EP3812797 - PROCESSING APPARATUS, SYSTEM, X-RAY MEASUREMENT METHOD, AND PROGRAM [Right-click to bookmark this link] | Status | The patent has been granted Status updated on 30.08.2024 Database last updated on 03.01.2025 | |
Former | Grant of patent is intended Status updated on 21.07.2024 | ||
Former | Examination is in progress Status updated on 04.11.2022 | ||
Former | Request for examination was made Status updated on 29.10.2021 | ||
Former | The application has been published Status updated on 26.03.2021 | Most recent event Tooltip | 30.08.2024 | (Expected) grant | published on 02.10.2024 [2024/40] | Applicant(s) | For all designated states Rigaku Corporation 3-9-12, Matsubara-cho Akishima-shi Tokyo 196-8666 / JP | [2021/17] | Inventor(s) | 01 /
KOBAYASHI, Shintaro c/o Rigaku Corporation 3-9-12, Matsubara-cho Akishima-shi Tokyo 196-8666 / JP | 02 /
NAKAE, Yasukazu c/o Rigaku Corporation 3-9-12, Matsubara-cho Akishima-shi Tokyo 196-8666 / JP | 03 /
SAKUMURA, Takuto c/o Rigaku Corporation 3-9-12, Matsubara-cho Akishima-shi Tokyo 196-8666 / JP | 04 /
SAKUMA, Yasutaka c/o Rigaku Corporation 3-9-12, Matsubara-cho Akishima-shi Tokyo 196-8666 / JP | [2021/50] |
Former [2021/17] | 01 /
KOBAYASHI, Shintaro c/o Rigaku Corporation 3-9-12, Matsubara-cho, Akishima-shi Tokyo, 196-8666 / JP | ||
02 /
NAKAE, Yasukazu c/o Rigaku Corporation 3-9-12, Matsubara-cho, Akishima-shi Tokyo, 196-8666 / JP | |||
03 /
SAKUMURA, Takuto c/o Rigaku Corporation 3-9-12, Matsubara-cho, Akishima-shi Tokyo, 196-8666 / JP | |||
04 /
SAKUMA, Yasutaka c/o Rigaku Corporation 3-9-12, Matsubara-cho, Akishima-shi Tokyo, 196-8666 / JP | Representative(s) | Lambacher, Michael, et al V. Füner Ebbinghaus Finck Hano Patentanwälte Mariahilfplatz 3 81541 München / DE | [2021/17] | Application number, filing date | 20201937.8 | 15.10.2020 | [2021/17] | Priority number, date | JP20190193745 | 24.10.2019 Original published format: JP 2019193745 | [2021/17] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP3812797 | Date: | 28.04.2021 | Language: | EN | [2021/17] | Type: | B1 Patent specification | No.: | EP3812797 | Date: | 02.10.2024 | Language: | EN | [2024/40] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 05.03.2021 | Classification | IPC: | G01T1/17 | [2021/17] | CPC: |
G01T1/171 (EP,US);
G01T1/18 (CN);
G01T1/247 (US);
G01T1/1663 (US);
G01T1/24 (CN)
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2021/48] |
Former [2021/17] | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR | Title | German: | VERARBEITUNGSVORRICHTUNG, SYSTEM, RÖNTGENMESSVERFAHREN UND PROGRAMM | [2021/17] | English: | PROCESSING APPARATUS, SYSTEM, X-RAY MEASUREMENT METHOD, AND PROGRAM | [2021/17] | French: | APPAREIL DE TRAITEMENT, SYSTÈME, PROCÉDÉ DE MESURE PAR RAYONS X ET PROGRAMME | [2021/17] | Examination procedure | 26.10.2021 | Amendment by applicant (claims and/or description) | 26.10.2021 | Examination requested [2021/48] | 26.10.2021 | Date on which the examining division has become responsible | 08.11.2022 | Despatch of a communication from the examining division (Time limit: M04) | 08.03.2023 | Reply to a communication from the examining division | 22.07.2024 | Communication of intention to grant the patent | 22.08.2024 | Fee for grant paid | 22.08.2024 | Fee for publishing/printing paid | 22.08.2024 | Receipt of the translation of the claim(s) | Fees paid | Renewal fee | 25.10.2022 | Renewal fee patent year 03 | 25.10.2023 | Renewal fee patent year 04 |
Opt-out from the exclusive Tooltip competence of the Unified Patent Court | See the Register of the Unified Patent Court for opt-out data | ||
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [X]WO2013144812 (KONINKL PHILIPS NV [NL], et al); | [A]EP2734861 (DECTRIS LTD [CH]) | Examination | EP2734861 | by applicant | JP2012013563 |