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Extract from the Register of European Patents

EP About this file: EP3835721

EP3835721 - A METHOD FOR MEASURING A HEIGHT MAP OF A TEST SURFACE [Right-click to bookmark this link]
StatusExamination is in progress
Status updated on  23.12.2022
Database last updated on 24.08.2024
FormerRequest for examination was made
Status updated on  20.08.2021
FormerThe application has been published
Status updated on  14.05.2021
Most recent event   Tooltip03.08.2024Change: Despatch of examination report + time limit 
Applicant(s)For all designated states
Mitutoyo Corporation
20-1, Sakado 1-chome
Takatsu-ku
Kawasaki-shi, Kanagawa 213-8533 / JP
[2021/24]
Inventor(s)01 / KETELAARS, Hendrik
7, Moederkruid
5422 EG Gemert / NL
02 / ZUIDERWEG, Adriaan Tiemen
24, Eikstraat
4814 HM Breda / NL
03 / REDLARSKI, Lukasz
82, Welschapsedijk
5652 XN Eindhoven / NL
04 / QUAEDACKERS, Johannes Anna
4, Hertgang
5508 LR Veldhoven / NL
 [2021/24]
Representative(s)EP&C
P.O. Box 3241
2280 GE Rijswijk / NL
[2021/24]
Application number, filing date19216041.413.12.2019
[2021/24]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP3835721
Date:16.06.2021
Language:EN
[2021/24]
Search report(s)(Supplementary) European search report - dispatched on:EP17.06.2020
ClassificationIPC:G01B11/25, G01N21/956
[2021/24]
CPC:
G01B11/25 (EP,US); G01B11/0608 (CN,US); G01B11/22 (US);
G01N21/55 (US); G01N21/956 (EP,US)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2021/38]
Former [2021/24]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
Extension statesBANot yet paid
MENot yet paid
Validation statesKHNot yet paid
MANot yet paid
MDNot yet paid
TNNot yet paid
TitleGerman:VERFAHREN ZUR MESSUNG EINER HÖHENKARTE EINER TESTFLÄCHE[2021/24]
English:A METHOD FOR MEASURING A HEIGHT MAP OF A TEST SURFACE[2021/24]
French:PROCÉDÉ DE MESURE D'UNE CARTE DE HAUTEUR D'UNE SURFACE D'ESSAI[2021/24]
Examination procedure13.08.2021Amendment by applicant (claims and/or description)
13.08.2021Examination requested  [2021/38]
13.08.2021Date on which the examining division has become responsible
22.12.2022Despatch of a communication from the examining division (Time limit: M04)
19.04.2023Reply to a communication from the examining division
29.04.2024Despatch of a communication from the examining division (Time limit: M06)
Fees paidRenewal fee
24.12.2021Renewal fee patent year 03
29.12.2022Renewal fee patent year 04
28.12.2023Renewal fee patent year 05
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Documents cited:Search[A]KR20060057036  (SAMSUNG ELECTRONICS CO LTD [KR]) [A] 1 * claims 1-3 *;
 [XI]US2014320633  (HAUGEN PAUL R [US]) [X] 1,3-9,12,13 * paragraphs [0010] , [0012] , [0013] , [0015] , [0029] , [0041] - [0042]; figures 1,7,8 * [I] 2,10,11;
 [AD]EP2977720  (MITUTOYO CORP [JP]) [AD] 1* figure 1 *
by applicantEP2977720
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.