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EP3811403
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EP About this file: EP3811403
| EP3811403 - RADIATION-HARDENED LATCH CIRCUIT [Right-click to bookmark this link] | Status | Examination is in progress Status updated on 11.04.2025 Database last updated on 28.03.2026 | |
| Former | Request for examination was made Status updated on 26.03.2021 | ||
| Former | The international publication has been made Status updated on 07.12.2019 | Most recent event Tooltip | 09.08.2025 | New entry: Reply to examination report | Applicant(s) | For all designated states BAE SYSTEMS Information and Electronic Systems Integration, Inc. P.O. Box 868 Nashua, NH 03061-0868 / US | [2021/17] | Inventor(s) | 01 /
ROSS, Jason F. PO Box 868 NHQ1-719 Nashua, NH 03061-0868 / US | 02 /
BERNARD, Jamie A. PO Box 868, NHQ1-719 Nashua, NH 03061-0868 / US | 03 /
MATTA, John T. PO Box 868, NHQ1-719 Nashua, NH 03061-0868 / US | [2021/17] | Representative(s) | BAE SYSTEMS plc Group IP Department Warwick House P.O. Box 87 Farnborough Aerospace Centre Farnborough Hampshire GU14 6YU / GB | [N/P] |
| Former [2021/17] | BAE SYSTEMS plc Group IP Department Farnborough Aerospace Centre Farnborough Hampshire GU14 6YU / GB | Application number, filing date | 19812217.8 | 29.05.2019 | [2021/17] | WO2019US34240 | Priority number, date | US201815994671 | 31.05.2018 Original published format: US201815994671 | [2021/17] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2019231943 | Date: | 05.12.2019 | Language: | EN | [2019/49] | Type: | A1 Application with search report | No.: | EP3811403 | Date: | 28.04.2021 | Language: | EN | The application published by WIPO in one of the EPO official languages on 05.12.2019 takes the place of the publication of the European patent application. | [2021/17] | Search report(s) | International search report - published on: | US | 05.12.2019 | (Supplementary) European search report - dispatched on: | EP | 11.02.2022 | Classification | IPC: | H01L23/556, H01L23/00, H01L23/552, H03K19/007, H03K19/20, H03K19/003 | [2022/11] | CPC: |
H03K19/0033 (EP,KR,US);
H03K19/007 (EP,KR,US);
H03K19/20 (EP,KR,US);
H10W42/20 (EP,KR);
H10W42/25 (EP,US)
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| Former IPC [2021/17] | H01L23/556, H01L23/00, H01L23/552, H03K19/007, H03K19/20 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2021/17] | Title | German: | STRAHLUNGSGEHÄRTETE VERRIEGELUNGSSCHALTUNG | [2021/17] | English: | RADIATION-HARDENED LATCH CIRCUIT | [2021/17] | French: | CIRCUIT DE VERROUILLAGE PROTÉGÉ CONTRE LES RAYONNEMENTS | [2021/17] | Entry into regional phase | 09.12.2020 | National basic fee paid | 09.12.2020 | Search fee paid | 09.12.2020 | Designation fee(s) paid | 09.12.2020 | Examination fee paid | Examination procedure | 09.12.2020 | Examination requested [2021/17] | 19.08.2022 | Amendment by applicant (claims and/or description) | 10.04.2025 | Despatch of a communication from the examining division (Time limit: M06) | 07.08.2025 | Reply to a communication from the examining division | Fees paid | Renewal fee | 27.05.2021 | Renewal fee patent year 03 | 27.05.2022 | Renewal fee patent year 04 | 30.05.2023 | Renewal fee patent year 05 | 28.05.2024 | Renewal fee patent year 06 | 27.05.2025 | Renewal fee patent year 07 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [X] WO2006127943 (HONEYWELL INT INC et al.) [X] 1-12 * the whole document * | [A] US2017011808 (MIRABELLA IGNAZIO BRUNO et al.) [A] 1-12 * the whole document * | International search | [XY] US2010148837 (MCADAMS HUGH PRYOR et al.) [X] 1-4 * entire document *[Y] 5-8, 10 | [Y] US2017178744 (MIRABELLA IGNAZIO BRUNO et al.) [Y] 5, 6, 11-13 * entire document * | [Y] US2015214933 (SEHGAL RAJEEV et al.) [Y] 7, 8, 10 * entire document * | [Y] US2009045834 (FARWELL WILLIAM D et al.) [Y] 11-13 * entire document * | [Y] US2002145462 (RAMAKRISHNAN SHANKAR et al.) [Y] 12 * entire document * |