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Extract from the Register of European Patents

EP About this file: EP3844318

EP3844318 - METHODS FOR MAKING SILICON AND NITROGEN CONTAINING FILMS [Right-click to bookmark this link]
StatusExamination is in progress
Status updated on  17.11.2023
Database last updated on 11.09.2024
FormerRequest for examination was made
Status updated on  04.06.2021
FormerThe international publication has been made
Status updated on  11.04.2020
Most recent event   Tooltip13.09.2024New entry: Renewal fee paid 
Applicant(s)For all designated states
Versum Materials US, LLC
8555 S. River Parkway
Tempe, AZ 85284 / US
[2021/27]
Inventor(s)01 / LEI, Xinjian
8555 S. River Parkway
Tempe, AZ 85284 / US
02 / KIM, Moo-sung
8555 S. River Parkway
Tempe, AZ 85284 / US
03 / LEE, Se-won
8555 S. River Parkway
Tempe, AZ 85284 / US
 [2021/27]
Representative(s)Sommer, Andrea
Andrea Sommer
Patentanwälte Partnerschaft mbB
Uhlandstraße 2
80336 München / DE
[N/P]
Former [2021/27]Sommer, Andrea
Andrea Sommer
Patentanwälte PartG mbB
Uhlandstraße 2
80336 München / DE
Application number, filing date19869361.602.10.2019
[2021/27]
WO2019US54268
Priority number, dateUS201862740478P03.10.2018         Original published format: US 201862740478 P
[2021/27]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2020072625
Date:09.04.2020
Language:EN
[2020/15]
Type: A1 Application with search report 
No.:EP3844318
Date:07.07.2021
Language:EN
The application published by WIPO in one of the EPO official languages on 09.04.2020 takes the place of the publication of the European patent application.
[2021/27]
Search report(s)International search report - published on:KR09.04.2020
(Supplementary) European search report - dispatched on:EP04.05.2022
ClassificationIPC:H01L21/02, C23C16/455, C23C16/34, C23C16/56, C23C16/36, C23C16/505, C07F7/12
[2022/22]
CPC:
H01L21/0228 (EP,KR,US); C23C16/45553 (EP,KR,US); C07F7/12 (EP,KR);
C23C16/308 (US); C23C16/345 (EP,KR,US); C23C16/36 (EP,US);
C23C16/45531 (EP,US); C23C16/45536 (KR); C23C16/45542 (EP,US);
C23C16/505 (EP,US); C23C16/56 (EP,KR,US); H01L21/02126 (EP);
H01L21/0214 (EP,US); H01L21/02167 (EP); H01L21/0217 (EP,KR,US);
H01L21/02208 (US); H01L21/02211 (EP); H01L21/02219 (KR);
H01L21/02274 (EP); H01L21/02326 (EP,US); H01L21/0234 (EP,US);
H01L21/02348 (US) (-)
Former IPC [2021/27]C23C16/455, C23C16/34, C23C16/56, H01L21/02, C07F7/12
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2021/27]
TitleGerman:VERFAHREN ZUR HERSTELLUNG VON SILICIUM- UND STICKSTOFFHALTIGEN SCHICHTEN[2021/27]
English:METHODS FOR MAKING SILICON AND NITROGEN CONTAINING FILMS[2021/27]
French:PROCÉDÉS DE FABRICATION DE FILMS CONTENANT DU SILICIUM ET DE L'AZOTE[2021/27]
Entry into regional phase31.03.2021National basic fee paid 
31.03.2021Search fee paid 
31.03.2021Designation fee(s) paid 
31.03.2021Examination fee paid 
Examination procedure31.03.2021Examination requested  [2021/27]
03.06.2022Amendment by applicant (claims and/or description)
17.11.2023Despatch of a communication from the examining division (Time limit: M04)
15.03.2024Reply to a communication from the examining division
Fees paidRenewal fee
29.09.2021Renewal fee patent year 03
15.09.2022Renewal fee patent year 04
13.09.2023Renewal fee patent year 05
12.09.2024Renewal fee patent year 06
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See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[XAY]KR20180010994  (DNF CO LTD [KR]);
 [XYI]US2018033614  (CHANDRA HARIPIN [US], et al);
 US2019249296  [ ] (JANG SE JIN [KR], et al)
International search[X]US2011256734  (HAUSMANN DENNIS M [US], et al) [X] 8-12,23-24;
 [X]US2013078376  (HIGASHINO KATSUKO [US], et al)[X] 23-24;
 [YX]WO2016149541  (APPLIED MATERIALS INC [US]) [Y] 18-20 [X] 23-24;
 [YX]US2018033614  (CHANDRA HARIPIN [US], et al) [Y] 1-7,13-20,22 [X] 21,23-24;
 [YX]KR20180034581  (VERSUM MAT US LLC [US]) [Y] 1-7,13-20,22 [X] 23-24
by applicantUS5069244
 JP2000100812
 US6077356
 US6355582
 US7334595
 US2009155606
 KR20180010994
 US2018033614
 WO2018057677
 WO2018063907
 US9984868
 US10049882
    - OLSEN, "Analysis of LPCVD Process Conditions for the Deposition of Low Stress Silicon Nitride", Materials Science in Semiconductor Process, (20020000), vol. 5, doi:10.1016/S1369-8001(02)00058-6, page 51, XP004383353

DOI:   http://dx.doi.org/10.1016/S1369-8001(02)00058-6
    - TAYLOR et al., "Hexachlorodisilane as a Precursor in the LPCVD of Silicon Dioxide and Silicon Oxynitride Films", J. Electrochem. Soc., (19890000), vol. 136, page 2382, XP000117260
    - M. TANAKA et al., "Film Properties of Low-k Silicon Nitride Films Formed by Hexachlorodisilane and Ammonia", J. Electrochem. Soc., (20000000), vol. 147, page 2284
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.