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Extract from the Register of European Patents

EP About this file: EP3948923

EP3948923 - SYSTEM AND METHOD FOR LEARNING-GUIDED ELECTRON MICROSCOPY [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  07.01.2022
Database last updated on 16.11.2024
FormerThe international publication has been made
Status updated on  03.10.2020
Most recent event   Tooltip28.03.2024New entry: Renewal fee paid 
Applicant(s)For all designated states
Massachusetts Institute of Technology
77 Massachusetts Avenue
Cambridge, MA 02139 / US
For all designated states
President and Fellows of Harvard College
17 Quincy Street
Cambridge, MA 02138 / US
[2022/06]
Inventor(s)01 / SHAVIT, Nir
17 Quincy Street
Cambridge, MA 02138 / US
02 / SAMUEL, Aravinathan
17 Quincy Street
Cambridge, MA 02138 / US
03 / LICHTMAN, Jeff
17 Quincy Street
Cambridge, MA 02138 / US
04 / MI, Lu
77 Massachusetts Avenue
Cambridge, MA 02139 / US
[N/P]
Former [2022/06]01 / SHAVIT, Nir
Cambridge, MA 02138 / US
02 / SAMUEL, Aravinathan
Cambridge, MA 02138 / US
03 / LICHTMAN, Jeff
Cambridge, MA 02138 / US
04 / MI, Lu
Cambridge, MA 02139 / US
Representative(s)Mewburn Ellis LLP
Aurora Building
Counterslip
Bristol BS1 6BX / GB
[2022/06]
Application number, filing date20779904.030.03.2020
[2022/06]
WO2020US25832
Priority number, dateUS201962825722P28.03.2019         Original published format: US 201962825722 P
[2022/06]
Filing languageEN
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2020198752
Date:01.10.2020
Language:EN
[2020/40]
Type: A1 Application with search report 
No.:EP3948923
Date:09.02.2022
Language:EN
The application published by WIPO in one of the EPO official languages on 01.10.2020 takes the place of the publication of the European patent application.
[2022/06]
Search report(s)International search report - published on:US01.10.2020
(Supplementary) European search report - dispatched on:EP21.11.2022
ClassificationIPC:H01J37/28, G02B21/00, H01J37/22
[2022/51]
CPC:
H01J37/28 (EP,US); G06F18/2413 (EP); G06T7/11 (US);
G06V10/25 (US); G06V10/764 (EP,US); G06V10/82 (EP,US);
G06V20/69 (EP,US); H01J37/21 (US); H01J37/222 (EP);
H01J37/265 (EP); G06T2207/10061 (US); G06T2207/20084 (US);
H01J2237/1536 (US) (-)
Former IPC [2022/06]H01J37/28, G02B21/00
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2022/06]
TitleGerman:SYSTEM UND VERFAHREN FÜR LERNGESTEUERTE ELEKTRONENMIKROSKOPIE[2022/06]
English:SYSTEM AND METHOD FOR LEARNING-GUIDED ELECTRON MICROSCOPY[2022/06]
French:SYSTÈME ET PROCÉDÉ DESTINÉS À LA MICROSCOPIE ÉLECTRONIQUE GUIDÉE PAR APPRENTISSAGE[2022/06]
Entry into regional phase29.09.2021National basic fee paid 
29.09.2021Search fee paid 
29.09.2021Designation fee(s) paid 
29.09.2021Examination fee paid 
Examination procedure29.09.2021Examination requested  [2022/06]
19.06.2023Amendment by applicant (claims and/or description)
Fees paidRenewal fee
28.03.2022Renewal fee patent year 03
27.03.2023Renewal fee patent year 04
27.03.2024Renewal fee patent year 05
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See the Register of the Unified Patent Court for opt-out data
Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[A]US6553323  (OBARA KENJI [JP], et al) [A] 5-8 * figs. 33, 5, 13 and related text; column 5, line 64 - column 6, line 38 *;
 [XI]US2013307957  (BUGGE CLIFF [US], et al) [X] 1-4,9-11 * paragraphs [0006] , [0 20] - [0040] * [I] 5-8,12;
 [XI]US2014226003  (PHANEUF MICHAEL WILLIAM [CA], et al) [X] 1-4 * figs. 2 to 7 and related text; paragraphs [0021] , [0 64] - [0069] * [I] 5-12;
 [XI]EP3070731  (FEI CO [US]) [X] 1-4,9-11 * fig. 11 and related text; paragraphs [0016] - [0019] * [I] 5-8,12;
 [XI]US2017169992  (KOBAYASHI MITSUTOSHI [JP], et al) [X] 1-4,9-11 * figs. 1 to 7 and related text * [I] 5-8,12;
 [X]US2017177997  (KARLINSKY LEONID [IL], et al) [X] 5-8 * figs. 3 to 9 and related text *;
 [XP]DE102019114459  (ZEISS CARL MICROSCOPY GMBH [DE]) [XP] 1-11* figs. 1, 2, 5 and related text *;
 [XP]EP3598474  (FEI CO [US]) [XP] 1-4,9-11 * figs. 1, 2 and related text *;
 [A]  - GUPTA ANINDYA ET AL, Convolutional Neural Networks for False Positive Reduction of Automatically Detected Cilia in Low Magnification TEM Images, Spinger, PAGE(S) 407 - 418, (2017), XP047597274 [A] 5-8 * page 407 - page 409 *

DOI:   http://dx.doi.org/10.1007/978-3-319-59126-1_34
 [A]  - POTOCEK PAVEL ET AL, "Sparse Scanning Electron Microscopy for Imaging and Segmentation in Connectomics", 2018 IEEE INTERNATIONAL CONFERENCE ON BIOINFORMATICS AND BIOMEDICINE (BIBM), IEEE, (20181203), doi:10.1109/BIBM.2018.8621333, pages 2461 - 2465, XP033507551 [A] 5-8 * page 2461 - page 2462 *

DOI:   http://dx.doi.org/10.1109/BIBM.2018.8621333
International search[A]US5175495  (BRAHME UPENDRA [US], et al) [A] 1-12* , entire document *;
 [XYA]US2014226003  (PHANEUF MICHAEL WILLIAM [CA], et al) [X] 1-4, 12 * , para [0021], [0024], [0064], [0067]-[0069], [0081], [0084]; Fig 2-4 * [Y] 5, 9-11 [A] 6-8;
 [Y]US2015287578  (BENDALL SEAN C [US], et al) [Y] 9-11 * , para [0069], [0073], [0075] *;
 [Y]WO2019025298  (PASTEUR INSTITUT [FR]) [Y] 5 * , pg 1, In 9, 10; pg 5, In 33-34; pg 6, In 6-7, 10-13, 19 *;
 [A]US2019043690  (STEVENS ANDREW J [US], et al) [A] 1-12 * , entire document *
by applicantUS2013307957
 US2014226003
 EP3070731
 US2017169992
 US2017177997
 EP3598474
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.