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Extract from the Register of European Patents

EP About this file: EP4006537

EP4006537 - SPECIMEN ANALYSIS APPARATUS [Right-click to bookmark this link]
StatusRequest for examination was made
Status updated on  29.04.2022
Database last updated on 16.11.2024
FormerThe international publication has been made
Status updated on  30.01.2021
Most recent event   Tooltip02.08.2024New entry: Renewal fee paid 
Applicant(s)For all designated states
Hitachi High-Tech Corporation
17-1, Toranomon 1-chome
Minato-ku
Tokyo 105-6409 / JP
[2022/22]
Inventor(s)01 / TAMURA Riku
c/o HITACHI HIGH-TECH CORPORATION, 17-1,
Toranomon 1-chome, Minato-ku
Tokyo 105-6409 / JP
02 / HASHIMOTO Yuichiro
c/o HITACHI HIGH-TECH CORPORATION, 17-1,
Toranomon 1-chome, Minato-ku
Tokyo 105-6409 / JP
03 / SUGAWARA Yuka
c/o HITACHI HIGH-TECH CORPORATION, 17-1,
Toranomon 1-chome, Minato-ku
Tokyo 105-6409 / JP
04 / YASUDA Hiroyuki
c/o HITACHI HIGH-TECH CORPORATION, 17-1,
Toranomon 1-chome, Minato-ku
Tokyo 105-6409 / JP
 [2022/22]
Representative(s)MERH-IP Matias Erny Reichl Hoffmann Patentanwälte PartG mbB
Paul-Heyse-Straße 29
80336 München / DE
[N/P]
Former [2022/22]MERH-IP Matias Erny Reichl Hoffmann Patentanwälte PartG mbB
Paul-Heyse-Strasse 29
80336 München / DE
Application number, filing date20844761.517.07.2020
[2022/22]
WO2020JP27967
Priority number, dateJP2019013679025.07.2019         Original published format: JP 2019136790
[2022/22]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2021015148
Date:28.01.2021
Language:JA
[2021/04]
Type: A1 Application with search report 
No.:EP4006537
Date:01.06.2022
Language:EN
[2022/22]
Search report(s)International search report - published on:JP28.01.2021
(Supplementary) European search report - dispatched on:EP12.07.2023
ClassificationIPC:G01N27/62, G01N30/04, G01N30/72, G01N30/86
[2022/22]
CPC:
G01N30/86 (EP,US); G01N30/02 (CN,US); G01N35/00613 (US);
G01N30/72 (EP,US); G01N30/74 (CN,US); G01N30/88 (US);
G01N35/0092 (US); G01N2030/045 (EP); G01N2030/8804 (US) (-)
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2022/22]
TitleGerman:PROBENANALYSEVORRICHTUNG[2022/22]
English:SPECIMEN ANALYSIS APPARATUS[2022/22]
French:APPAREIL D'ANALYSE DE SPÉCIMEN[2022/22]
Entry into regional phase18.01.2022Translation filed 
25.02.2022National basic fee paid 
25.02.2022Search fee paid 
25.02.2022Designation fee(s) paid 
25.02.2022Examination fee paid 
Examination procedure10.02.2021Request for preliminary examination filed
International Preliminary Examining Authority: JP
25.02.2022Examination requested  [2022/22]
28.08.2023Amendment by applicant (claims and/or description)
28.08.2023Date on which the examining division has become responsible
Fees paidRenewal fee
01.08.2022Renewal fee patent year 03
31.07.2023Renewal fee patent year 04
31.07.2024Renewal fee patent year 05
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[XAY]US2007134806  (ODA YOSHIYA [JP], et al);
 [XAY]WO2013098169  (PHILIP MORRIS PROD [CH], et al);
International search[XA]JP2011047956  (EISAI R&D MAN CO LTD, et al);
 [A]JP2013253888  (HITACHI HIGH TECH CORP);
 [A]WO2016103388  (SHIMADZU CORP [JP]);
 [A]JP2016539322  ;
 [A]WO2018229811  (HITACHI HIGH TECH CORP [JP])
by applicantJP2010276568
 JP2013210249
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.