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Extract from the Register of European Patents

EP About this file: EP3812797

EP3812797 - PROCESSING APPARATUS, SYSTEM, X-RAY MEASUREMENT METHOD, AND PROGRAM [Right-click to bookmark this link]
StatusThe patent has been granted
Status updated on  30.08.2024
Database last updated on 03.01.2025
FormerGrant of patent is intended
Status updated on  21.07.2024
FormerExamination is in progress
Status updated on  04.11.2022
FormerRequest for examination was made
Status updated on  29.10.2021
FormerThe application has been published
Status updated on  26.03.2021
Most recent event   Tooltip30.08.2024(Expected) grantpublished on 02.10.2024  [2024/40]
Applicant(s)For all designated states
Rigaku Corporation
3-9-12, Matsubara-cho Akishima-shi
Tokyo 196-8666 / JP
[2021/17]
Inventor(s)01 / KOBAYASHI, Shintaro
c/o Rigaku Corporation
3-9-12, Matsubara-cho
Akishima-shi Tokyo 196-8666 / JP
02 / NAKAE, Yasukazu
c/o Rigaku Corporation
3-9-12, Matsubara-cho
Akishima-shi Tokyo 196-8666 / JP
03 / SAKUMURA, Takuto
c/o Rigaku Corporation
3-9-12, Matsubara-cho
Akishima-shi Tokyo 196-8666 / JP
04 / SAKUMA, Yasutaka
c/o Rigaku Corporation
3-9-12, Matsubara-cho
Akishima-shi Tokyo 196-8666 / JP
 [2021/50]
Former [2021/17]01 / KOBAYASHI, Shintaro
c/o Rigaku Corporation
3-9-12, Matsubara-cho, Akishima-shi
Tokyo, 196-8666 / JP
02 / NAKAE, Yasukazu
c/o Rigaku Corporation
3-9-12, Matsubara-cho, Akishima-shi
Tokyo, 196-8666 / JP
03 / SAKUMURA, Takuto
c/o Rigaku Corporation
3-9-12, Matsubara-cho, Akishima-shi
Tokyo, 196-8666 / JP
04 / SAKUMA, Yasutaka
c/o Rigaku Corporation
3-9-12, Matsubara-cho, Akishima-shi
Tokyo, 196-8666 / JP
Representative(s)Lambacher, Michael, et al
V. Füner Ebbinghaus Finck Hano
Patentanwälte
Mariahilfplatz 3
81541 München / DE
[2021/17]
Application number, filing date20201937.815.10.2020
[2021/17]
Priority number, dateJP2019019374524.10.2019         Original published format: JP 2019193745
[2021/17]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP3812797
Date:28.04.2021
Language:EN
[2021/17]
Type: B1 Patent specification 
No.:EP3812797
Date:02.10.2024
Language:EN
[2024/40]
Search report(s)(Supplementary) European search report - dispatched on:EP05.03.2021
ClassificationIPC:G01T1/17
[2021/17]
CPC:
G01T1/171 (EP,US); G01T1/18 (CN); G01T1/247 (US);
G01T1/1663 (US); G01T1/24 (CN)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2021/48]
Former [2021/17]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
TitleGerman:VERARBEITUNGSVORRICHTUNG, SYSTEM, RÖNTGENMESSVERFAHREN UND PROGRAMM[2021/17]
English:PROCESSING APPARATUS, SYSTEM, X-RAY MEASUREMENT METHOD, AND PROGRAM[2021/17]
French:APPAREIL DE TRAITEMENT, SYSTÈME, PROCÉDÉ DE MESURE PAR RAYONS X ET PROGRAMME[2021/17]
Examination procedure26.10.2021Amendment by applicant (claims and/or description)
26.10.2021Examination requested  [2021/48]
26.10.2021Date on which the examining division has become responsible
08.11.2022Despatch of a communication from the examining division (Time limit: M04)
08.03.2023Reply to a communication from the examining division
22.07.2024Communication of intention to grant the patent
22.08.2024Fee for grant paid
22.08.2024Fee for publishing/printing paid
22.08.2024Receipt of the translation of the claim(s)
Fees paidRenewal fee
25.10.2022Renewal fee patent year 03
25.10.2023Renewal fee patent year 04
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Documents cited:Search[X]WO2013144812  (KONINKL PHILIPS NV [NL], et al);
 [A]EP2734861  (DECTRIS LTD [CH])
ExaminationEP2734861
by applicantJP2012013563
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.