EP3872498 - AUTOSAMPLER, AUTOMATIC ANALYSIS DEVICE, SAMPLING METHOD, AND AUTOMATIC INSPECTION METHOD [Right-click to bookmark this link] | Status | The application has been withdrawn Status updated on 02.08.2024 Database last updated on 26.04.2025 | |
Former | Examination is in progress Status updated on 18.04.2024 | ||
Former | Request for examination was made Status updated on 30.07.2021 | ||
Former | The international publication has been made Status updated on 02.05.2020 | Most recent event Tooltip | 02.08.2024 | Withdrawal of application | published on 04.09.2024 [2024/36] | Applicant(s) | For all designated states Sekisui Medical Co., Ltd. 1-3, Nihonbashi 2-chome Chuo-ku Tokyo 103-0027 / JP | [2021/35] | Inventor(s) | 01 /
KAWABE, Toshiki c/o SEKISUI MEDICAL CO., LTD. 1-3, Nihonbashi 2-chome Chuo-ku Tokyo 103-0027 / JP | [2021/35] | Representative(s) | Schäfer, Matthias W. Patentanwalt Schwanseestrasse 43 81549 München / DE | [2021/35] | Application number, filing date | 19875644.7 | 21.10.2019 | [2021/35] | WO2019JP41243 | Priority number, date | JP20180198899 | 23.10.2018 Original published format: JP 2018198899 | [2021/35] | Filing language | JA | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2020085271 | Date: | 30.04.2020 | Language: | JA | [2020/18] | Type: | A1 Application with search report | No.: | EP3872498 | Date: | 01.09.2021 | Language: | EN | [2021/35] | Search report(s) | International search report - published on: | JP | 30.04.2020 | (Supplementary) European search report - dispatched on: | EP | 13.06.2022 | Classification | IPC: | G01N35/04, G01N35/00 | [2022/28] | CPC: |
G01N35/00584 (EP);
G01N35/026 (US);
B01L9/06 (EP,US);
G01N35/00732 (EP);
G01N35/04 (EP,US);
G01N2035/00752 (EP);
G01N2035/00772 (EP);
G01N2035/00782 (EP);
G01N2035/0415 (EP,US);
G01N2035/0465 (EP)
(-)
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Former IPC [2021/35] | G01N35/04 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2021/35] | Title | German: | AUTOMATISCHE PROBENENTNAHMEVORRICHTUNG, AUTOMATISCHES ANALYSEGERÄT, PROBENENTNAHMEVERFAHREN UND AUTOMATISCHES INSPEKTIONSVERFAHREN | [2021/35] | English: | AUTOSAMPLER, AUTOMATIC ANALYSIS DEVICE, SAMPLING METHOD, AND AUTOMATIC INSPECTION METHOD | [2021/35] | French: | ÉCHANTILLONNEUR AUTOMATIQUE, DISPOSITIF D'ANALYSE AUTOMATIQUE, PROCÉDÉ D'ÉCHANTILLONNAGE ET PROCÉDÉ D'INSPECTION AUTOMATIQUE | [2021/35] | Entry into regional phase | 23.04.2021 | Translation filed | 23.04.2021 | National basic fee paid | 23.04.2021 | Search fee paid | 23.04.2021 | Designation fee(s) paid | 23.04.2021 | Examination fee paid | Examination procedure | 23.04.2021 | Examination requested [2021/35] | 19.12.2022 | Amendment by applicant (claims and/or description) | 17.04.2024 | Despatch of a communication from the examining division (Time limit: M04) | 29.07.2024 | Application withdrawn by applicant [2024/36] | Fees paid | Renewal fee | 28.10.2021 | Renewal fee patent year 03 | 18.10.2022 | Renewal fee patent year 04 | 25.10.2023 | Renewal fee patent year 05 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [X]WO2017159359 (HITACHI HIGH TECH CORP [JP]); | [P]EP3432003 (HITACHI HIGH TECH CORP [JP]) | International search | [Y]JPS58102162 (OLYMPUS OPTICAL CO) [Y] 1-5 * , page 3, upper left column, line 9 to upper right column, line 16, fig. 3 & US 4861554 A, column 7, line 54 to column 8, line 19, fig. 4 & DE 3246274 A1 *; | [A]JPS6385459 (SHIMADZU CORP) [A] 1-5 * , page 4, lower left column, line 3 to page 5, lower right column, line 15 (Family: none) *; | [A]JP2009204409 (HITACHI HIGH TECH CORP) [A] 1-5* , paragraphs [0044]-[0047] & US 2009/0214385 A1, paragraphs [0044]-[0047] & EP 2096446 A2 & CN 101520465 A *; | [A]JP2010197048 (TOSHIBA CORP, et al) [A] 1-5 * , paragraphs [0042]-[0104], fig. 4 (Family: none) *; | [Y]JP2010217114 (BECKMAN COULTER INC) [Y] 1-5 * , paragraphs [0027]-[0029], [0040]-[0047], fig. 1 (Family: none) *; | [Y]JP2016516998 (ABBOTT LABORATORIES) [Y] 1-5 * , paragraphs [0037]-[0039], fig. 1A, 1B & US 2014/0273242 A1, paragraphs [0043]-[0045], fig. 1A, 1B & WO 2014/144627 A1 & EP 2972404 A1 & CN 105745546 A * | Examination | US2014273242 | by applicant | JPS5842785B | JP2010181197 |