/Supplementary international search report/Supplementary European search report
17.02.2021Request for further processing filed
17.02.2021Full payment received (date of receipt of payment)
Request granted
26.02.2021Decision despatched
Fees paidRenewal fee
25.10.2021Renewal fee patent year 03
25.10.2022Renewal fee patent year 04
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipCY29.10.2019
HU29.10.2019
BG11.01.2023
CZ11.01.2023
DK11.01.2023
EE11.01.2023
ES11.01.2023
FI11.01.2023
HR11.01.2023
LT11.01.2023
LV11.01.2023
MC11.01.2023
NL11.01.2023
PL11.01.2023
RO11.01.2023
RS11.01.2023
SE11.01.2023
SI11.01.2023
SK11.01.2023
SM11.01.2023
TR11.01.2023
NO11.04.2023
GR12.04.2023
IS11.05.2023
PT11.05.2023
[2026/05]
Former [2025/39]CY29.10.2019
HU29.10.2019
BG11.01.2023
CZ11.01.2023
DK11.01.2023
EE11.01.2023
ES11.01.2023
FI11.01.2023
HR11.01.2023
LT11.01.2023
LV11.01.2023
MC11.01.2023
NL11.01.2023
PL11.01.2023
RO11.01.2023
RS11.01.2023
SE11.01.2023
SI11.01.2023
SK11.01.2023
SM11.01.2023
NO11.04.2023
GR12.04.2023
IS11.05.2023
PT11.05.2023
Former [2025/36]CY29.10.2019
BG11.01.2023
CZ11.01.2023
DK11.01.2023
EE11.01.2023
ES11.01.2023
FI11.01.2023
HR11.01.2023
LT11.01.2023
LV11.01.2023
MC11.01.2023
NL11.01.2023
PL11.01.2023
RO11.01.2023
RS11.01.2023
SE11.01.2023
SI11.01.2023
SK11.01.2023
SM11.01.2023
NO11.04.2023
GR12.04.2023
IS11.05.2023
PT11.05.2023
Former [2024/51]BG11.01.2023
CZ11.01.2023
DK11.01.2023
EE11.01.2023
ES11.01.2023
FI11.01.2023
HR11.01.2023
LT11.01.2023
LV11.01.2023
MC11.01.2023
NL11.01.2023
PL11.01.2023
RO11.01.2023
RS11.01.2023
SE11.01.2023
SI11.01.2023
SK11.01.2023
SM11.01.2023
NO11.04.2023
GR12.04.2023
IS11.05.2023
PT11.05.2023
Former [2024/28]CZ11.01.2023
DK11.01.2023
EE11.01.2023
ES11.01.2023
FI11.01.2023
HR11.01.2023
LT11.01.2023
LV11.01.2023
MC11.01.2023
NL11.01.2023
PL11.01.2023
RO11.01.2023
RS11.01.2023
SE11.01.2023
SI11.01.2023
SK11.01.2023
SM11.01.2023
NO11.04.2023
GR12.04.2023
IS11.05.2023
PT11.05.2023
Former [2024/11]CZ11.01.2023
DK11.01.2023
EE11.01.2023
ES11.01.2023
FI11.01.2023
HR11.01.2023
LT11.01.2023
LV11.01.2023
NL11.01.2023
PL11.01.2023
RO11.01.2023
RS11.01.2023
SE11.01.2023
SI11.01.2023
SK11.01.2023
SM11.01.2023
NO11.04.2023
GR12.04.2023
IS11.05.2023
PT11.05.2023
Former [2023/50]CZ11.01.2023
DK11.01.2023
EE11.01.2023
ES11.01.2023
FI11.01.2023
HR11.01.2023
LT11.01.2023
LV11.01.2023
NL11.01.2023
PL11.01.2023
RO11.01.2023
RS11.01.2023
SE11.01.2023
SK11.01.2023
SM11.01.2023
NO11.04.2023
GR12.04.2023
IS11.05.2023
PT11.05.2023
Former [2023/49]CZ11.01.2023
DK11.01.2023
EE11.01.2023
ES11.01.2023
FI11.01.2023
HR11.01.2023
LT11.01.2023
LV11.01.2023
NL11.01.2023
PL11.01.2023
RO11.01.2023
RS11.01.2023
SE11.01.2023
SM11.01.2023
NO11.04.2023
GR12.04.2023
IS11.05.2023
PT11.05.2023
Former [2023/48]DK11.01.2023
EE11.01.2023
ES11.01.2023
FI11.01.2023
HR11.01.2023
LT11.01.2023
LV11.01.2023
NL11.01.2023
PL11.01.2023
RS11.01.2023
SE11.01.2023
SM11.01.2023
NO11.04.2023
GR12.04.2023
IS11.05.2023
PT11.05.2023
Former [2023/46]DK11.01.2023
ES11.01.2023
FI11.01.2023
HR11.01.2023
LT11.01.2023
LV11.01.2023
NL11.01.2023
PL11.01.2023
RS11.01.2023
SE11.01.2023
SM11.01.2023
NO11.04.2023
GR12.04.2023
IS11.05.2023
PT11.05.2023
Former [2023/39]ES11.01.2023
FI11.01.2023
HR11.01.2023
LT11.01.2023
LV11.01.2023
NL11.01.2023
PL11.01.2023
RS11.01.2023
SE11.01.2023
NO11.04.2023
GR12.04.2023
IS11.05.2023
PT11.05.2023
Former [2023/38]ES11.01.2023
FI11.01.2023
HR11.01.2023
LT11.01.2023
LV11.01.2023
NL11.01.2023
PL11.01.2023
RS11.01.2023
SE11.01.2023
NO11.04.2023
GR12.04.2023
PT11.05.2023
Former [2023/37]ES11.01.2023
FI11.01.2023
HR11.01.2023
LT11.01.2023
LV11.01.2023
NL11.01.2023
RS11.01.2023
SE11.01.2023
NO11.04.2023
GR12.04.2023
PT11.05.2023
Former [2023/36]ES11.01.2023
FI11.01.2023
HR11.01.2023
LT11.01.2023
LV11.01.2023
NL11.01.2023
RS11.01.2023
SE11.01.2023
NO11.04.2023
PT11.05.2023
Former [2023/35]ES11.01.2023
HR11.01.2023
LT11.01.2023
NL11.01.2023
RS11.01.2023
NO11.04.2023
PT11.05.2023
Former [2023/34]ES11.01.2023
LT11.01.2023
NL11.01.2023
RS11.01.2023
PT11.05.2023
Former [2023/33]ES11.01.2023
LT11.01.2023
NL11.01.2023
Former [2023/31]NL11.01.2023
Documents cited:Search[Y] WO2012118436  (APPLIED PRECISION INC et al.)
 [Y] US2012194646  (CHIANG ANN-SHYN et al.)
 [Y] DE102011077269  (ZEISS CARL MICROIMAGING GMBH et al.)
 [Y] WO2010015954  (KONINKL PHILIPS ELECTRONICS NV et al.)
by applicantDE19908883
 US2008088920
   M. GUSTAFSSON: "Surpassing the lateral resolution limit by a factor of two using structured illumination microscopy", JOURNAL OF MICROSCOPY, vol. 198, 2000, pages 82, XP008083176, DOI: 10.1046/j.1365-2818.2000.00710.x

DOI:   http://dx.doi.org/10.1046/j.1365-2818.2000.00710.x
   C. MLLERJ. ENDERLEIN: "Image scanning microscopy", PHYSICAL REVIEW LETTERS, vol. 104, 2010, pages 198101
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.