EP3948923 - SYSTEM AND METHOD FOR LEARNING-GUIDED ELECTRON MICROSCOPY [Right-click to bookmark this link] | Status | Request for examination was made Status updated on 07.01.2022 Database last updated on 16.11.2024 | |
Former | The international publication has been made Status updated on 03.10.2020 | Most recent event Tooltip | 28.03.2024 | New entry: Renewal fee paid | Applicant(s) | For all designated states Massachusetts Institute of Technology 77 Massachusetts Avenue Cambridge, MA 02139 / US | For all designated states President and Fellows of Harvard College 17 Quincy Street Cambridge, MA 02138 / US | [2022/06] | Inventor(s) | 01 /
SHAVIT, Nir 17 Quincy Street Cambridge, MA 02138 / US | 02 /
SAMUEL, Aravinathan 17 Quincy Street Cambridge, MA 02138 / US | 03 /
LICHTMAN, Jeff 17 Quincy Street Cambridge, MA 02138 / US | 04 /
MI, Lu 77 Massachusetts Avenue Cambridge, MA 02139 / US | [N/P] |
Former [2022/06] | 01 /
SHAVIT, Nir Cambridge, MA 02138 / US | ||
02 /
SAMUEL, Aravinathan Cambridge, MA 02138 / US | |||
03 /
LICHTMAN, Jeff Cambridge, MA 02138 / US | |||
04 /
MI, Lu Cambridge, MA 02139 / US | Representative(s) | Mewburn Ellis LLP Aurora Building Counterslip Bristol BS1 6BX / GB | [2022/06] | Application number, filing date | 20779904.0 | 30.03.2020 | [2022/06] | WO2020US25832 | Priority number, date | US201962825722P | 28.03.2019 Original published format: US 201962825722 P | [2022/06] | Filing language | EN | Procedural language | EN | Publication | Type: | A1 Application with search report | No.: | WO2020198752 | Date: | 01.10.2020 | Language: | EN | [2020/40] | Type: | A1 Application with search report | No.: | EP3948923 | Date: | 09.02.2022 | Language: | EN | The application published by WIPO in one of the EPO official languages on 01.10.2020 takes the place of the publication of the European patent application. | [2022/06] | Search report(s) | International search report - published on: | US | 01.10.2020 | (Supplementary) European search report - dispatched on: | EP | 21.11.2022 | Classification | IPC: | H01J37/28, G02B21/00, H01J37/22 | [2022/51] | CPC: |
H01J37/28 (EP,US);
G06F18/2413 (EP);
G06T7/11 (US);
G06V10/25 (US);
G06V10/764 (EP,US);
G06V10/82 (EP,US);
G06V20/69 (EP,US);
H01J37/21 (US);
H01J37/222 (EP);
H01J37/265 (EP);
G06T2207/10061 (US);
G06T2207/20084 (US);
H01J2237/1536 (US)
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Former IPC [2022/06] | H01J37/28, G02B21/00 | Designated contracting states | AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LI, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR [2022/06] | Title | German: | SYSTEM UND VERFAHREN FÜR LERNGESTEUERTE ELEKTRONENMIKROSKOPIE | [2022/06] | English: | SYSTEM AND METHOD FOR LEARNING-GUIDED ELECTRON MICROSCOPY | [2022/06] | French: | SYSTÈME ET PROCÉDÉ DESTINÉS À LA MICROSCOPIE ÉLECTRONIQUE GUIDÉE PAR APPRENTISSAGE | [2022/06] | Entry into regional phase | 29.09.2021 | National basic fee paid | 29.09.2021 | Search fee paid | 29.09.2021 | Designation fee(s) paid | 29.09.2021 | Examination fee paid | Examination procedure | 29.09.2021 | Examination requested [2022/06] | 19.06.2023 | Amendment by applicant (claims and/or description) | Fees paid | Renewal fee | 28.03.2022 | Renewal fee patent year 03 | 27.03.2023 | Renewal fee patent year 04 | 27.03.2024 | Renewal fee patent year 05 |
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court. | Documents cited: | Search | [A]US6553323 (OBARA KENJI [JP], et al) [A] 5-8 * figs. 33, 5, 13 and related text; column 5, line 64 - column 6, line 38 *; | [XI]US2013307957 (BUGGE CLIFF [US], et al) [X] 1-4,9-11 * paragraphs [0006] , [0 20] - [0040] * [I] 5-8,12; | [XI]US2014226003 (PHANEUF MICHAEL WILLIAM [CA], et al) [X] 1-4 * figs. 2 to 7 and related text; paragraphs [0021] , [0 64] - [0069] * [I] 5-12; | [XI]EP3070731 (FEI CO [US]) [X] 1-4,9-11 * fig. 11 and related text; paragraphs [0016] - [0019] * [I] 5-8,12; | [XI]US2017169992 (KOBAYASHI MITSUTOSHI [JP], et al) [X] 1-4,9-11 * figs. 1 to 7 and related text * [I] 5-8,12; | [X]US2017177997 (KARLINSKY LEONID [IL], et al) [X] 5-8 * figs. 3 to 9 and related text *; | [XP]DE102019114459 (ZEISS CARL MICROSCOPY GMBH [DE]) [XP] 1-11* figs. 1, 2, 5 and related text *; | [XP]EP3598474 (FEI CO [US]) [XP] 1-4,9-11 * figs. 1, 2 and related text *; | [A] - GUPTA ANINDYA ET AL, Convolutional Neural Networks for False Positive Reduction of Automatically Detected Cilia in Low Magnification TEM Images, Spinger, PAGE(S) 407 - 418, (2017), XP047597274 [A] 5-8 * page 407 - page 409 * DOI: http://dx.doi.org/10.1007/978-3-319-59126-1_34 | [A] - POTOCEK PAVEL ET AL, "Sparse Scanning Electron Microscopy for Imaging and Segmentation in Connectomics", 2018 IEEE INTERNATIONAL CONFERENCE ON BIOINFORMATICS AND BIOMEDICINE (BIBM), IEEE, (20181203), doi:10.1109/BIBM.2018.8621333, pages 2461 - 2465, XP033507551 [A] 5-8 * page 2461 - page 2462 * DOI: http://dx.doi.org/10.1109/BIBM.2018.8621333 | International search | [A]US5175495 (BRAHME UPENDRA [US], et al) [A] 1-12* , entire document *; | [XYA]US2014226003 (PHANEUF MICHAEL WILLIAM [CA], et al) [X] 1-4, 12 * , para [0021], [0024], [0064], [0067]-[0069], [0081], [0084]; Fig 2-4 * [Y] 5, 9-11 [A] 6-8; | [Y]US2015287578 (BENDALL SEAN C [US], et al) [Y] 9-11 * , para [0069], [0073], [0075] *; | [Y]WO2019025298 (PASTEUR INSTITUT [FR]) [Y] 5 * , pg 1, In 9, 10; pg 5, In 33-34; pg 6, In 6-7, 10-13, 19 *; | [A]US2019043690 (STEVENS ANDREW J [US], et al) [A] 1-12 * , entire document * | by applicant | US2013307957 | US2014226003 | EP3070731 | US2017169992 | US2017177997 | EP3598474 |