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Extract from the Register of European Patents

EP About this file: EP3945328

EP3945328 - MULTI-LANE OPTICAL-ELECTRICAL DEVICE TESTING USING AUTOMATED TESTING EQUIPMENT [Right-click to bookmark this link]
StatusExamination is in progress
Status updated on  01.03.2024
Database last updated on 13.11.2024
FormerRequest for examination was made
Status updated on  05.08.2022
FormerThe application has been published
Status updated on  31.12.2021
Most recent event   Tooltip09.10.2024New entry: Renewal fee paid 
Applicant(s)For all designated states
OpenLight Photonics, Inc.
6868 Cortona Drive, Suite C
Goleta, CA 93117 / US
[N/P]
Former [2023/46]For all designated states
OpenLight Photonics, Inc.
6868 Cortona Drive Suite C
Goleta CA 93117 / US
Former [2022/05]For all designated states
Juniper Networks, Inc.
1133 Innovation Way
Sunnyvale, CA 94089 / US
Inventor(s)01 / KECK, Steven William
Sunnyvale, CA California 94089 / US
 [2022/05]
Representative(s)D Young & Co LLP
3 Noble Street
London EC2V 7BQ / GB
[N/P]
Former [2022/05]D Young & Co LLP
120 Holborn
London EC1N 2DY / GB
Application number, filing date20203090.421.10.2020
[2022/05]
Priority number, dateUS20201694337730.07.2020         Original published format: US202016943377
[2022/05]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report 
No.:EP3945328
Date:02.02.2022
Language:EN
[2022/05]
Search report(s)(Supplementary) European search report - dispatched on:EP30.03.2021
ClassificationIPC:G01R31/317, G01R1/07
[2022/05]
CPC:
G01R31/31728 (EP,KR); G01M11/00 (CN); H04B10/0731 (US);
G01M11/04 (CN); G01R1/071 (EP); G01R13/347 (EP);
G01R31/01 (KR); G01R31/2603 (EP); G01R31/2635 (KR);
G01R31/2851 (CN,KR); G01R31/2889 (US); G01R31/31903 (EP);
G01R31/3191 (EP); H01L31/08 (KR) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2022/36]
Former [2022/05]AL,  AT,  BE,  BG,  CH,  CY,  CZ,  DE,  DK,  EE,  ES,  FI,  FR,  GB,  GR,  HR,  HU,  IE,  IS,  IT,  LI,  LT,  LU,  LV,  MC,  MK,  MT,  NL,  NO,  PL,  PT,  RO,  RS,  SE,  SI,  SK,  SM,  TR 
Extension statesBANot yet paid
MENot yet paid
Validation statesKHNot yet paid
MANot yet paid
MDNot yet paid
TNNot yet paid
TitleGerman:PRÜFUNG VON MEHRSPURIGEN OPTISCH-ELEKTRISCHEN VORRICHTUNGEN MIT AUTOMATISIERTEN PRÜFGERÄTEN[2022/05]
English:MULTI-LANE OPTICAL-ELECTRICAL DEVICE TESTING USING AUTOMATED TESTING EQUIPMENT[2022/05]
French:TEST DE DISPOSITIFS OPTIQUES-ÉLECTRIQUES MULTI-VOIES À L'AIDE D'UN ÉQUIPEMENT DE TEST AUTOMATISÉ[2022/05]
Examination procedure02.08.2022Amendment by applicant (claims and/or description)
02.08.2022Examination requested  [2022/36]
02.08.2022Date on which the examining division has become responsible
04.03.2024Despatch of a communication from the examining division (Time limit: M04)
01.07.2024Reply to a communication from the examining division
Fees paidRenewal fee
13.10.2022Renewal fee patent year 03
10.10.2023Renewal fee patent year 04
09.10.2024Renewal fee patent year 05
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Documents cited:Search[XI]US5041997  (HERNDAY PAUL R [US], et al);
 [A]US2006203228  (NIKI SHOJI [JP]);
 [A]US2014092394  (DETOFSKY ABRAM M [US], et al);
 [A]US2016334575  (GRAVES ALAN FRANK [CA], et al)
ExaminationEP3916404
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.