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EP3816661
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EP About this file: EP3816661
| EP3816661 - MULTI-BEAM MEASURING DEVICE FOR 3D SCANNING OF AN ENVIRONMENT HAVING MULTIPLE SEMICONDUCTOR LASER ARRAYS AND UNIFORM BEAM DISTRIBUTION [Right-click to bookmark this link] | Status | Examination is in progress Status updated on 03.11.2023 Database last updated on 13.11.2024 | |
| Former | Request for examination was made Status updated on 21.01.2022 | ||
| Former | The application has been published Status updated on 03.04.2021 | Most recent event Tooltip | 26.10.2024 | New entry: Renewal fee paid | Applicant(s) | For all designated states Hexagon Technology Center GmbH Heinrich-Wild-Strasse 201 9435 Heerbrugg / CH | [2021/18] | Inventor(s) | 01 /
WOHLGENANNT, Rainer Bregenzerweg 29e A-6833 Klaus / AT | 02 /
HINDERLING, Jürg Gehrenstrasse 11 CH-9437 Marbach / CH | 03 /
BESTLER, Simon Dorfstrasse 2 D-88085 Langenargen / DE | [2021/18] | Representative(s) | Kaminski Harmann Patentanwälte AG Landstrasse 124 9490 Vaduz / LI | [2021/18] | Application number, filing date | 20204461.6 | 28.10.2020 | [2021/18] | Priority number, date | EP20190205917 | 29.10.2019 Original published format: EP 19205917 | [2021/18] | Filing language | EN | Procedural language | EN | Publication | Type: | A2 Application without search report | No.: | EP3816661 | Date: | 05.05.2021 | Language: | EN | [2021/18] | Type: | A3 Search report | No.: | EP3816661 | Date: | 29.09.2021 | Language: | EN | [2021/39] | Search report(s) | (Supplementary) European search report - dispatched on: | EP | 27.08.2021 | Classification | IPC: | G01S7/481, G01C15/00, G01S17/42, G01S17/10, G01S17/89, G01S17/931 | [2021/39] | CPC: |
G01C15/002 (EP);
G01S17/10 (EP,US);
G01S17/42 (EP);
G01S17/89 (EP,US);
G01S17/931 (EP);
G01S7/4815 (EP);
G01S7/4816 (EP);
G01S7/484 (US);
G01S7/4865 (US);
G01S7/497 (US)
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|
| Former IPC [2021/18] | G01S7/481, G01C15/00, G01S17/42 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2022/08] |
| Former [2021/18] | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR | Extension states | BA | Not yet paid | ME | Not yet paid | Validation states | KH | Not yet paid | MA | Not yet paid | MD | Not yet paid | TN | Not yet paid | Title | German: | MEHRSTRAHL-MESSVORRICHTUNG ZUR 3D-ABTASTUNG EINER UMGEBUNG MIT MEHREREN HALBLEITERLASER-ARRAYS UND GLEICHFÖRMIGER STRAHLVERTEILUNG | [2021/18] | English: | MULTI-BEAM MEASURING DEVICE FOR 3D SCANNING OF AN ENVIRONMENT HAVING MULTIPLE SEMICONDUCTOR LASER ARRAYS AND UNIFORM BEAM DISTRIBUTION | [2021/18] | French: | DISPOSITIF DE MESURE À FAISCEAUX MULTIPLES POUR LE BALAYAGE 3D D'UN ENVIRONNEMENT COMPORTANT DE MULTIPLES RÉSEAUX DE LASERS SEMI-CONDUCTEURS ET UNE DISTRIBUTION DE FAISCEAU UNIFORME | [2021/18] | Examination procedure | 17.01.2022 | Amendment by applicant (claims and/or description) | 17.01.2022 | Examination requested [2022/08] | 17.01.2022 | Date on which the examining division has become responsible | 06.11.2023 | Despatch of a communication from the examining division (Time limit: M04) | 19.02.2024 | Reply to a communication from the examining division | Fees paid | Renewal fee | 25.10.2022 | Renewal fee patent year 03 | 25.10.2023 | Renewal fee patent year 04 | 25.10.2024 | Renewal fee patent year 05 |
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| Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]GB2432707 (DYNASCAN TECHNOLOGY CORP [TW]); | [A]CN107153182 (SHENZHEN ROBOSENSE TECH CO LTD); | [Y]US2018180720 (PEI JUN [US], et al); | [IY]US2018364334 (XIANG SHAOQING [CN], et al); | [Y]US2019094345 (SINGER JULIEN [CH], et al) |