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Extract from the Register of European Patents

EP About this file: EP3998482

EP3998482 - AUTOMATIC ANALYSIS DEVICE AND METHOD FOR OPERATING AUTOMATIC ANALYSIS DEVICE [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  15.04.2022
Database last updated on 04.11.2024
FormerThe international publication has been made
Status updated on  18.01.2021
Most recent event   Tooltip03.04.2024New entry: Renewal fee paid 
Applicant(s)For all designated states
Hitachi High-Tech Corporation
17-1, Toranomon 1-chome
Minato-ku
Tokyo 105-6409 / JP
[2022/19]
Inventor(s)01 / FURUKAWA, Maki
c/o Hitachi High-Tech Corporation, 17-1,
Toranomon 1-chome, Minato-ku
Tokyo 105-6409 / JP
02 / AKUTSU, Masashi
c/o Hitachi High-Tech Corporation, 17-1,
Toranomon 1-chome, Minato-ku
Tokyo 105-6409 / JP
03 / SUZUKI, Naoto
c/o Hitachi High-Tech Corporation, 17-1,
Toranomon 1-chome, Minato-ku
Tokyo 105-6409 / JP
 [2022/19]
Representative(s)MERH-IP Matias Erny Reichl Hoffmann Patentanwälte PartG mbB
Paul-Heyse-Straße 29
80336 München / DE
[N/P]
Former [2022/19]MERH-IP Matias Erny Reichl Hoffmann Patentanwälte PartG mbB
Paul-Heyse-Strasse 29
80336 München / DE
Application number, filing date20836107.113.03.2020
[2022/20]
WO2020JP11168
Priority number, dateJP2019012808210.07.2019         Original published format: JP 2019128082
[2022/19]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2021005835
Date:14.01.2021
Language:JA
[2021/02]
Type: A1 Application with search report 
No.:EP3998482
Date:18.05.2022
Language:EN
[2022/20]
Search report(s)International search report - published on:JP14.01.2021
(Supplementary) European search report - dispatched on:EP23.06.2023
ClassificationIPC:G01N35/00, G01N35/02, G01N35/10
[2023/30]
CPC:
G01N35/025 (EP,US); G01N35/1002 (EP,US); G01N35/1004 (EP,US)
Former IPC [2022/19]G01N35/00
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2022/19]
TitleGerman:AUTOMATISCHE ANALYSEVORRICHTUNG UND VERFAHREN ZUM BETRIEB EINER AUTOMATISCHEN ANALYSEVORRICHTUNG[2022/19]
English:AUTOMATIC ANALYSIS DEVICE AND METHOD FOR OPERATING AUTOMATIC ANALYSIS DEVICE[2022/19]
French:DISPOSITIF D'ANALYSE AUTOMATIQUE ET PROCÉDÉ DE FONCTIONNEMENT DE DISPOSITIF D'ANALYSE AUTOMATIQUE[2022/19]
Entry into regional phase30.12.2021Translation filed 
10.02.2022National basic fee paid 
10.02.2022Search fee paid 
10.02.2022Designation fee(s) paid 
10.02.2022Examination fee paid 
Examination procedure16.03.2021Request for preliminary examination filed
International Preliminary Examining Authority: JP
10.02.2022Examination requested  [2022/20]
19.01.2024Amendment by applicant (claims and/or description)
19.01.2024Date on which the examining division has become responsible
Fees paidRenewal fee
31.03.2022Renewal fee patent year 03
31.03.2023Renewal fee patent year 04
31.03.2024Renewal fee patent year 05
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Documents cited:Search[Y]JP2001133466  (TOSHIBA CORP) [Y] 1-5 * paragraphs [0001] , [0008] , [0017] , [0019] , [0020] , [0021] , [0022] , [0023] , [0028] , [0035] , [0063] , [0117]; figures 2,8 *;
 [Y]JP2015129659  (HITACHI HIGH TECH CORP) [Y] 1-5* paragraphs [0010] , [0019] , [0026] , [0030]; figure 2 *
International search[XA]JP2001133466  (TOSHIBA CORP) [X] 1-2, 5-6, 8-9 * , paragraphs [0020]-[0118], fig. 1-8 *[A] 3-4, 7
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