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Extract from the Register of European Patents

EP About this file: EP4012418

EP4012418 - AUTOMATED ANALYZER [Right-click to bookmark this link]
StatusThe patent has been granted
Status updated on  26.07.2024
Database last updated on 13.09.2024
FormerGrant of patent is intended
Status updated on  05.06.2024
FormerRequest for examination was made
Status updated on  13.05.2022
FormerThe international publication has been made
Status updated on  19.02.2021
Most recent event   Tooltip26.07.2024(Expected) grantpublished on 28.08.2024  [2024/35]
Applicant(s)For all designated states
Hitachi High-Tech Corporation
17-1, Toranomon 1-chome
Minato-ku
Tokyo 105-6409 / JP
[2022/24]
Inventor(s)01 / SASAKI, Shunsuke
c/o HITACHI HIGH-TECH CORPORATION, 17-1,
Toranomon 1-chome, Minato-ku
Tokyo 105-6409 / JP
02 / SAKAZUME, Taku
c/o HITACHI HIGH-TECH CORPORATION, 17-1,
Toranomon 1-chome, Minato-ku
Tokyo 105-6409 / JP
 [2022/24]
Representative(s)Strehl Schübel-Hopf & Partner
Maximilianstrasse 54
80538 München / DE
[2022/24]
Application number, filing date20851378.821.02.2020
[2022/24]
WO2020JP07029
Priority number, dateJP2019014702109.08.2019         Original published format: JP 2019147021
[2022/24]
Filing languageJA
Procedural languageEN
PublicationType: A1 Application with search report
No.:WO2021029093
Date:18.02.2021
Language:JA
[2021/07]
Type: A1 Application with search report 
No.:EP4012418
Date:15.06.2022
Language:EN
[2022/24]
Type: B1 Patent specification 
No.:EP4012418
Date:28.08.2024
Language:EN
[2024/35]
Search report(s)International search report - published on:JP18.02.2021
(Supplementary) European search report - dispatched on:EP26.07.2023
ClassificationIPC:G01N35/00, G16H10/40, G06F3/0485, G06F3/04842, G06F3/04847, G16H40/63, G06F3/0482
[2024/25]
CPC:
G01N35/00722 (EP,US); G06F3/04847 (EP,US); G01N35/00663 (EP);
G01N35/1002 (US); G06F3/0482 (EP); G06F3/04842 (EP);
G06F3/0485 (EP,US); G16H10/40 (EP); G16H40/63 (EP);
G01N2035/0091 (EP,US); G06F2203/04803 (US) (-)
Former IPC [2023/34]G01N35/00, G16H10/40, G06F3/0485
Former IPC [2022/24]G01N35/00
Designated contracting statesAL,   AT,   BE,   BG,   CH,   CY,   CZ,   DE,   DK,   EE,   ES,   FI,   FR,   GB,   GR,   HR,   HU,   IE,   IS,   IT,   LI,   LT,   LU,   LV,   MC,   MK,   MT,   NL,   NO,   PL,   PT,   RO,   RS,   SE,   SI,   SK,   SM,   TR [2022/24]
Extension statesBANot yet paid
MENot yet paid
Validation statesKHNot yet paid
MANot yet paid
MDNot yet paid
TNNot yet paid
TitleGerman:AUTOMATISIERTER ANALYSATOR[2022/24]
English:AUTOMATED ANALYZER[2022/24]
French:ANALYSEUR AUTOMATISÉ[2022/24]
Entry into regional phase11.01.2022Translation filed 
11.01.2022National basic fee paid 
11.01.2022Search fee paid 
11.01.2022Designation fee(s) paid 
11.01.2022Examination fee paid 
Examination procedure13.10.2020Request for preliminary examination filed
International Preliminary Examining Authority: JP
11.01.2022Examination requested  [2022/24]
29.11.2023Amendment by applicant (claims and/or description)
29.11.2023Date on which the examining division has become responsible
06.06.2024Communication of intention to grant the patent
18.07.2024Fee for grant paid
18.07.2024Fee for publishing/printing paid
18.07.2024Receipt of the translation of the claim(s)
Fees paidRenewal fee
28.02.2022Renewal fee patent year 03
28.02.2023Renewal fee patent year 04
29.02.2024Renewal fee patent year 05
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Responsibility for the accuracy, completeness or quality of the data displayed under the link provided lies entirely with the Unified Patent Court.
Documents cited:Search[X]US8706303  (KUWANO KEISUKE [JP], et al);
 [XA]US2014152820  (HEYDLAUF MICHAEL W [US])
International search[Y]JP2004502179  ;
 [Y]JP2008051723  (SYSMEX CORP);
 [Y]JP2011508881  ;
 [A]US2014100791  (DARMSTADT ADAM [US], et al);
 [Y]JP2015099160  (HITACHI HIGH TECH CORP);
 [A]JP2018163157  (RADIOMETER MEDICAL APS)
The EPO accepts no responsibility for the accuracy of data originating from other authorities; in particular, it does not guarantee that it is complete, up to date or fit for specific purposes.