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Extract from the Register of European Patents

EP About this file: EP3723136

EP3723136 - LDMOS WITH DIODE COUPLED ISOLATION RING [Right-click to bookmark this link]
StatusThe application has been withdrawn
Status updated on  19.08.2022
Database last updated on 02.11.2024
FormerExamination is in progress
Status updated on  18.02.2022
FormerRequest for examination was made
Status updated on  16.04.2021
FormerThe application has been published
Status updated on  11.09.2020
Most recent event   Tooltip19.08.2022Withdrawal of applicationpublished on 21.09.2022  [2022/38]
Applicant(s)For all designated states
NXP USA, Inc.
6501 William Cannon Drive West
Austin TX 78735 / US
[2020/42]
Inventor(s)01 / LIN, Xin
c/o NXP B.V., Intellectual Property Group
High Tech Campus 60
5656 AE Eindhoven / NL
02 / ZHANG, Zhihong
c/o NXP B.V., Intellectual Property Group
High Tech Campus 60
5656 AE Eindhoven / NL
03 / CHENG, Xu
c/o NXP B.V., Intellectual Property Group
High Tech Campus 60
5656 AE Eindhoven / NL
04 / ZHU, Ronghua
c/o NXP B.V., Intellectual Property Group
High Tech Campus 60
5656 AE Eindhoven / NL
 [2020/42]
Representative(s)Hardingham, Christopher Mark
NXP Semiconductors
Intellectual Property Group
Abbey House
25 Clarendon Road
Redhill, Surrey RH1 1QZ / GB
[2020/42]
Application number, filing date20167694.702.04.2020
[2020/42]
Priority number, dateUS20191637976509.04.2019         Original published format: US201916379765
[2020/42]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP3723136
Date:14.10.2020
Language:EN
[2020/42]
Search report(s)(Supplementary) European search report - dispatched on:EP19.08.2020
ClassificationIPC:H01L29/78, H01L21/761, H01L29/10
[2020/42]
CPC:
H01L29/7818 (EP,CN); H01L29/7819 (US); H01L21/761 (EP);
H01L29/0619 (CN); H01L29/0623 (US); H01L29/0649 (US);
H01L29/1095 (EP,US); H01L29/42368 (US); H01L29/7823 (EP,US);
H01L29/7835 (EP); H01L29/0638 (EP); H01L29/0653 (EP);
H01L29/086 (EP); H01L29/0869 (EP); H01L29/0878 (EP);
H01L29/0886 (EP); H01L29/1083 (EP); H01L29/1087 (EP);
H01L29/8613 (EP) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2021/20]
Former [2020/42]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
Extension statesBANot yet paid
MENot yet paid
Validation statesKHNot yet paid
MANot yet paid
MDNot yet paid
TNNot yet paid
TitleGerman:LDMOS MIT DIODENGEKOPPELTEM ISOLATIONSRING[2020/42]
English:LDMOS WITH DIODE COUPLED ISOLATION RING[2020/42]
French:LDMOS COMPORTANT UN ANNEAU D'ISOLATION COUPLÉ À UNE DIODE[2020/42]
Examination procedure15.03.2021Amendment by applicant (claims and/or description)
14.04.2021Examination requested  [2021/20]
14.04.2021Date on which the examining division has become responsible
17.02.2022Despatch of a communication from the examining division (Time limit: M06)
15.08.2022Application withdrawn by applicant  [2022/38]
Fees paidRenewal fee
02.05.2022Renewal fee patent year 03
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Documents cited:Search[IY]US2006011974  (PENDHARKAR SAMEER [US]) [I] 11 * paragraphs [0022] - [0038]; figures 1-7 * [Y] 1-10,12,13;
 [Y]EP2680299  (FREESCALE SEMICONDUCTOR INC [US]) [Y] 1-10,12,13 * paragraphs [0034] - [0041] - [0 52]; figures 2-7 *;
 [Y]EP2731145  (FREESCALE SEMICONDUCTOR INC [US]) [Y] 4 * paragraphs [0021] - [0030]; figures 2,3 *;
 [Y]US2015295082  (KIM YONG-DON [KR], et al) [Y] 8,9 * paragraphs [0039] - [0067]; figure 1 *;
 [Y]US2013134511  (YANG HONGNING [US], et al) [Y] 10 * figure 1 *
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.