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Extract from the Register of European Patents

EP About this file: EP3671246

EP3671246 - DEVICE AND METHOD FOR TESTING AND CALIBRATING A COMPONENT [Right-click to bookmark this link]
StatusThe patent has been granted
Status updated on  08.03.2024
Database last updated on 30.10.2024
FormerGrant of patent is intended
Status updated on  23.11.2023
FormerExamination is in progress
Status updated on  25.03.2022
FormerRequest for examination was made
Status updated on  23.10.2020
FormerThe application has been published
Status updated on  22.05.2020
Most recent event   Tooltip25.10.2024Lapse of the patent in a contracting state
New state(s): ES
published on 27.11.2024 [2024/48]
Applicant(s)For all designated states
TDK-Micronas GmbH
Hans-Bunte-Straße 19
79108 Freiburg / DE
[2023/51]
Former [2020/26]For all designated states
TDK-Micronas GmbH
Hans-Bunte-Straße 19
79108 Freiburg im Breisgau / DE
Inventor(s)01 / Kawaletz, Oliver
TDK - Micronas GmbH
c/o TDK - Micronas GmbH
Hans-Bunte-Straße 19
79108 Freiburg / DE
02 / Cornils, Martin
TDK - Micronas GmbH
c/o TDK - Micronas GmbH
Hans-Bunte-Straße 19
79108 Freiburg / DE
 [2020/26]
Representative(s)Sonnenberg Harrison Partnerschaft mbB
Herzogspitalstraße 10a
80331 München / DE
[2024/15]
Former [2020/26]Harrison, Robert John
24IP Law Group
Sonnenberg Fortmann
Patent- und Rechtsanwälte
Postfach 33 08 65
80068 München / DE
Application number, filing date19216375.616.12.2019
[2020/26]
Priority number, dateDE20181013294019.12.2018         Original published format: DE102018132940
[2020/26]
Filing languageDE
Procedural languageDE
PublicationType: A1 Application with search report 
No.:EP3671246
Date:24.06.2020
Language:DE
[2020/26]
Type: B1 Patent specification 
No.:EP3671246
Date:10.04.2024
Language:DE
[2024/15]
Search report(s)(Supplementary) European search report - dispatched on:EP18.05.2020
ClassificationIPC:G01R33/00, G01R31/28
[2020/26]
CPC:
G01R33/0017 (EP); G01R35/00 (CN); G01R33/0035 (EP,US);
G01R33/007 (EP); G01R33/0082 (US); G01R33/31 (US);
G01R35/005 (CN) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2020/48]
Former [2020/26]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
TitleGerman:VORRICHTUNG UND VERFAHREN ZUR PRÜFUNG UND KALIBRIERUNG EINES BAUTEILS[2020/26]
English:DEVICE AND METHOD FOR TESTING AND CALIBRATING A COMPONENT[2020/26]
French:DISPOSITIF ET PROCÉDÉ D'ESSAI ET D'ÉTALONNAGE D'UN COMPOSANT[2020/26]
Examination procedure21.10.2020Amendment by applicant (claims and/or description)
21.10.2020Examination requested  [2020/48]
21.10.2020Date on which the examining division has become responsible
24.03.2022Despatch of a communication from the examining division (Time limit: M04)
25.05.2022Reply to a communication from the examining division
24.11.2023Communication of intention to grant the patent
29.02.2024Fee for grant paid
29.02.2024Fee for publishing/printing paid
29.02.2024Receipt of the translation of the claim(s)
Fees paidRenewal fee
24.12.2021Renewal fee patent year 03
29.12.2022Renewal fee patent year 04
28.12.2023Renewal fee patent year 05
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Lapses during opposition  TooltipBG10.04.2024
ES10.04.2024
FI10.04.2024
HR10.04.2024
NL10.04.2024
NO10.07.2024
GR11.07.2024
IS10.08.2024
PT12.08.2024
[2024/48]
Former [2024/47]BG10.04.2024
FI10.04.2024
HR10.04.2024
NL10.04.2024
NO10.07.2024
GR11.07.2024
IS10.08.2024
PT12.08.2024
Former [2024/46]BG10.04.2024
FI10.04.2024
HR10.04.2024
NL10.04.2024
NO10.07.2024
IS10.08.2024
Former [2024/44]NL10.04.2024
Documents cited:Search[XY]US6191599  (STEVENS KEITH C [US]);
 [Y]US2013008628  (TIENGTUM PONGSAK [US], et al);
 [XY]US2013038321  (SUZUKI TAKASHI [JP]);
 [X]CN106871948  (710TH RES INST SHIPBLD IND)
by applicantUS2010308812
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.