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Extract from the Register of European Patents

EP About this file: EP3844809

EP3844809 - SILICON ON INSULATOR WITH MULTIPLE SEMICONDUCTOR THICKNESSES USING LAYER TRANSFER [Right-click to bookmark this link]
StatusThe application is deemed to be withdrawn
Status updated on  25.02.2022
Database last updated on 02.11.2024
FormerRequest for examination was made
Status updated on  04.06.2021
FormerThe international publication has been made
Status updated on  07.03.2020
Formerunknown
Status updated on  26.08.2019
Most recent event   Tooltip25.02.2022Application deemed to be withdrawnpublished on 30.03.2022  [2022/13]
Applicant(s)For all designated states
QUALCOMM INCORPORATED
ATTN: International IP Administration
5775 Morehouse Drive
San Diego, California 92121-1714 / US
[2021/27]
Inventor(s)01 / LIANG, Qingqing
5775 Morehouse Drive
San Diego, California 92121 / US
02 / FANELLI, Stephen Alan
5775 Morehouse Drive
San Diego, California 92121 / US
03 / GOKTEPELI, Sinan
5775 Morehouse Drive
San Diego, California 92121 / US
 [2021/27]
Representative(s)Dunlop, Hugh Christopher, et al
Maucher Jenkins
Seventh Floor Offices
Artillery House
11-19 Artillery Row
London SW1P 1RT / GB
[N/P]
Former [2021/27]Dunlop, Hugh Christopher, et al
Maucher Jenkins
26 Caxton Street
London SW1H 0RJ / GB
Application number, filing date19755466.031.07.2019
[2021/27]
WO2019US44259
Priority number, dateUS20181611535228.08.2018         Original published format: US201816115352
[2021/27]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2020046522
Date:05.03.2020
Language:EN
[2020/10]
Type: A1 Application with search report 
No.:EP3844809
Date:07.07.2021
Language:EN
The application published by WIPO in one of the EPO official languages on 05.03.2020 takes the place of the publication of the European patent application.
[2021/27]
Search report(s)International search report - published on:EP05.03.2020
ClassificationIPC:H01L23/522, H01L21/762, H01L21/84, H01L27/12
[2021/27]
CPC:
H01L21/76256 (EP); H01L27/1203 (EP,US); H01L21/02532 (US);
H01L21/28194 (US); H01L21/76262 (EP); H01L21/823857 (US);
H01L21/84 (EP,US); H01L23/5226 (EP); H01L27/1233 (EP);
H01L29/0653 (US); H01L29/517 (US) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2021/27]
TitleGerman:SILICIUM-AUF-ISOLATOR MIT MEHREREN HALBLEITERDICKEN MITTELS SCHICHTTRANSFER[2021/27]
English:SILICON ON INSULATOR WITH MULTIPLE SEMICONDUCTOR THICKNESSES USING LAYER TRANSFER[2021/27]
French:SILICIUM SUR ISOLANT COMPRENANT DE MULTIPLES ÉPAISSEURS DE SEMI-CONDUCTEURS UTILISANT UN TRANSFERT DE COUCHE[2021/27]
Entry into regional phase27.01.2021National basic fee paid 
27.01.2021Designation fee(s) paid 
27.01.2021Examination fee paid 
Examination procedure27.01.2021Examination requested  [2021/27]
27.01.2021Date on which the examining division has become responsible
19.10.2021Application deemed to be withdrawn, date of legal effect  [2022/13]
19.10.2021Loss of particular rights, legal effect: Claims
09.11.2021Despatch of communication that the application is deemed to be withdrawn, reason: reply to the Extended European Search Report/Written Opinion of the International Searching Authority/International Preliminary Examination Report/Supplementary international search report not received in time  [2022/13]
09.11.2021Despatch of communication of loss of particular rights: Claims {1}
Fees paidRenewal fee
10.05.2021Renewal fee patent year 03
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Cited inInternational search[X]JPH04323851  (NIPPON DENSO CO) [X] 1-3,7,15,16 * abstract *;
 [X]DE19732237  (NAT SEMICONDUCTOR CORP [US]) [X] 1-3,8,15,16 * abstract *;
 [X]JP2001274234  (MATSUSHITA ELECTRIC IND CO LTD) [X] 1-3,7,15,16 * abstract *;
 [X]JP2002026137  (HITACHI LTD) [X] 1,2,4,7,8,13,15,16 * abstract *;
 [X]US6492209  (KRISHNAN SRINATH [US], et al) [X] 1-3,7,15,16 * abstract *;
 [X]US2009194842  (OHARA SHINJI [JP]) [X] 1-3,7,9,15,16 * abstract * * paragraph [0043] *;
 [A]US2010140708  (HILL CRAIG M [US], et al) [A] 1-18 * abstract *;
 [X]US2012228711  (HOSHINO YUTAKA [JP]) [X] 1-3,7,9,15,16 * abstract *;
 [X]US2014367777  (HUANG HERB HE [CN], et al) [X] 1-3,5-7,10-12,14-18 * abstract *;
 [A]US2017373026  (GOKTEPELI SINAN [US]) [A] 1-18* abstract *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.