EP3945328 - MULTI-LANE OPTICAL-ELECTRICAL DEVICE TESTING USING AUTOMATED TESTING EQUIPMENT [Right-click to bookmark this link] | Status | Examination is in progress Status updated on 01.03.2024 Database last updated on 13.11.2024 | |
Former | Request for examination was made Status updated on 05.08.2022 | ||
Former | The application has been published Status updated on 31.12.2021 | Most recent event Tooltip | 09.10.2024 | New entry: Renewal fee paid | Applicant(s) | For all designated states OpenLight Photonics, Inc. 6868 Cortona Drive, Suite C Goleta, CA 93117 / US | [N/P] |
Former [2023/46] | For all designated states OpenLight Photonics, Inc. 6868 Cortona Drive Suite C Goleta CA 93117 / US | ||
Former [2022/05] | For all designated states Juniper Networks, Inc. 1133 Innovation Way Sunnyvale, CA 94089 / US | Inventor(s) | 01 /
KECK, Steven William Sunnyvale, CA California 94089 / US | [2022/05] | Representative(s) | D Young & Co LLP 3 Noble Street London EC2V 7BQ / GB | [N/P] |
Former [2022/05] | D Young & Co LLP 120 Holborn London EC1N 2DY / GB | Application number, filing date | 20203090.4 | 21.10.2020 | [2022/05] | Priority number, date | US202016943377 | 30.07.2020 Original published format: US202016943377 | [2022/05] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | EP3945328 | Date: | 02.02.2022 | Language: | EN | [2022/05] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 30.03.2021 | Classification | IPC: | G01R31/317, G01R1/07 | [2022/05] | CPC: |
G01R31/31728 (EP,KR);
G01M11/00 (CN);
H04B10/0731 (US);
G01M11/04 (CN);
G01R1/071 (EP);
G01R13/347 (EP);
G01R31/01 (KR);
G01R31/2603 (EP);
G01R31/2635 (KR);
G01R31/2851 (CN,KR);
G01R31/2889 (US);
G01R31/31903 (EP);
| Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2022/36] |
Former [2022/05] | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR | Extension states | BA | Not yet paid | ME | Not yet paid | Validation states | KH | Not yet paid | MA | Not yet paid | MD | Not yet paid | TN | Not yet paid | Title | German: | PRÜFUNG VON MEHRSPURIGEN OPTISCH-ELEKTRISCHEN VORRICHTUNGEN MIT AUTOMATISIERTEN PRÜFGERÄTEN | [2022/05] | English: | MULTI-LANE OPTICAL-ELECTRICAL DEVICE TESTING USING AUTOMATED TESTING EQUIPMENT | [2022/05] | French: | TEST DE DISPOSITIFS OPTIQUES-ÉLECTRIQUES MULTI-VOIES À L'AIDE D'UN ÉQUIPEMENT DE TEST AUTOMATISÉ | [2022/05] | Examination procedure | 02.08.2022 | Amendment by applicant (claims and/or description) | 02.08.2022 | Examination requested [2022/36] | 02.08.2022 | Date on which the examining division has become responsible | 04.03.2024 | Despatch of a communication from the examining division (Time limit: M04) | 01.07.2024 | Reply to a communication from the examining division | Fees paid | Renewal fee | 13.10.2022 | Renewal fee patent year 03 | 10.10.2023 | Renewal fee patent year 04 | 09.10.2024 | Renewal fee patent year 05 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [XI]US5041997 (HERNDAY PAUL R [US], et al); | [A]US2006203228 (NIKI SHOJI [JP]); | [A]US2014092394 (DETOFSKY ABRAM M [US], et al); | [A]US2016334575 (GRAVES ALAN FRANK [CA], et al) | Examination | EP3916404 |